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X-RAY DIFFRACTION
Materials and Methods page
4KAZ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6
    Temperature 293.0
    Details 20% v/v 2-Propanol, 0.1 M MES monohydrate, 20% w/v Polyethylene glycol monomethyl ester 2000 , pH 6, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 60.67 α = 90
    b = 90.58 β = 90
    c = 46.62 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX225HE
    Collection Date 2011-06-03
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SPRING-8 BEAMLINE BL44XU
    Wavelength List 0.9
    Site SPRING-8
    Beamline BL44XU
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.9
    Resolution(Low) 30
    Number Reflections(All) 20966
    Number Reflections(Observed) 20966
    Percent Possible(Observed) 100.0
    Redundancy 8.5
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 1.97
    Percent Possible(All) 100.0
    Mean I Over Sigma(Observed) 3.92
    R-Sym I(Observed) 0.457
    Redundancy 7.7
    Number Unique Reflections(All) 2070
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.9
    Resolution(Low) 28.767
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 20916
    Number of Reflections(Observed) 20916
    Number of Reflections(R-Free) 1072
    Percent Reflections(Observed) 99.97
    R-Factor(All) 0.1904
    R-Factor(Observed) 0.1904
    R-Work 0.1889
    R-Free 0.2185
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9001
    Shell Resolution(Low) 1.9866
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2435
    R-Factor(R-Work) 0.2297
    R-Factor(R-Free) 0.2523
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9866
    Shell Resolution(Low) 2.0913
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2460
    R-Factor(R-Work) 0.215
    R-Factor(R-Free) 0.2409
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0913
    Shell Resolution(Low) 2.2223
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2434
    R-Factor(R-Work) 0.2103
    R-Factor(R-Free) 0.2665
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2223
    Shell Resolution(Low) 2.3938
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2418
    R-Factor(R-Work) 0.1975
    R-Factor(R-Free) 0.2441
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3938
    Shell Resolution(Low) 2.6345
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2465
    R-Factor(R-Work) 0.2028
    R-Factor(R-Free) 0.2599
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6345
    Shell Resolution(Low) 3.0154
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2486
    R-Factor(R-Work) 0.1969
    R-Factor(R-Free) 0.2338
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0154
    Shell Resolution(Low) 3.7977
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2525
    R-Factor(R-Work) 0.1741
    R-Factor(R-Free) 0.2218
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7977
    Shell Resolution(Low) 28.7702
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.1707
    R-Factor(R-Free) 0.1695
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.077
    f_dihedral_angle_d 19.102
    f_angle_d 1.148
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1585
    Nucleic Acid Atoms 301
    Heterogen Atoms 2
    Solvent Atoms 168
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution AMoRE
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building AMoRE
    data collection HKL-2000