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X-RAY DIFFRACTION
Materials and Methods page
4KHY
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.5
    Temperature 298.0
    Details 50 MM TRIS-HCL, 17.5% PEG350, 180 MM CALCIUM CHLORIDE, VAPOR DIFFUSION, SITTING DROP, TEMPERATURE 295K, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 80.79 α = 90
    b = 118.24 β = 90
    c = 127.61 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 95
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type MAR scanner 300 mm plate
    Collection Date 2011-09-23
     
    Diffraction Radiation
    Monochromator MIRRORS
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.9
    Resolution(High) 2.2
    Resolution(Low) 50
    Number Reflections(Observed) 50172
    Percent Possible(Observed) 98.4
     
    High Resolution Shell Details
    Resolution(High) 2.2
    Resolution(Low) 2.33
    Percent Possible(All) 88.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.25
    Resolution(Low) 22.34
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 50172
    Number of Reflections(Observed) 50172
    Number of Reflections(R-Free) 2491
    Percent Reflections(Observed) 85.4
    R-Factor(Observed) 0.201
    R-Work 0.198
    R-Free 0.241
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -3.6092
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.9988
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 4.608
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.248
    Shell Resolution(Low) 2.2916
    Number of Reflections(R-Free) 105
    Number of Reflections(R-Work) 2105
    R-Factor(R-Work) 0.2673
    R-Factor(R-Free) 0.3324
    Percent Reflections(Observed) 69.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2916
    Shell Resolution(Low) 2.3383
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2417
    R-Factor(R-Work) 0.2469
    R-Factor(R-Free) 0.3803
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3383
    Shell Resolution(Low) 2.3891
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2473
    R-Factor(R-Work) 0.2517
    R-Factor(R-Free) 0.3195
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3891
    Shell Resolution(Low) 2.4446
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 2326
    R-Factor(R-Work) 0.2653
    R-Factor(R-Free) 0.36
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4446
    Shell Resolution(Low) 2.5057
    Number of Reflections(R-Free) 111
    Number of Reflections(R-Work) 2374
    R-Factor(R-Work) 0.267
    R-Factor(R-Free) 0.3327
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5057
    Shell Resolution(Low) 2.5734
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2369
    R-Factor(R-Work) 0.2713
    R-Factor(R-Free) 0.3636
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5734
    Shell Resolution(Low) 2.649
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2392
    R-Factor(R-Work) 0.2664
    R-Factor(R-Free) 0.2947
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.649
    Shell Resolution(Low) 2.7343
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2351
    R-Factor(R-Work) 0.2676
    R-Factor(R-Free) 0.3741
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7343
    Shell Resolution(Low) 2.8319
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2312
    R-Factor(R-Work) 0.2687
    R-Factor(R-Free) 0.2781
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8319
    Shell Resolution(Low) 2.945
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2420
    R-Factor(R-Work) 0.2555
    R-Factor(R-Free) 0.2941
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.945
    Shell Resolution(Low) 3.0787
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2576
    R-Factor(R-Work) 0.2358
    R-Factor(R-Free) 0.2596
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0787
    Shell Resolution(Low) 3.2406
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2946
    R-Factor(R-Work) 0.2284
    R-Factor(R-Free) 0.2851
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2406
    Shell Resolution(Low) 3.4429
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3077
    R-Factor(R-Work) 0.2063
    R-Factor(R-Free) 0.2313
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4429
    Shell Resolution(Low) 3.7076
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 3117
    R-Factor(R-Work) 0.1872
    R-Factor(R-Free) 0.2389
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7076
    Shell Resolution(Low) 4.0787
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 3025
    R-Factor(R-Work) 0.1601
    R-Factor(R-Free) 0.1972
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0787
    Shell Resolution(Low) 4.6642
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 3015
    R-Factor(R-Work) 0.1346
    R-Factor(R-Free) 0.1669
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6642
    Shell Resolution(Low) 5.8589
    Number of Reflections(R-Free) 176
    Number of Reflections(R-Work) 3092
    R-Factor(R-Work) 0.1503
    R-Factor(R-Free) 0.1946
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8589
    Shell Resolution(Low) 22.3463
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 3294
    R-Factor(R-Work) 0.1874
    R-Factor(R-Free) 0.2181
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.053
    f_dihedral_angle_d 11.433
    f_angle_d 0.805
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7203
    Nucleic Acid Atoms 649
    Heterogen Atoms 41
    Solvent Atoms 480
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (PHENIX.REFINE: 1.7_650)
    Structure Refinement PHENIX (PHENIX.REFINE: 1.7_650)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.7_650)
    model building PHENIX version: (PHENIX.REFINE: 1.7_650)
    data collection HKL-2000