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X-RAY DIFFRACTION
Materials and Methods page
4K97
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.7
    Temperature 293.0
    Details 0.1 M HEPES, 0.2 M CaAc2, 20% PEG300, pH 7.7, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 86.2 α = 90
    b = 99.37 β = 90
    c = 131.52 γ = 90
     
    Space Group
    Space Group Name:    I 2 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 200
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2013-02-08
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-C
    Wavelength List 0.9823
    Site APS
    Beamline 24-ID-C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.41
    Resolution(Low) 50
    Number Reflections(All) 22187
    Number Reflections(Observed) 22099
    Percent Possible(Observed) 99.6
     
    High Resolution Shell Details
    Resolution(High) 2.41
    Resolution(Low) 2.54
    Percent Possible(All) 97.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.41
    Resolution(Low) 49.69
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 22187
    Number of Reflections(Observed) 22099
    Number of Reflections(R-Free) 2000
    Percent Reflections(Observed) 99.6
    R-Factor(Observed) 0.197
    R-Work 0.193
    R-Free 0.236
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.41
    Shell Resolution(Low) 2.4703
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1388
    R-Factor(R-Work) 0.2507
    R-Factor(R-Free) 0.2797
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4703
    Shell Resolution(Low) 2.5371
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1427
    R-Factor(R-Work) 0.2446
    R-Factor(R-Free) 0.343
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5371
    Shell Resolution(Low) 2.6117
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1409
    R-Factor(R-Work) 0.2435
    R-Factor(R-Free) 0.2793
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6117
    Shell Resolution(Low) 2.696
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1424
    R-Factor(R-Work) 0.2322
    R-Factor(R-Free) 0.3115
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.696
    Shell Resolution(Low) 2.7924
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1424
    R-Factor(R-Work) 0.2389
    R-Factor(R-Free) 0.2907
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7924
    Shell Resolution(Low) 2.9042
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1427
    R-Factor(R-Work) 0.2377
    R-Factor(R-Free) 0.3096
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9042
    Shell Resolution(Low) 3.0363
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1402
    R-Factor(R-Work) 0.2362
    R-Factor(R-Free) 0.263
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0363
    Shell Resolution(Low) 3.1964
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1457
    R-Factor(R-Work) 0.2335
    R-Factor(R-Free) 0.2908
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1964
    Shell Resolution(Low) 3.3966
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1413
    R-Factor(R-Work) 0.2105
    R-Factor(R-Free) 0.2932
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3966
    Shell Resolution(Low) 3.6588
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1437
    R-Factor(R-Work) 0.188
    R-Factor(R-Free) 0.2364
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6588
    Shell Resolution(Low) 4.0268
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1443
    R-Factor(R-Work) 0.1752
    R-Factor(R-Free) 0.2078
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0268
    Shell Resolution(Low) 4.6091
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1455
    R-Factor(R-Work) 0.1514
    R-Factor(R-Free) 0.1778
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6091
    Shell Resolution(Low) 5.8056
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1457
    R-Factor(R-Work) 0.1514
    R-Factor(R-Free) 0.2061
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8056
    Shell Resolution(Low) 49.697
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 1536
    R-Factor(R-Work) 0.1847
    R-Factor(R-Free) 0.2006
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.071
    f_dihedral_angle_d 22.127
    f_angle_d 1.19
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2900
    Nucleic Acid Atoms 592
    Heterogen Atoms 34
    Solvent Atoms 123
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHASER
    data collection ADSC version: Quantum
     
     
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