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X-RAY DIFFRACTION
Materials and Methods page
4KHQ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 298.0
    Details 50 MM TRIS, PH 7.5, 10% PEG350, 180 MM CALCIUM CHLORIDE, VAPOR DIFFUSION, SITTING DROP, TEMPERATURE 295K, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 80.66 α = 90
    b = 119.36 β = 90
    c = 128.07 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 95
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2010-07-28
     
    Diffraction Radiation
    Monochromator DOUBLE CRYSTAL SI(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength 1.0
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.19
    Resolution(Low) 50
    Number Reflections(All) 64251
    Number Reflections(Observed) 64251
    Percent Possible(Observed) 99.9
    Redundancy 6.0
     
    High Resolution Shell Details
    Resolution(High) 2.19
    Resolution(Low) 2.24
    Percent Possible(All) 99.0
    Mean I Over Sigma(Observed) 3.1
    R-Sym I(Observed) 0.52
    Redundancy 5.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.186
    Resolution(Low) 46.236
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 64171
    Number of Reflections(R-Free) 3204
    Percent Reflections(Observed) 99.22
    R-Factor(Observed) 0.1808
    R-Work 0.1791
    R-Free 0.2125
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -1.271
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -3.3492
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 5.2892
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1857
    Shell Resolution(Low) 2.2183
    Number of Reflections(R-Free) 105
    Number of Reflections(R-Work) 2215
    R-Factor(R-Work) 0.2344
    R-Factor(R-Free) 0.264
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2183
    Shell Resolution(Low) 2.2529
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2610
    R-Factor(R-Work) 0.2279
    R-Factor(R-Free) 0.2892
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2529
    Shell Resolution(Low) 2.2899
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2645
    R-Factor(R-Work) 0.2325
    R-Factor(R-Free) 0.2928
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2899
    Shell Resolution(Low) 2.3294
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2613
    R-Factor(R-Work) 0.2192
    R-Factor(R-Free) 0.2653
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3294
    Shell Resolution(Low) 2.3717
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2653
    R-Factor(R-Work) 0.2144
    R-Factor(R-Free) 0.2856
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3717
    Shell Resolution(Low) 2.4173
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.2034
    R-Factor(R-Free) 0.2327
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4173
    Shell Resolution(Low) 2.4667
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2655
    R-Factor(R-Work) 0.2064
    R-Factor(R-Free) 0.2711
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4667
    Shell Resolution(Low) 2.5203
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.2022
    R-Factor(R-Free) 0.2589
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5203
    Shell Resolution(Low) 2.5789
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2652
    R-Factor(R-Work) 0.2087
    R-Factor(R-Free) 0.232
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5789
    Shell Resolution(Low) 2.6434
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 2615
    R-Factor(R-Work) 0.207
    R-Factor(R-Free) 0.2686
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6434
    Shell Resolution(Low) 2.7149
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2666
    R-Factor(R-Work) 0.2076
    R-Factor(R-Free) 0.2578
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7149
    Shell Resolution(Low) 2.7948
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2631
    R-Factor(R-Work) 0.2072
    R-Factor(R-Free) 0.2757
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7948
    Shell Resolution(Low) 2.885
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2656
    R-Factor(R-Work) 0.2026
    R-Factor(R-Free) 0.2224
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.885
    Shell Resolution(Low) 2.988
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.2116
    R-Factor(R-Free) 0.2186
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.988
    Shell Resolution(Low) 3.1077
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2669
    R-Factor(R-Work) 0.198
    R-Factor(R-Free) 0.2537
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1077
    Shell Resolution(Low) 3.2491
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2674
    R-Factor(R-Work) 0.2042
    R-Factor(R-Free) 0.2798
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2491
    Shell Resolution(Low) 3.4203
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2668
    R-Factor(R-Work) 0.1894
    R-Factor(R-Free) 0.2138
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4203
    Shell Resolution(Low) 3.6345
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.177
    R-Factor(R-Free) 0.2
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6345
    Shell Resolution(Low) 3.915
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2677
    R-Factor(R-Work) 0.1632
    R-Factor(R-Free) 0.1988
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.915
    Shell Resolution(Low) 4.3087
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.1395
    R-Factor(R-Free) 0.1517
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3087
    Shell Resolution(Low) 4.9316
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2723
    R-Factor(R-Work) 0.1274
    R-Factor(R-Free) 0.1567
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9316
    Shell Resolution(Low) 6.2109
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2745
    R-Factor(R-Work) 0.1585
    R-Factor(R-Free) 0.1701
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.2109
    Shell Resolution(Low) 46.2466
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2875
    R-Factor(R-Work) 0.1777
    R-Factor(R-Free) 0.2131
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.051
    f_dihedral_angle_d 11.517
    f_angle_d 0.724
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7215
    Nucleic Acid Atoms 649
    Heterogen Atoms 39
    Solvent Atoms 578
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (PHENIX.REFINE: 1.7_650)
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.7_650)
    model building PHENIX version: (PHENIX.REFINE: 1.7_650)