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X-RAY DIFFRACTION
Materials and Methods page
4K96
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.6
    Temperature 293.0
    Details 0.1 M MES, 8% MPD, pH 6.6, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 181.91 α = 90
    b = 93.8 β = 97.72
    c = 75.51 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 200
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2013-01-23
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 0.9790
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.08
    Resolution(Low) 50
    Number Reflections(All) 74501
    Number Reflections(Observed) 74352
    Percent Possible(Observed) 99.8
     
    High Resolution Shell Details
    Resolution(High) 2.084
    Resolution(Low) 2.18
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.084
    Resolution(Low) 45.066
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 74501
    Number of Reflections(Observed) 74352
    Number of Reflections(R-Free) 2000
    Percent Reflections(Observed) 98.96
    R-Factor(Observed) 0.2023
    R-Work 0.2016
    R-Free 0.2263
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0838
    Shell Resolution(Low) 2.1359
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 4559
    R-Factor(R-Work) 0.2516
    R-Factor(R-Free) 0.2785
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1359
    Shell Resolution(Low) 2.1937
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 5187
    R-Factor(R-Work) 0.2405
    R-Factor(R-Free) 0.2956
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1937
    Shell Resolution(Low) 2.2582
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 5206
    R-Factor(R-Work) 0.2282
    R-Factor(R-Free) 0.2787
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2582
    Shell Resolution(Low) 2.3311
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 5192
    R-Factor(R-Work) 0.222
    R-Factor(R-Free) 0.2418
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3311
    Shell Resolution(Low) 2.4144
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 5187
    R-Factor(R-Work) 0.2196
    R-Factor(R-Free) 0.2732
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4144
    Shell Resolution(Low) 2.5111
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 5219
    R-Factor(R-Work) 0.2144
    R-Factor(R-Free) 0.2714
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5111
    Shell Resolution(Low) 2.6253
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 5225
    R-Factor(R-Work) 0.2123
    R-Factor(R-Free) 0.2624
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6253
    Shell Resolution(Low) 2.7637
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 5182
    R-Factor(R-Work) 0.2279
    R-Factor(R-Free) 0.2568
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7637
    Shell Resolution(Low) 2.9369
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 5244
    R-Factor(R-Work) 0.2166
    R-Factor(R-Free) 0.2899
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9369
    Shell Resolution(Low) 3.1636
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 5199
    R-Factor(R-Work) 0.2152
    R-Factor(R-Free) 0.1967
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1636
    Shell Resolution(Low) 3.4818
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 5204
    R-Factor(R-Work) 0.1984
    R-Factor(R-Free) 0.2105
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4818
    Shell Resolution(Low) 3.9854
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 5255
    R-Factor(R-Work) 0.1821
    R-Factor(R-Free) 0.2154
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9854
    Shell Resolution(Low) 5.0201
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 5245
    R-Factor(R-Work) 0.1676
    R-Factor(R-Free) 0.1896
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0201
    Shell Resolution(Low) 45.0764
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 5248
    R-Factor(R-Work) 0.206
    R-Factor(R-Free) 0.2114
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.077
    f_dihedral_angle_d 19.981
    f_angle_d 0.947
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5875
    Nucleic Acid Atoms 1382
    Heterogen Atoms 2
    Solvent Atoms 722
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SOLVE
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building SOLVE
    data collection CBASS