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X-RAY DIFFRACTION
Materials and Methods page
4K9B
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 293.0
    Details 0.1 M HEPES, 0.2 M MgCl2, 30% PEG300, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 85.31 α = 90
    b = 98.28 β = 90
    c = 130.03 γ = 90
     
    Space Group
    Space Group Name:    I 2 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 200
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2013-03-07
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Wavelength List 0.9792
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.26
    Resolution(Low) 50
    Number Reflections(All) 25950
    Number Reflections(Observed) 25950
    Percent Possible(Observed) 100.0
     
    High Resolution Shell Details
    Resolution(High) 2.26
    Resolution(Low) 2.38
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.26
    Resolution(Low) 42.656
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 25950
    Number of Reflections(Observed) 25950
    Number of Reflections(R-Free) 2000
    Percent Reflections(Observed) 99.94
    R-Factor(Observed) 0.1757
    R-Work 0.1721
    R-Free 0.2175
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2601
    Shell Resolution(Low) 2.3166
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1677
    R-Factor(R-Work) 0.2452
    R-Factor(R-Free) 0.3307
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3166
    Shell Resolution(Low) 2.3793
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1681
    R-Factor(R-Work) 0.2249
    R-Factor(R-Free) 0.2644
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3793
    Shell Resolution(Low) 2.4493
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1699
    R-Factor(R-Work) 0.2023
    R-Factor(R-Free) 0.2606
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4493
    Shell Resolution(Low) 2.5283
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1691
    R-Factor(R-Work) 0.1881
    R-Factor(R-Free) 0.2837
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5283
    Shell Resolution(Low) 2.6187
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1684
    R-Factor(R-Work) 0.1848
    R-Factor(R-Free) 0.2817
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6187
    Shell Resolution(Low) 2.7235
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1692
    R-Factor(R-Work) 0.1962
    R-Factor(R-Free) 0.2383
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7235
    Shell Resolution(Low) 2.8474
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1689
    R-Factor(R-Work) 0.195
    R-Factor(R-Free) 0.2681
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8474
    Shell Resolution(Low) 2.9975
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1697
    R-Factor(R-Work) 0.2
    R-Factor(R-Free) 0.2432
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9975
    Shell Resolution(Low) 3.1853
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1725
    R-Factor(R-Work) 0.1995
    R-Factor(R-Free) 0.2517
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1853
    Shell Resolution(Low) 3.4311
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1708
    R-Factor(R-Work) 0.1692
    R-Factor(R-Free) 0.2076
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4311
    Shell Resolution(Low) 3.7762
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1709
    R-Factor(R-Work) 0.1565
    R-Factor(R-Free) 0.1932
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7762
    Shell Resolution(Low) 4.3222
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1734
    R-Factor(R-Work) 0.1507
    R-Factor(R-Free) 0.1768
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3222
    Shell Resolution(Low) 5.4437
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1753
    R-Factor(R-Work) 0.1387
    R-Factor(R-Free) 0.1984
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4437
    Shell Resolution(Low) 42.6631
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 1811
    R-Factor(R-Work) 0.1753
    R-Factor(R-Free) 0.204
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.149
    f_dihedral_angle_d 20.378
    f_angle_d 1.933
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2929
    Nucleic Acid Atoms 589
    Heterogen Atoms 51
    Solvent Atoms 165
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHASER
    data collection ADSC version: Quantum