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X-RAY DIFFRACTION
Materials and Methods page
4K8X
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    Temperature 291.0
    Details 0.2M Lithium chloride, 2.2M Ammonium sulfate, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 112.21 α = 90
    b = 142.62 β = 90
    c = 66.7 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type PSI PILATUS 6M
    Collection Date 2012-07-05
     
    Diffraction Radiation
    Monochromator LN2 cooled fixed-exit Si(111) monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06SA
    Wavelength List 0.97793
    Site SLS
    Beamline X06SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.28
    Resolution(Low) 48.71
    Number Reflections(All) 49646
    Number Reflections(Observed) 49600
    Percent Possible(Observed) 99.9
    B(Isotropic) From Wilson Plot 43.96
    Redundancy 6.7
     
    High Resolution Shell Details
    Resolution(High) 2.28
    Resolution(Low) 2.42
    Percent Possible(All) 99.9
    Mean I Over Sigma(Observed) 0.82
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.28
    Resolution(Low) 48.712
    Cut-off Sigma(F) 1.99
    Number of Reflections(all) 49586
    Number of Reflections(Observed) 49542
    Number of Reflections(R-Free) 2524
    Percent Reflections(Observed) 99.81
    R-Factor(Observed) 0.1976
    R-Work 0.1953
    R-Free 0.2383
     
    Temperature Factor Modeling
    Isotropic Thermal Model isotropic and tls
    Mean Isotropic B Value 61.701
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.28
    Shell Resolution(Low) 2.3239
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2603
    R-Factor(R-Work) 0.366
    R-Factor(R-Free) 0.4217
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3239
    Shell Resolution(Low) 2.3713
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2563
    R-Factor(R-Work) 0.3483
    R-Factor(R-Free) 0.3854
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3713
    Shell Resolution(Low) 2.4228
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2584
    R-Factor(R-Work) 0.3288
    R-Factor(R-Free) 0.3983
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4228
    Shell Resolution(Low) 2.4792
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2584
    R-Factor(R-Work) 0.3042
    R-Factor(R-Free) 0.3581
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4792
    Shell Resolution(Low) 2.5412
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2565
    R-Factor(R-Work) 0.2867
    R-Factor(R-Free) 0.3761
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5412
    Shell Resolution(Low) 2.6099
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2582
    R-Factor(R-Work) 0.2647
    R-Factor(R-Free) 0.2782
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6099
    Shell Resolution(Low) 2.6867
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2559
    R-Factor(R-Work) 0.2652
    R-Factor(R-Free) 0.2884
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6867
    Shell Resolution(Low) 2.7734
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2581
    R-Factor(R-Work) 0.2584
    R-Factor(R-Free) 0.3217
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7734
    Shell Resolution(Low) 2.8725
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2600
    R-Factor(R-Work) 0.2498
    R-Factor(R-Free) 0.334
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8725
    Shell Resolution(Low) 2.9875
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2586
    R-Factor(R-Work) 0.2547
    R-Factor(R-Free) 0.3251
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9875
    Shell Resolution(Low) 3.1235
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.2463
    R-Factor(R-Free) 0.324
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1235
    Shell Resolution(Low) 3.2881
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2607
    R-Factor(R-Work) 0.2139
    R-Factor(R-Free) 0.2928
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2881
    Shell Resolution(Low) 3.4941
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2632
    R-Factor(R-Work) 0.1861
    R-Factor(R-Free) 0.2531
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4941
    Shell Resolution(Low) 3.7637
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2600
    R-Factor(R-Work) 0.1785
    R-Factor(R-Free) 0.2346
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7637
    Shell Resolution(Low) 4.1423
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2650
    R-Factor(R-Work) 0.1468
    R-Factor(R-Free) 0.1632
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1423
    Shell Resolution(Low) 4.7413
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2644
    R-Factor(R-Work) 0.1224
    R-Factor(R-Free) 0.1538
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7413
    Shell Resolution(Low) 5.9718
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2677
    R-Factor(R-Work) 0.1463
    R-Factor(R-Free) 0.1971
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9718
    Shell Resolution(Low) 48.7235
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2803
    R-Factor(R-Work) 0.163
    R-Factor(R-Free) 0.1824
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.072
    f_dihedral_angle_d 17.718
    f_angle_d 1.157
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6217
    Nucleic Acid Atoms 573
    Heterogen Atoms 95
    Solvent Atoms 134
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution Phenix
    Structure Refinement PHENIX (phenix.refine: dev_1358)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_1345)
    model building Phenix