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X-RAY DIFFRACTION
Materials and Methods page
4KFC
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.5
    Temperature 293.0
    Details 3-5% PEG 4K, 0.1 M sodium acetate buffer (pH 5.5), 0.1 M MgCl2, 2mM L-proline, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 132.77 α = 90
    b = 132.77 β = 90
    c = 134.51 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2011-10-30
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-B
    Wavelength List 1.0332
    Site APS
    Beamline 23-ID-B
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.53
    Resolution(Low) 44.43
    Number Reflections(All) 40355
    Number Reflections(Observed) 40336
    Percent Possible(Observed) 99.95
    R Merge I(Observed) 0.11
    Redundancy 12.0
     
    High Resolution Shell Details
    Resolution(High) 2.53
    Resolution(Low) 2.62
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.49
    Mean I Over Sigma(Observed) 4.4
    Redundancy 12.2
    Number Unique Reflections(All) 40355
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.53
    Resolution(Low) 44.32
    Cut-off Sigma(F) 1.33
    Number of Reflections(all) 40355
    Number of Reflections(Observed) 40336
    Number of Reflections(R-Free) 4013
    Percent Reflections(Observed) 99.07
    R-Factor(Observed) 0.208
    R-Work 0.2038
    R-Free 0.245
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.53
    Shell Resolution(Low) 2.5598
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 1247
    R-Factor(R-Work) 0.2952
    R-Factor(R-Free) 0.3862
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5598
    Shell Resolution(Low) 2.591
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1257
    R-Factor(R-Work) 0.2693
    R-Factor(R-Free) 0.2943
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.591
    Shell Resolution(Low) 2.6238
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1240
    R-Factor(R-Work) 0.2544
    R-Factor(R-Free) 0.3232
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6238
    Shell Resolution(Low) 2.6583
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1240
    R-Factor(R-Work) 0.253
    R-Factor(R-Free) 0.279
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6583
    Shell Resolution(Low) 2.6947
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1224
    R-Factor(R-Work) 0.2435
    R-Factor(R-Free) 0.3198
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6947
    Shell Resolution(Low) 2.7332
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1237
    R-Factor(R-Work) 0.2386
    R-Factor(R-Free) 0.2729
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7332
    Shell Resolution(Low) 2.774
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1244
    R-Factor(R-Work) 0.2572
    R-Factor(R-Free) 0.3267
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.774
    Shell Resolution(Low) 2.8173
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1258
    R-Factor(R-Work) 0.2374
    R-Factor(R-Free) 0.3074
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8173
    Shell Resolution(Low) 2.8635
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1248
    R-Factor(R-Work) 0.239
    R-Factor(R-Free) 0.3228
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8635
    Shell Resolution(Low) 2.9129
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1242
    R-Factor(R-Work) 0.2487
    R-Factor(R-Free) 0.3164
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9129
    Shell Resolution(Low) 2.9658
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 1241
    R-Factor(R-Work) 0.248
    R-Factor(R-Free) 0.2871
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9658
    Shell Resolution(Low) 3.0229
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1245
    R-Factor(R-Work) 0.2611
    R-Factor(R-Free) 0.3506
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0229
    Shell Resolution(Low) 3.0845
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1256
    R-Factor(R-Work) 0.2585
    R-Factor(R-Free) 0.2959
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0845
    Shell Resolution(Low) 3.1516
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1252
    R-Factor(R-Work) 0.2579
    R-Factor(R-Free) 0.3241
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1516
    Shell Resolution(Low) 3.2249
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1249
    R-Factor(R-Work) 0.241
    R-Factor(R-Free) 0.295
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2249
    Shell Resolution(Low) 3.3055
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1245
    R-Factor(R-Work) 0.2331
    R-Factor(R-Free) 0.2671
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3055
    Shell Resolution(Low) 3.3948
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1262
    R-Factor(R-Work) 0.2262
    R-Factor(R-Free) 0.2681
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3948
    Shell Resolution(Low) 3.4947
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1258
    R-Factor(R-Work) 0.2185
    R-Factor(R-Free) 0.2673
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4947
    Shell Resolution(Low) 3.6075
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1260
    R-Factor(R-Work) 0.2107
    R-Factor(R-Free) 0.2311
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6075
    Shell Resolution(Low) 3.7363
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1259
    R-Factor(R-Work) 0.1955
    R-Factor(R-Free) 0.2617
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7363
    Shell Resolution(Low) 3.8858
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1259
    R-Factor(R-Work) 0.1945
    R-Factor(R-Free) 0.2362
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8858
    Shell Resolution(Low) 4.0626
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1274
    R-Factor(R-Work) 0.183
    R-Factor(R-Free) 0.2228
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0626
    Shell Resolution(Low) 4.2766
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1278
    R-Factor(R-Work) 0.1637
    R-Factor(R-Free) 0.2026
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2766
    Shell Resolution(Low) 4.5443
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1270
    R-Factor(R-Work) 0.1596
    R-Factor(R-Free) 0.1787
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5443
    Shell Resolution(Low) 4.8948
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1280
    R-Factor(R-Work) 0.1595
    R-Factor(R-Free) 0.2004
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8948
    Shell Resolution(Low) 5.3866
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1296
    R-Factor(R-Work) 0.1809
    R-Factor(R-Free) 0.2264
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3866
    Shell Resolution(Low) 6.1642
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1295
    R-Factor(R-Work) 0.1974
    R-Factor(R-Free) 0.2394
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.1642
    Shell Resolution(Low) 7.7595
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1319
    R-Factor(R-Work) 0.1951
    R-Factor(R-Free) 0.221
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.7595
    Shell Resolution(Low) 44.3268
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 1088
    R-Factor(R-Work) 0.1925
    R-Factor(R-Free) 0.1991
    Percent Reflections(Observed) 77.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.054
    f_dihedral_angle_d 20.739
    f_angle_d 0.928
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3539
    Nucleic Acid Atoms 1224
    Heterogen Atoms 0
    Solvent Atoms 148
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MOSFLM
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: dev_1352)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_1352)
    model building PHASER
    data collection MOSFLM