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X-RAY DIFFRACTION
Materials and Methods page
4K99
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 5.2
    Temperature 293.0
    Details 0.1 M NaAc, 12% MPD, pH 5.2, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 85.12 α = 90
    b = 97.61 β = 90
    c = 131.37 γ = 90
     
    Space Group
    Space Group Name:    I 2 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 200
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2013-03-07
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Wavelength List 0.9792
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.95
    Resolution(Low) 50
    Number Reflections(All) 40199
    Number Reflections(Observed) 40199
    Percent Possible(Observed) 100.0
     
    High Resolution Shell Details
    Resolution(High) 1.95
    Resolution(Low) 2.05
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.95
    Resolution(Low) 39.176
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 40199
    Number of Reflections(Observed) 40199
    Number of Reflections(R-Free) 1693
    Percent Reflections(Observed) 99.93
    R-Factor(Observed) 0.1776
    R-Work 0.176
    R-Free 0.2124
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.95
    Shell Resolution(Low) 2.0074
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3173
    R-Factor(R-Work) 0.2298
    R-Factor(R-Free) 0.2706
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0074
    Shell Resolution(Low) 2.0722
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3175
    R-Factor(R-Work) 0.2066
    R-Factor(R-Free) 0.2439
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0722
    Shell Resolution(Low) 2.1463
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3170
    R-Factor(R-Work) 0.1988
    R-Factor(R-Free) 0.2575
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1463
    Shell Resolution(Low) 2.2322
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3180
    R-Factor(R-Work) 0.1838
    R-Factor(R-Free) 0.2311
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2322
    Shell Resolution(Low) 2.3338
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3170
    R-Factor(R-Work) 0.1828
    R-Factor(R-Free) 0.2306
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3338
    Shell Resolution(Low) 2.4568
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3165
    R-Factor(R-Work) 0.1818
    R-Factor(R-Free) 0.2014
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4568
    Shell Resolution(Low) 2.6107
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3207
    R-Factor(R-Work) 0.1873
    R-Factor(R-Free) 0.2356
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6107
    Shell Resolution(Low) 2.8122
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3214
    R-Factor(R-Work) 0.1905
    R-Factor(R-Free) 0.2395
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8122
    Shell Resolution(Low) 3.0951
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3210
    R-Factor(R-Work) 0.1912
    R-Factor(R-Free) 0.2338
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0951
    Shell Resolution(Low) 3.5427
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3234
    R-Factor(R-Work) 0.1686
    R-Factor(R-Free) 0.1941
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5427
    Shell Resolution(Low) 4.4624
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3253
    R-Factor(R-Work) 0.1521
    R-Factor(R-Free) 0.193
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4624
    Shell Resolution(Low) 39.1838
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 3355
    R-Factor(R-Work) 0.1702
    R-Factor(R-Free) 0.1954
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.156
    f_dihedral_angle_d 20.676
    f_angle_d 1.718
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2924
    Nucleic Acid Atoms 592
    Heterogen Atoms 56
    Solvent Atoms 314
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHASER
    data collection ADSC version: Quantum