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X-RAY DIFFRACTION
Materials and Methods page
4KHU
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7
    Temperature 298.0
    Details 50 MM TRIS-HCL, 13% PEG350, 180 MM CALCIUM CHLORIDE, pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 80.98 α = 90
    b = 119.35 β = 90
    c = 127.86 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 95
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type MAR scanner 300 mm plate
    Collection Date 2010-05-12
     
    Diffraction Radiation
    Monochromator MIRRORS
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 2.6
    Resolution(High) 2.05
    Resolution(Low) 50
    Number Reflections(All) 64642
    Number Reflections(Observed) 64642
    Percent Possible(Observed) 97.9
    R Merge I(Observed) 0.089
     
    High Resolution Shell Details
    Resolution(High) 2.05
    Resolution(Low) 2.12
    Percent Possible(All) 84.0
    R Merge I(Observed) 0.503
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.05
    Resolution(Low) 21.62
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 64642
    Number of Reflections(Observed) 64642
    Number of Reflections(R-Free) 3199
    Percent Reflections(Observed) 82.8
    R-Factor(Observed) 0.209
    R-Work 0.207
    R-Free 0.247
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.4673
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -5.0015
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 5.4688
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.052
    Shell Resolution(Low) 2.0825
    Number of Reflections(R-Free) 107
    Number of Reflections(R-Work) 2181
    R-Factor(R-Work) 0.2865
    R-Factor(R-Free) 0.4009
    Percent Reflections(Observed) 69.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0825
    Shell Resolution(Low) 2.115
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2448
    R-Factor(R-Work) 0.2747
    R-Factor(R-Free) 0.3562
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.115
    Shell Resolution(Low) 2.1497
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2636
    R-Factor(R-Work) 0.258
    R-Factor(R-Free) 0.3098
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1497
    Shell Resolution(Low) 2.1867
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2799
    R-Factor(R-Work) 0.2321
    R-Factor(R-Free) 0.3072
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1867
    Shell Resolution(Low) 2.2265
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2756
    R-Factor(R-Work) 0.219
    R-Factor(R-Free) 0.2454
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2265
    Shell Resolution(Low) 2.2692
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2753
    R-Factor(R-Work) 0.2269
    R-Factor(R-Free) 0.3393
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2692
    Shell Resolution(Low) 2.3155
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2434
    R-Factor(R-Work) 0.258
    R-Factor(R-Free) 0.2891
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3155
    Shell Resolution(Low) 2.3658
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2475
    R-Factor(R-Work) 0.2578
    R-Factor(R-Free) 0.3713
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3658
    Shell Resolution(Low) 2.4207
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2319
    R-Factor(R-Work) 0.2542
    R-Factor(R-Free) 0.3058
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4207
    Shell Resolution(Low) 2.4812
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2297
    R-Factor(R-Work) 0.275
    R-Factor(R-Free) 0.3496
    Percent Reflections(Observed) 72.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4812
    Shell Resolution(Low) 2.5482
    Number of Reflections(R-Free) 113
    Number of Reflections(R-Work) 2357
    R-Factor(R-Work) 0.2627
    R-Factor(R-Free) 0.2977
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5482
    Shell Resolution(Low) 2.623
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2345
    R-Factor(R-Work) 0.2767
    R-Factor(R-Free) 0.3105
    Percent Reflections(Observed) 74.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.623
    Shell Resolution(Low) 2.7076
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2353
    R-Factor(R-Work) 0.258
    R-Factor(R-Free) 0.303
    Percent Reflections(Observed) 74.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7076
    Shell Resolution(Low) 2.8041
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2344
    R-Factor(R-Work) 0.2745
    R-Factor(R-Free) 0.2987
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8041
    Shell Resolution(Low) 2.9161
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2435
    R-Factor(R-Work) 0.2567
    R-Factor(R-Free) 0.2829
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9161
    Shell Resolution(Low) 3.0485
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2537
    R-Factor(R-Work) 0.2347
    R-Factor(R-Free) 0.2731
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0485
    Shell Resolution(Low) 3.2088
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2855
    R-Factor(R-Work) 0.2196
    R-Factor(R-Free) 0.2841
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2088
    Shell Resolution(Low) 3.4091
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 3133
    R-Factor(R-Work) 0.206
    R-Factor(R-Free) 0.217
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4091
    Shell Resolution(Low) 3.6711
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 3233
    R-Factor(R-Work) 0.1981
    R-Factor(R-Free) 0.2257
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6711
    Shell Resolution(Low) 4.0384
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 3110
    R-Factor(R-Work) 0.1687
    R-Factor(R-Free) 0.2051
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0384
    Shell Resolution(Low) 4.6178
    Number of Reflections(R-Free) 176
    Number of Reflections(R-Work) 3038
    R-Factor(R-Work) 0.135
    R-Factor(R-Free) 0.1769
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6178
    Shell Resolution(Low) 5.7993
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 3189
    R-Factor(R-Work) 0.1467
    R-Factor(R-Free) 0.1807
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7993
    Shell Resolution(Low) 21.622
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 3416
    R-Factor(R-Work) 0.2138
    R-Factor(R-Free) 0.252
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.074
    f_dihedral_angle_d 12.897
    f_angle_d 1.209
    f_bond_d 0.013
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7217
    Nucleic Acid Atoms 651
    Heterogen Atoms 36
    Solvent Atoms 553
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (PHENIX.REFINE: 1.7_650)
    Structure Refinement PHENIX (PHENIX.REFINE: 1.7_650)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.7_650)
    model building PHENIX version: (PHENIX.REFINE: 1.7_650)