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X-RAY DIFFRACTION
Materials and Methods page
4KFL
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Details 100 mM Tris-OAc, pH 7.0, 200 mM KSCN, 3.6-5 % PEG 20,000, 3-11.9 % v/v PEG 200
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 212.07 α = 90
    b = 454.4 β = 90
    c = 618.45 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
    Diffrn ID 2
    Data Collection Temperature 100
    Diffrn ID 3
    Data Collection Temperature 100
    Diffrn ID 4
    Data Collection Temperature 100
     
    Diffraction Detector
    Collection Date 2011-12-16
    Collection Date 2012-02-29
    Collection Date 2012-02-12
    Collection Date 2012-08-02
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
    Diffraction Protocol SINGLE WAVELENGTH
    Diffraction Protocol SINGLE WAVELENGTH
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL9-1
    Wavelength 1.03316
    Site SSRL
    Beamline BL9-1
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL7-1
    Wavelength 0.9636
    Site SSRL
    Beamline BL7-1
    Source SYNCHROTRON
    Type ALS BEAMLINE 12.3.1
    Wavelength 1.116
    Site ALS
    Beamline 12.3.1
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL11-1
    Wavelength 1.03322
    Site SSRL
    Beamline BL11-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 3.4
    Resolution(Low) 50
    Number Reflections(Observed) 807927
    Redundancy 7.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.4
    Resolution(Low) 49.672
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 807927
    Number of Reflections(R-Free) 16161
    Percent Reflections(Observed) 99.65
    R-Factor(Observed) 0.235
    R-Work 0.2343
    R-Free 0.2681
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -3.5525
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 14.5549
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -11.0024
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4
    Shell Resolution(Low) 3.4386
    Number of Reflections(R-Free) 536
    Number of Reflections(R-Work) 26265
    R-Factor(R-Work) 0.3523
    R-Factor(R-Free) 0.3762
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4386
    Shell Resolution(Low) 3.4791
    Number of Reflections(R-Free) 536
    Number of Reflections(R-Work) 26286
    R-Factor(R-Work) 0.3448
    R-Factor(R-Free) 0.3663
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4791
    Shell Resolution(Low) 3.5215
    Number of Reflections(R-Free) 536
    Number of Reflections(R-Work) 26265
    R-Factor(R-Work) 0.3371
    R-Factor(R-Free) 0.368
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5215
    Shell Resolution(Low) 3.5661
    Number of Reflections(R-Free) 535
    Number of Reflections(R-Work) 26169
    R-Factor(R-Work) 0.323
    R-Factor(R-Free) 0.3393
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5661
    Shell Resolution(Low) 3.613
    Number of Reflections(R-Free) 536
    Number of Reflections(R-Work) 26303
    R-Factor(R-Work) 0.3279
    R-Factor(R-Free) 0.3638
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.613
    Shell Resolution(Low) 3.6624
    Number of Reflections(R-Free) 537
    Number of Reflections(R-Work) 26289
    R-Factor(R-Work) 0.3108
    R-Factor(R-Free) 0.3398
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6624
    Shell Resolution(Low) 3.7147
    Number of Reflections(R-Free) 537
    Number of Reflections(R-Work) 26336
    R-Factor(R-Work) 0.2981
    R-Factor(R-Free) 0.3226
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7147
    Shell Resolution(Low) 3.7702
    Number of Reflections(R-Free) 536
    Number of Reflections(R-Work) 26249
    R-Factor(R-Work) 0.2931
    R-Factor(R-Free) 0.3177
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7702
    Shell Resolution(Low) 3.8291
    Number of Reflections(R-Free) 537
    Number of Reflections(R-Work) 26305
    R-Factor(R-Work) 0.2798
    R-Factor(R-Free) 0.3052
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8291
    Shell Resolution(Low) 3.8918
    Number of Reflections(R-Free) 536
    Number of Reflections(R-Work) 26288
    R-Factor(R-Work) 0.269
    R-Factor(R-Free) 0.3078
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8918
    Shell Resolution(Low) 3.9589
    Number of Reflections(R-Free) 538
    Number of Reflections(R-Work) 26338
    R-Factor(R-Work) 0.2618
    R-Factor(R-Free) 0.2936
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9589
    Shell Resolution(Low) 4.0309
    Number of Reflections(R-Free) 534
