X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8.5
Temperature 295.15
Details 100 mM Tris, pH 8.5, 5% w/v PEG8000, 20% w/v PEG300, 10% v/v glycerol, 0.15% w/v mellitic acid, VAPOR DIFFUSION, HANGING DROP, temperature 295.15K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 118.11 α = 90
b = 118.11 β = 90
c = 200.85 γ = 120
Symmetry
Space Group P 62 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 77
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2009-04-22
Diffraction Radiation
Monochromator Protocol
single crystal Si(220) side bounce SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.97918 APS 24-ID-E

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.3 29.53 99.98 -- -- -- 14.4 13096 13060 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.3 3.36 100.0 -- -- 1.8 13.0 620

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.3 29.53 -- 1.34 -- 13056 1306 99.95 -- 0.2163 0.2116 0.2622 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.3 3.4316 -- 140 1263 0.3708 0.4177 -- 100.0
X Ray Diffraction 3.4316 3.5875 -- 142 1277 0.3276 0.3662 -- 100.0
X Ray Diffraction 3.5875 3.7763 -- 141 1263 0.27 0.3078 -- 100.0
X Ray Diffraction 3.7763 4.0123 -- 142 1277 0.2267 0.2626 -- 100.0
X Ray Diffraction 4.0123 4.3213 -- 143 1288 0.1798 0.2239 -- 100.0
X Ray Diffraction 4.3213 4.7545 -- 144 1302 0.1764 0.2452 -- 100.0
X Ray Diffraction 4.7545 5.4388 -- 146 1306 0.1795 0.2143 -- 100.0
X Ray Diffraction 5.4388 6.8382 -- 148 1336 0.2259 0.2554 -- 100.0
X Ray Diffraction 6.8382 29.53 -- 160 1438 0.1905 0.2599 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.072
f_dihedral_angle_d 20.423
f_angle_d 1.376
f_bond_d 0.01
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3152
Nucleic Acid Atoms 569
Heterogen Atoms 5
Solvent Atoms 0

Software

Computing
Computing Package Purpose
CBASS Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
Phaser Structure Solution
PHENIX (phenix.refine: 1.8.1_1168) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8.1_1168) refinement
Phaser model building
CBASS data collection