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X-RAY DIFFRACTION
Materials and Methods page
4KHS
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 298.0
    Details 50 MM TRIS-HCL, 10% PEG350, 220 MM CALCIUM CHLORIDE, VAPOR DIFFUSION, SITTING DROP, TEMPERATURE 295K, pH 7.5, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 80.7 α = 90
    b = 119.57 β = 90
    c = 127.8 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 95
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type MAR scanner 300 mm plate
    Collection Date 2010-04-09
     
    Diffraction Radiation
    Monochromator MIRRORS
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 3.1
    Resolution(High) 2.1
    Resolution(Low) 50
    Number Reflections(All) 66285
    Number Reflections(Observed) 66285
    Percent Possible(Observed) 99.9
     
    High Resolution Shell Details
    Resolution(High) 2.1
    Resolution(Low) 2.14
    Percent Possible(All) 99.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.12
    Resolution(Low) 27.077
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 66285
    Number of Reflections(Observed) 59378
    Number of Reflections(R-Free) 6358
    Percent Reflections(Observed) 98.25
    R-Factor(Observed) 0.1801
    R-Work 0.1762
    R-Free 0.2164
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -1.0341
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -3.8511
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 4.8851
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1203
    Shell Resolution(Low) 2.1444
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 1100
    R-Factor(R-Work) 0.2707
    R-Factor(R-Free) 0.3084
    Percent Reflections(Observed) 52.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1444
    Shell Resolution(Low) 2.1696
    Number of Reflections(R-Free) 205
    Number of Reflections(R-Work) 2069
    R-Factor(R-Work) 0.2554
    R-Factor(R-Free) 0.3068
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1696
    Shell Resolution(Low) 2.196
    Number of Reflections(R-Free) 228
    Number of Reflections(R-Work) 2107
    R-Factor(R-Work) 0.2384
    R-Factor(R-Free) 0.3208
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.196
    Shell Resolution(Low) 2.2238
    Number of Reflections(R-Free) 232
    Number of Reflections(R-Work) 2107
    R-Factor(R-Work) 0.2455
    R-Factor(R-Free) 0.2837
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2238
    Shell Resolution(Low) 2.2531
    Number of Reflections(R-Free) 244
    Number of Reflections(R-Work) 2075
    R-Factor(R-Work) 0.2783
    R-Factor(R-Free) 0.3219
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2531
    Shell Resolution(Low) 2.2839
    Number of Reflections(R-Free) 218
    Number of Reflections(R-Work) 2090
    R-Factor(R-Work) 0.2385
    R-Factor(R-Free) 0.2649
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2839
    Shell Resolution(Low) 2.3165
    Number of Reflections(R-Free) 214
    Number of Reflections(R-Work) 2116
    R-Factor(R-Work) 0.225
    R-Factor(R-Free) 0.2729
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3165
    Shell Resolution(Low) 2.3511
    Number of Reflections(R-Free) 224
    Number of Reflections(R-Work) 2109
    R-Factor(R-Work) 0.2191
    R-Factor(R-Free) 0.3316
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3511
    Shell Resolution(Low) 2.3878
    Number of Reflections(R-Free) 235
    Number of Reflections(R-Work) 2082
    R-Factor(R-Work) 0.2045
    R-Factor(R-Free) 0.2564
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3878
    Shell Resolution(Low) 2.4269
    Number of Reflections(R-Free) 237
    Number of Reflections(R-Work) 2097
    R-Factor(R-Work) 0.1933
    R-Factor(R-Free) 0.2972
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4269
    Shell Resolution(Low) 2.4687
    Number of Reflections(R-Free) 212
    Number of Reflections(R-Work) 2115
    R-Factor(R-Work) 0.1934
    R-Factor(R-Free) 0.2347
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4687
    Shell Resolution(Low) 2.5136
    Number of Reflections(R-Free) 223
    Number of Reflections(R-Work) 2123
    R-Factor(R-Work) 0.1909
    R-Factor(R-Free) 0.2285
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5136
    Shell Resolution(Low) 2.5619
    Number of Reflections(R-Free) 246
