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X-RAY DIFFRACTION
Materials and Methods page
4KI4
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 298.0
    Details 50 MM TRIS-HCL, 16% PEG350, 180 MM CALCIUM CHLORIDE , pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 80.73 α = 90
    b = 118.84 β = 90
    c = 127.52 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 95
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type MAR scanner 300 mm plate
    Collection Date 2012-11-23
     
    Diffraction Radiation
    Monochromator Mirrors
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 2.5
    Resolution(High) 2.45
    Resolution(Low) 50
    Number Reflections(All) 45787
    Number Reflections(Observed) 45787
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.079
     
    High Resolution Shell Details
    Resolution(High) 2.45
    Resolution(Low) 2.49
    Percent Possible(All) 97.3
    R Merge I(Observed) 0.523
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.45
    Resolution(Low) 38.485
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 45787
    Number of Reflections(Observed) 45787
    Number of Reflections(R-Free) 2275
    Percent Reflections(Observed) 99.15
    R-Factor(Observed) 0.1931
    R-Work 0.1917
    R-Free 0.2206
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4431
    Shell Resolution(Low) 2.4963
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2369
    R-Factor(R-Work) 0.2473
    R-Factor(R-Free) 0.2915
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4963
    Shell Resolution(Low) 2.5543
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2686
    R-Factor(R-Work) 0.2542
    R-Factor(R-Free) 0.3349
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5543
    Shell Resolution(Low) 2.6182
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2679
    R-Factor(R-Work) 0.2434
    R-Factor(R-Free) 0.2653
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6182
    Shell Resolution(Low) 2.689
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2701
    R-Factor(R-Work) 0.2373
    R-Factor(R-Free) 0.2791
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.689
    Shell Resolution(Low) 2.7681
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2712
    R-Factor(R-Work) 0.2379
    R-Factor(R-Free) 0.2967
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7681
    Shell Resolution(Low) 2.8574
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2706
    R-Factor(R-Work) 0.2303
    R-Factor(R-Free) 0.2655
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8574
    Shell Resolution(Low) 2.9595
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2738
    R-Factor(R-Work) 0.2261
    R-Factor(R-Free) 0.2474
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9595
    Shell Resolution(Low) 3.0779
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2701
    R-Factor(R-Work) 0.2237
    R-Factor(R-Free) 0.2811
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0779
    Shell Resolution(Low) 3.2179
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2755
    R-Factor(R-Work) 0.2188
    R-Factor(R-Free) 0.2647
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2179
    Shell Resolution(Low) 3.3875
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2710
    R-Factor(R-Work) 0.2111
    R-Factor(R-Free) 0.2129
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3875
    Shell Resolution(Low) 3.5996
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2749
    R-Factor(R-Work) 0.1948
    R-Factor(R-Free) 0.2471
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5996
    Shell Resolution(Low) 3.8773
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2728
    R-Factor(R-Work) 0.182
    R-Factor(R-Free) 0.2354
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8773
    Shell Resolution(Low) 4.267
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2763
    R-Factor(R-Work) 0.1549
    R-Factor(R-Free) 0.1651
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.267
    Shell Resolution(Low) 4.8834
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2768
    R-Factor(R-Work) 0.1376
    R-Factor(R-Free) 0.165
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8834
    Shell Resolution(Low) 6.1485
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2790
    R-Factor(R-Work) 0.1723
    R-Factor(R-Free) 0.1911
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.1485
    Shell Resolution(Low) 38.4896
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2957
    R-Factor(R-Work) 0.1844
    R-Factor(R-Free) 0.1913
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.049
    f_dihedral_angle_d 11.267
    f_angle_d 0.685
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7173
    Nucleic Acid Atoms 643
    Heterogen Atoms 45
    Solvent Atoms 410
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.refine: 1.8.1_1168)
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHENIX version: (phenix.refine: 1.8.1_1168)
    data collection HKL-2000