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X-RAY DIFFRACTION
Materials and Methods page
4KI2
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 295.15
    Details 100 mM Tris, pH 8.5, 5% w/v PEG8000, 20% w/v PEG300, 10% v/v glycerol, 0.15% w/v mellitic acid, VAPOR DIFFUSION, HANGING DROP, temperature 295.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 118.11 α = 90
    b = 118.11 β = 90
    c = 200.85 γ = 120
     
    Space Group
    Space Group Name:    P 62 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 77
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2009-04-22
     
    Diffraction Radiation
    Monochromator single crystal Si(220) side bounce
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Wavelength List 0.97918
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 3.3
    Resolution(Low) 29.53
    Number Reflections(All) 13096
    Number Reflections(Observed) 13060
    Percent Possible(Observed) 99.98
    Redundancy 14.4
     
    High Resolution Shell Details
    Resolution(High) 3.3
    Resolution(Low) 3.36
    Percent Possible(All) 100.0
    Mean I Over Sigma(Observed) 1.8
    Redundancy 13.0
    Number Unique Reflections(All) 620
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.3
    Resolution(Low) 29.53
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 13056
    Number of Reflections(R-Free) 1306
    Percent Reflections(Observed) 99.95
    R-Factor(Observed) 0.2163
    R-Work 0.2116
    R-Free 0.2622
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3
    Shell Resolution(Low) 3.4316
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1263
    R-Factor(R-Work) 0.3708
    R-Factor(R-Free) 0.4177
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4316
    Shell Resolution(Low) 3.5875
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1277
    R-Factor(R-Work) 0.3276
    R-Factor(R-Free) 0.3662
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5875
    Shell Resolution(Low) 3.7763
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1263
    R-Factor(R-Work) 0.27
    R-Factor(R-Free) 0.3078
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7763
    Shell Resolution(Low) 4.0123
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1277
    R-Factor(R-Work) 0.2267
    R-Factor(R-Free) 0.2626
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0123
    Shell Resolution(Low) 4.3213
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1288
    R-Factor(R-Work) 0.1798
    R-Factor(R-Free) 0.2239
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3213
    Shell Resolution(Low) 4.7545
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1302
    R-Factor(R-Work) 0.1764
    R-Factor(R-Free) 0.2452
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7545
    Shell Resolution(Low) 5.4388
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1306
    R-Factor(R-Work) 0.1795
    R-Factor(R-Free) 0.2143
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4388
    Shell Resolution(Low) 6.8382
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1336
    R-Factor(R-Work) 0.2259
    R-Factor(R-Free) 0.2554
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.8382
    Shell Resolution(Low) 29.53
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 1438
    R-Factor(R-Work) 0.1905
    R-Factor(R-Free) 0.2599
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.072
    f_dihedral_angle_d 20.423
    f_angle_d 1.376
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3152
    Nucleic Acid Atoms 569
    Heterogen Atoms 5
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building Phaser
    data collection CBASS