    Number of Reflections(R-Work) 2075
    R-Factor(R-Work) 0.1954
    R-Factor(R-Free) 0.2585
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5619
    Shell Resolution(Low) 2.6142
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 2161
    R-Factor(R-Work) 0.1873
    R-Factor(R-Free) 0.2603
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6142
    Shell Resolution(Low) 2.671
    Number of Reflections(R-Free) 248
    Number of Reflections(R-Work) 2093
    R-Factor(R-Work) 0.1898
    R-Factor(R-Free) 0.2528
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.671
    Shell Resolution(Low) 2.733
    Number of Reflections(R-Free) 228
    Number of Reflections(R-Work) 2091
    R-Factor(R-Work) 0.19
    R-Factor(R-Free) 0.2489
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.733
    Shell Resolution(Low) 2.8013
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 2144
    R-Factor(R-Work) 0.1896
    R-Factor(R-Free) 0.2725
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8013
    Shell Resolution(Low) 2.877
    Number of Reflections(R-Free) 230
    Number of Reflections(R-Work) 2115
    R-Factor(R-Work) 0.193
    R-Factor(R-Free) 0.2335
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.877
    Shell Resolution(Low) 2.9615
    Number of Reflections(R-Free) 229
    Number of Reflections(R-Work) 2098
    R-Factor(R-Work) 0.1948
    R-Factor(R-Free) 0.2504
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9615
    Shell Resolution(Low) 3.057
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 2149
    R-Factor(R-Work) 0.1967
    R-Factor(R-Free) 0.2281
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.057
    Shell Resolution(Low) 3.1661
    Number of Reflections(R-Free) 239
    Number of Reflections(R-Work) 2101
    R-Factor(R-Work) 0.1966
    R-Factor(R-Free) 0.2418
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1661
    Shell Resolution(Low) 3.2927
    Number of Reflections(R-Free) 263
    Number of Reflections(R-Work) 2113
    R-Factor(R-Work) 0.1909
    R-Factor(R-Free) 0.2407
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2927
    Shell Resolution(Low) 3.4422
    Number of Reflections(R-Free) 238
    Number of Reflections(R-Work) 2141
    R-Factor(R-Work) 0.1748
    R-Factor(R-Free) 0.2129
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4422
    Shell Resolution(Low) 3.6233
    Number of Reflections(R-Free) 244
    Number of Reflections(R-Work) 2114
    R-Factor(R-Work) 0.1693
    R-Factor(R-Free) 0.1911
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6233
    Shell Resolution(Low) 3.8497
    Number of Reflections(R-Free) 216
    Number of Reflections(R-Work) 2156
    R-Factor(R-Work) 0.1611
    R-Factor(R-Free) 0.1874
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8497
    Shell Resolution(Low) 4.146
    Number of Reflections(R-Free) 221
    Number of Reflections(R-Work) 2158
    R-Factor(R-Work) 0.1418
    R-Factor(R-Free) 0.1627
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.146
    Shell Resolution(Low) 4.5614
    Number of Reflections(R-Free) 222
    Number of Reflections(R-Work) 2173
    R-Factor(R-Work) 0.131
    R-Factor(R-Free) 0.1734
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5614
    Shell Resolution(Low) 5.2174
    Number of Reflections(R-Free) 241
    Number of Reflections(R-Work) 2171
    R-Factor(R-Work) 0.1284
    R-Factor(R-Free) 0.156
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2174
    Shell Resolution(Low) 6.5579
    Number of Reflections(R-Free) 221
    Number of Reflections(R-Work) 2222
    R-Factor(R-Work) 0.1606
    R-Factor(R-Free) 0.1797
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.5579
    Shell Resolution(Low) 27.0789
    Number of Reflections(R-Free) 235
    Number of Reflections(R-Work) 2294
    R-Factor(R-Work) 0.1721
    R-Factor(R-Free) 0.1988
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.056
    f_dihedral_angle_d 11.606
    f_angle_d 0.815
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7147
    Nucleic Acid Atoms 647
    Heterogen Atoms 37
    Solvent Atoms 664
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (PHENIX.REFINE: 1.7_650)
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.7_650)
    model building PHENIX version: (PHENIX.REFINE: 1.7_650)