X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7
Temperature 293.0
Details 10 % PEG3350, 0.2M K-thiocyanate, 0.1M Hepes 7.0 , VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 58.06 α = 90
b = 56.47 β = 93.88
c = 59.75 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 293
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR CCD 165 mm -- 2013-04-13
Diffraction Radiation
Monochromator Protocol
Bent Si (111) crystal, horizontally focusing SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON MAX II BEAMLINE I911-2 1.039 MAX II I911-2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.65 34.22 96.6 -- -- -- -- 46327 44752 0.0 1.3 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.6682 20.219 -- -- 45054 44707 2255 99.23 0.1748 0.1748 0.1725 0.2184 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.6682 1.7044 -- 139 2483 0.3666 0.4122 -- 93.0
X Ray Diffraction 1.7044 1.7441 -- 136 2616 0.3419 0.363 -- 99.0
X Ray Diffraction 1.7441 1.7876 -- 153 2631 0.2938 0.356 -- 99.0
X Ray Diffraction 1.7876 1.8359 -- 133 2622 0.2514 0.3447 -- 99.0
X Ray Diffraction 1.8359 1.8899 -- 129 2681 0.2131 0.2681 -- 99.0
X Ray Diffraction 1.8899 1.9509 -- 126 2640 0.197 0.2671 -- 99.0
X Ray Diffraction 1.9509 2.0206 -- 131 2679 0.189 0.2377 -- 100.0
X Ray Diffraction 2.0206 2.1014 -- 148 2640 0.1863 0.2179 -- 100.0
X Ray Diffraction 2.1014 2.1969 -- 129 2665 0.1597 0.2086 -- 100.0
X Ray Diffraction 2.1969 2.3126 -- 142 2690 0.1669 0.2311 -- 100.0
X Ray Diffraction 2.3126 2.4572 -- 148 2650 0.1752 0.2045 -- 100.0
X Ray Diffraction 2.4572 2.6466 -- 133 2687 0.1742 0.2434 -- 100.0
X Ray Diffraction 2.6466 2.9122 -- 142 2665 0.1703 0.2204 -- 100.0
X Ray Diffraction 2.9122 3.332 -- 159 2682 0.1602 0.1938 -- 100.0
X Ray Diffraction 3.332 4.1918 -- 150 2684 0.1406 0.1928 -- 100.0
X Ray Diffraction 4.1918 20.2205 -- 157 2737 0.1476 0.1857 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.008
f_chiral_restr 0.129
f_dihedral_angle_d 15.471
f_angle_d 1.624
f_bond_d 0.015
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2890
Nucleic Acid Atoms 0
Heterogen Atoms 5
Solvent Atoms 399

Software

Computing
Computing Package Purpose
marccd Data Collection
XIA2 Data Reduction (intensity integration)
XIA2 Data Reduction (data scaling)
XIA2 Structure Solution
PHENIX (phenix.refine: 1.8.2_1309) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8.2_1309) refinement
XIA2 model building
marccd data collection