    Number of Reflections(R-Work) 26158
    R-Factor(R-Work) 0.2601
    R-Factor(R-Free) 0.2945
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0309
    Shell Resolution(Low) 4.1083
    Number of Reflections(R-Free) 533
    Number of Reflections(R-Work) 26147
    R-Factor(R-Work) 0.2548
    R-Factor(R-Free) 0.303
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1083
    Shell Resolution(Low) 4.1922
    Number of Reflections(R-Free) 539
    Number of Reflections(R-Work) 26388
    R-Factor(R-Work) 0.2402
    R-Factor(R-Free) 0.2851
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1922
    Shell Resolution(Low) 4.2833
    Number of Reflections(R-Free) 538
    Number of Reflections(R-Work) 26381
    R-Factor(R-Work) 0.2329
    R-Factor(R-Free) 0.2773
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2833
    Shell Resolution(Low) 4.3829
    Number of Reflections(R-Free) 537
    Number of Reflections(R-Work) 26303
    R-Factor(R-Work) 0.2223
    R-Factor(R-Free) 0.2568
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3829
    Shell Resolution(Low) 4.4924
    Number of Reflections(R-Free) 539
    Number of Reflections(R-Work) 26417
    R-Factor(R-Work) 0.2283
    R-Factor(R-Free) 0.2836
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4924
    Shell Resolution(Low) 4.6138
    Number of Reflections(R-Free) 538
    Number of Reflections(R-Work) 26363
    R-Factor(R-Work) 0.2203
    R-Factor(R-Free) 0.249
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6138
    Shell Resolution(Low) 4.7494
    Number of Reflections(R-Free) 538
    Number of Reflections(R-Work) 26362
    R-Factor(R-Work) 0.2109
    R-Factor(R-Free) 0.2493
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7494
    Shell Resolution(Low) 4.9026
    Number of Reflections(R-Free) 538
    Number of Reflections(R-Work) 26355
    R-Factor(R-Work) 0.2075
    R-Factor(R-Free) 0.2537
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9026
    Shell Resolution(Low) 5.0777
    Number of Reflections(R-Free) 540
    Number of Reflections(R-Work) 26457
    R-Factor(R-Work) 0.2044
    R-Factor(R-Free) 0.2394
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0777
    Shell Resolution(Low) 5.2807
    Number of Reflections(R-Free) 540
    Number of Reflections(R-Work) 26477
    R-Factor(R-Work) 0.1968
    R-Factor(R-Free) 0.2321
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2807
    Shell Resolution(Low) 5.5208
    Number of Reflections(R-Free) 535
    Number of Reflections(R-Work) 26206
    R-Factor(R-Work) 0.191
    R-Factor(R-Free) 0.2361
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5208
    Shell Resolution(Low) 5.8114
    Number of Reflections(R-Free) 542
    Number of Reflections(R-Work) 26543
    R-Factor(R-Work) 0.1817
    R-Factor(R-Free) 0.232
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8114
    Shell Resolution(Low) 6.1749
    Number of Reflections(R-Free) 542
    Number of Reflections(R-Work) 26574
    R-Factor(R-Work) 0.1779
    R-Factor(R-Free) 0.2058
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.1749
    Shell Resolution(Low) 6.6507
    Number of Reflections(R-Free) 543
    Number of Reflections(R-Work) 26617
    R-Factor(R-Work) 0.1907
    R-Factor(R-Free) 0.2442
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.6507
    Shell Resolution(Low) 7.318
    Number of Reflections(R-Free) 543
    Number of Reflections(R-Work) 26603
    R-Factor(R-Work) 0.1925
    R-Factor(R-Free) 0.2293
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.318
    Shell Resolution(Low) 8.3726
    Number of Reflections(R-Free) 539
    Number of Reflections(R-Work) 26380
    R-Factor(R-Work) 0.1969
    R-Factor(R-Free) 0.2324
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.3726
    Shell Resolution(Low) 10.532
    Number of Reflections(R-Free) 549
    Number of Reflections(R-Work) 26893
    R-Factor(R-Work) 0.2108
    R-Factor(R-Free) 0.2391
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 10.532
    Shell Resolution(Low) 49.6775
    Number of Reflections(R-Free) 554
    Number of Reflections(R-Work) 27049
    R-Factor(R-Work) 0.2404
    R-Factor(R-Free) 0.2509
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.053
    f_dihedral_angle_d 18.745
    f_angle_d 0.621
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 27105
    Nucleic Acid Atoms 62610
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Structure Solution CNS
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building CNS
    data collection XDS