X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 5.2
Temperature 293.0
Details 0.1 M NaAc, 12% MPD, pH 5.2, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 85.12 α = 90
b = 97.61 β = 90
c = 131.37 γ = 90
Symmetry
Space Group I 2 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 200
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2013-03-07
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.9792 APS 24-ID-E

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.95 50 100.0 -- -- -- -- 40199 40199 2.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.95 2.05 100.0 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.95 39.176 -- 1.35 40199 40199 1693 99.93 -- 0.1776 0.176 0.2124 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.95 2.0074 -- 139 3173 0.2298 0.2706 -- 100.0
X Ray Diffraction 2.0074 2.0722 -- 140 3175 0.2066 0.2439 -- 100.0
X Ray Diffraction 2.0722 2.1463 -- 140 3170 0.1988 0.2575 -- 100.0
X Ray Diffraction 2.1463 2.2322 -- 140 3180 0.1838 0.2311 -- 100.0
X Ray Diffraction 2.2322 2.3338 -- 139 3170 0.1828 0.2306 -- 100.0
X Ray Diffraction 2.3338 2.4568 -- 139 3165 0.1818 0.2014 -- 100.0
X Ray Diffraction 2.4568 2.6107 -- 141 3207 0.1873 0.2356 -- 100.0
X Ray Diffraction 2.6107 2.8122 -- 142 3214 0.1905 0.2395 -- 100.0
X Ray Diffraction 2.8122 3.0951 -- 140 3210 0.1912 0.2338 -- 100.0
X Ray Diffraction 3.0951 3.5427 -- 143 3234 0.1686 0.1941 -- 100.0
X Ray Diffraction 3.5427 4.4624 -- 143 3253 0.1521 0.193 -- 100.0
X Ray Diffraction 4.4624 39.1838 -- 147 3355 0.1702 0.1954 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.156
f_dihedral_angle_d 20.676
f_angle_d 1.718
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2924
Nucleic Acid Atoms 592
Heterogen Atoms 56
Solvent Atoms 314

Software

Computing
Computing Package Purpose
ADSC Quantum Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.8.1_1168) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8.1_1168) refinement
PHASER model building
ADSC version: Quantum data collection