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X-RAY DIFFRACTION
Materials and Methods page
4KHW
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7
    Temperature 298.0
    Details 50 MM TRIS-HCL, 19% PEG350, 180 MM CALCIUM CHLORIDE,, pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 80.36 α = 90
    b = 118.63 β = 90
    c = 126.31 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 95
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2010-06-18
     
    Diffraction Radiation
    Monochromator DOUBLE CRYSTAL SI(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength 1.00
    Wavelength List 1.00
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 2.37
    Resolution(Low) 50
    Number Reflections(All) 46949
    Number Reflections(Observed) 44309
    Percent Possible(Observed) 98.7
    R Merge I(Observed) 0.07
     
    High Resolution Shell Details
    Resolution(High) 2.37
    Resolution(Low) 2.44
    Percent Possible(All) 98.7
    R Merge I(Observed) 0.453
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.371
    Resolution(Low) 44.642
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 44309
    Number of Reflections(R-Free) 2413
    Percent Reflections(Observed) 97.55
    R-Factor(Observed) 0.1743
    R-Work 0.1717
    R-Free 0.2241
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.8106
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -4.8129
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 4.0023
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3713
    Shell Resolution(Low) 2.4197
    Number of Reflections(R-Free) 107
    Number of Reflections(R-Work) 2108
    R-Factor(R-Work) 0.2827
    R-Factor(R-Free) 0.3483
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4197
    Shell Resolution(Low) 2.4723
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.2651
    R-Factor(R-Free) 0.277
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4723
    Shell Resolution(Low) 2.5298
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2680
    R-Factor(R-Work) 0.2588
    R-Factor(R-Free) 0.3306
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5298
    Shell Resolution(Low) 2.593
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2669
    R-Factor(R-Work) 0.2464
    R-Factor(R-Free) 0.2826
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.593
    Shell Resolution(Low) 2.6631
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2691
    R-Factor(R-Work) 0.2371
    R-Factor(R-Free) 0.273
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6631
    Shell Resolution(Low) 2.7415
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2692
    R-Factor(R-Work) 0.24
    R-Factor(R-Free) 0.3098
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7415
    Shell Resolution(Low) 2.83
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2713
    R-Factor(R-Work) 0.2248
    R-Factor(R-Free) 0.2634
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.83
    Shell Resolution(Low) 2.9311
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2740
    R-Factor(R-Work) 0.2165
    R-Factor(R-Free) 0.2478
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9311
    Shell Resolution(Low) 3.0484
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2713
    R-Factor(R-Work) 0.2099
    R-Factor(R-Free) 0.2949
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0484
    Shell Resolution(Low) 3.1871
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2767
    R-Factor(R-Work) 0.195
    R-Factor(R-Free) 0.2732
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1871
    Shell Resolution(Low) 3.3551
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2710
    R-Factor(R-Work) 0.1779
    R-Factor(R-Free) 0.2107
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3551
    Shell Resolution(Low) 3.5652
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2736
    R-Factor(R-Work) 0.1576
    R-Factor(R-Free) 0.2417
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5652
    Shell Resolution(Low) 3.8404
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2783
    R-Factor(R-Work) 0.1505
    R-Factor(R-Free) 0.2132
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8404
    Shell Resolution(Low) 4.2266
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2765
    R-Factor(R-Work) 0.129
    R-Factor(R-Free) 0.1709
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2266
    Shell Resolution(Low) 4.8375
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2801
    R-Factor(R-Work) 0.1157
    R-Factor(R-Free) 0.1689
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8375
    Shell Resolution(Low) 6.0923
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2813
    R-Factor(R-Work) 0.1327
    R-Factor(R-Free) 0.1877
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0923
    Shell Resolution(Low) 44.6497
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2988
    R-Factor(R-Work) 0.1539
    R-Factor(R-Free) 0.1939
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.052
    f_dihedral_angle_d 11.451
    f_angle_d 0.764
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7210
    Nucleic Acid Atoms 651
    Heterogen Atoms 39
    Solvent Atoms 534
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (PHENIX.REFINE: 1.7_650)
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.7_650)
    model building PHENIX version: (PHENIX.REFINE: 1.7_650)
    data collection HKL-2000