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X-RAY DIFFRACTION
Materials and Methods page
4KDS
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7
    Temperature 293.0
    Details 10 % PEG3350, 0.2M K-thiocyanate, 0.1M Hepes 7.0 , VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 58.06 α = 90
    b = 56.47 β = 93.88
    c = 59.75 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 293
     
    Diffraction Detector
    Detector CCD
    Type MAR CCD 165 mm
    Collection Date 2013-04-13
     
    Diffraction Radiation
    Monochromator Bent Si (111) crystal, horizontally focusing
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type MAX II BEAMLINE I911-2
    Wavelength List 1.039
    Site MAX II
    Beamline I911-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 1.3
    Resolution(High) 1.65
    Resolution(Low) 34.22
    Number Reflections(All) 46327
    Number Reflections(Observed) 44752
    Percent Possible(Observed) 96.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.6682
    Resolution(Low) 20.219
    Number of Reflections(all) 45054
    Number of Reflections(Observed) 44707
    Number of Reflections(R-Free) 2255
    Percent Reflections(Observed) 99.23
    R-Factor(All) 0.1748
    R-Factor(Observed) 0.1748
    R-Work 0.1725
    R-Free 0.2184
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6682
    Shell Resolution(Low) 1.7044
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2483
    R-Factor(R-Work) 0.3666
    R-Factor(R-Free) 0.4122
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7044
    Shell Resolution(Low) 1.7441
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2616
    R-Factor(R-Work) 0.3419
    R-Factor(R-Free) 0.363
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7441
    Shell Resolution(Low) 1.7876
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2631
    R-Factor(R-Work) 0.2938
    R-Factor(R-Free) 0.356
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7876
    Shell Resolution(Low) 1.8359
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.2514
    R-Factor(R-Free) 0.3447
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8359
    Shell Resolution(Low) 1.8899
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.2131
    R-Factor(R-Free) 0.2681
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8899
    Shell Resolution(Low) 1.9509
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.197
    R-Factor(R-Free) 0.2671
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9509
    Shell Resolution(Low) 2.0206
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2679
    R-Factor(R-Work) 0.189
    R-Factor(R-Free) 0.2377
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0206
    Shell Resolution(Low) 2.1014
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.1863
    R-Factor(R-Free) 0.2179
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1014
    Shell Resolution(Low) 2.1969
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.1597
    R-Factor(R-Free) 0.2086
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1969
    Shell Resolution(Low) 2.3126
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.1669
    R-Factor(R-Free) 0.2311
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3126
    Shell Resolution(Low) 2.4572
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2650
    R-Factor(R-Work) 0.1752
    R-Factor(R-Free) 0.2045
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4572
    Shell Resolution(Low) 2.6466
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2687
    R-Factor(R-Work) 0.1742
    R-Factor(R-Free) 0.2434
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6466
    Shell Resolution(Low) 2.9122
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.1703
    R-Factor(R-Free) 0.2204
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9122
    Shell Resolution(Low) 3.332
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2682
    R-Factor(R-Work) 0.1602
    R-Factor(R-Free) 0.1938
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.332
    Shell Resolution(Low) 4.1918
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2684
    R-Factor(R-Work) 0.1406
    R-Factor(R-Free) 0.1928
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1918
    Shell Resolution(Low) 20.2205
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2737
    R-Factor(R-Work) 0.1476
    R-Factor(R-Free) 0.1857
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.129
    f_dihedral_angle_d 15.471
    f_angle_d 1.624
    f_bond_d 0.015
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2890
    Nucleic Acid Atoms 0
    Heterogen Atoms 5
    Solvent Atoms 399
     
     
  •   Software and Computing Hide
    Computing
    Data Collection marccd
    Data Reduction (intensity integration) XIA2
    Data Reduction (data scaling) XIA2
    Structure Solution XIA2
    Structure Refinement PHENIX (phenix.refine: 1.8.2_1309)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.2_1309)
    model building XIA2
    data collection marccd