X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
pH 7.5
Temperature 298.0
Details 50 MM TRIS-HCL, 17.5% PEG350, 180 MM CALCIUM CHLORIDE, VAPOR DIFFUSION, SITTING DROP, TEMPERATURE 295K, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 80.79 α = 90
b = 118.24 β = 90
c = 127.61 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 95
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MAR scanner 300 mm plate -- 2011-09-23
Diffraction Radiation
Monochromator Protocol
MIRRORS SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 50 98.4 -- -- -- -- -- 50172 -- 2.9 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.2 2.33 88.9 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.25 22.34 -- 0.0 50172 50172 2491 85.4 -- 0.201 0.198 0.241 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.248 2.2916 -- 105 2105 0.2673 0.3324 -- 69.0
X Ray Diffraction 2.2916 2.3383 -- 125 2417 0.2469 0.3803 -- 79.0
X Ray Diffraction 2.3383 2.3891 -- 146 2473 0.2517 0.3195 -- 81.0
X Ray Diffraction 2.3891 2.4446 -- 110 2326 0.2653 0.36 -- 75.0
X Ray Diffraction 2.4446 2.5057 -- 111 2374 0.267 0.3327 -- 77.0
X Ray Diffraction 2.5057 2.5734 -- 134 2369 0.2713 0.3636 -- 77.0
X Ray Diffraction 2.5734 2.649 -- 140 2392 0.2664 0.2947 -- 79.0
X Ray Diffraction 2.649 2.7343 -- 129 2351 0.2676 0.3741 -- 77.0
X Ray Diffraction 2.7343 2.8319 -- 129 2312 0.2687 0.2781 -- 76.0
X Ray Diffraction 2.8319 2.945 -- 121 2420 0.2555 0.2941 -- 78.0
X Ray Diffraction 2.945 3.0787 -- 126 2576 0.2358 0.2596 -- 83.0
X Ray Diffraction 3.0787 3.2406 -- 135 2946 0.2284 0.2851 -- 95.0
X Ray Diffraction 3.2406 3.4429 -- 173 3077 0.2063 0.2313 -- 100.0
X Ray Diffraction 3.4429 3.7076 -- 162 3117 0.1872 0.2389 -- 100.0
X Ray Diffraction 3.7076 4.0787 -- 153 3025 0.1601 0.1972 -- 96.0
X Ray Diffraction 4.0787 4.6642 -- 163 3015 0.1346 0.1669 -- 97.0
X Ray Diffraction 4.6642 5.8589 -- 176 3092 0.1503 0.1946 -- 97.0
X Ray Diffraction 5.8589 22.3463 -- 153 3294 0.1874 0.2181 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -3.6092
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -0.9988
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 4.608
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.003
f_chiral_restr 0.053
f_dihedral_angle_d 11.433
f_angle_d 0.805
f_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 7203
Nucleic Acid Atoms 649
Heterogen Atoms 41
Solvent Atoms 480

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHENIX (PHENIX.REFINE: 1.7_650) Structure Solution
PHENIX (PHENIX.REFINE: 1.7_650) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE: 1.7_650) refinement
PHENIX version: (PHENIX.REFINE: 1.7_650) model building
HKL-2000 data collection