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X-RAY DIFFRACTION
Materials and Methods page
4K9A
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6
    Temperature 293.0
    Details 0.1 M MES, 40% MPD, pH 6.0, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 85.42 α = 90
    b = 98.02 β = 90
    c = 131.34 γ = 90
     
    Space Group
    Space Group Name:    I 2 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 200
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2013-03-21
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Wavelength List 0.9795
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.26
    Resolution(Low) 78.6
    Number Reflections(All) 26032
    Number Reflections(Observed) 25590
    Percent Possible(Observed) 98.3
     
    High Resolution Shell Details
    Resolution(High) 2.26
    Resolution(Low) 2.38
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.264
    Resolution(Low) 78.554
    Cut-off Sigma(F) 1.36
    Number of Reflections(all) 26032
    Number of Reflections(Observed) 25590
    Number of Reflections(R-Free) 2000
    Percent Reflections(Observed) 98.17
    R-Factor(Observed) 0.1718
    R-Work 0.1684
    R-Free 0.2102
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2637
    Shell Resolution(Low) 2.3204
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 1375
    R-Factor(R-Work) 0.2248
    R-Factor(R-Free) 0.2585
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3204
    Shell Resolution(Low) 2.3831
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1601
    R-Factor(R-Work) 0.2063
    R-Factor(R-Free) 0.2585
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3831
    Shell Resolution(Low) 2.4532
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1687
    R-Factor(R-Work) 0.198
    R-Factor(R-Free) 0.2209
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4532
    Shell Resolution(Low) 2.5324
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1683
    R-Factor(R-Work) 0.1872
    R-Factor(R-Free) 0.2656
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5324
    Shell Resolution(Low) 2.6229
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1702
    R-Factor(R-Work) 0.1898
    R-Factor(R-Free) 0.2375
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6229
    Shell Resolution(Low) 2.728
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1711
    R-Factor(R-Work) 0.1954
    R-Factor(R-Free) 0.2297
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.728
    Shell Resolution(Low) 2.8521
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1692
    R-Factor(R-Work) 0.1871
    R-Factor(R-Free) 0.2586
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8521
    Shell Resolution(Low) 3.0025
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1688
    R-Factor(R-Work) 0.1954
    R-Factor(R-Free) 0.25
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0025
    Shell Resolution(Low) 3.1906
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1724
    R-Factor(R-Work) 0.1858
    R-Factor(R-Free) 0.2289
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1906
    Shell Resolution(Low) 3.437
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1710
    R-Factor(R-Work) 0.1645
    R-Factor(R-Free) 0.2319
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.437
    Shell Resolution(Low) 3.7828
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1713
    R-Factor(R-Work) 0.1588
    R-Factor(R-Free) 0.1783
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7828
    Shell Resolution(Low) 4.3302
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1729
    R-Factor(R-Work) 0.1435
    R-Factor(R-Free) 0.1782
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3302
    Shell Resolution(Low) 5.4554
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 1764
    R-Factor(R-Work) 0.1378
    R-Factor(R-Free) 0.1832
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4554
    Shell Resolution(Low) 78.6013
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 1811
    R-Factor(R-Work) 0.1646
    R-Factor(R-Free) 0.1877
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.145
    f_dihedral_angle_d 19.815
    f_angle_d 1.433
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2924
    Nucleic Acid Atoms 592
    Heterogen Atoms 52
    Solvent Atoms 199
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHASER
    data collection ADSC version: Quantum