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X-RAY DIFFRACTION
Materials and Methods page
4K8V
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.6
    Temperature 277.0
    Details 0.1 M HEPES, 0.1 M MgAc2, 20% PEG3350, pH 7.6, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 86.56 α = 90
    b = 84.15 β = 92.74
    c = 124.72 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 200
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2013-01-23
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 0.9790
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2
    Resolution(Low) 50
    Number Reflections(All) 120932
    Number Reflections(Observed) 118611
    Percent Possible(Observed) 98.08
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.07
    Percent Possible(All) 98.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.0
    Resolution(Low) 44.07
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 120932
    Number of Reflections(Observed) 118611
    Number of Reflections(R-Free) 5939
    Percent Reflections(Observed) 98.1
    R-Factor(Observed) 0.177
    R-Work 0.175
    R-Free 0.208
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9999
    Shell Resolution(Low) 2.0226
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 3112
    R-Factor(R-Work) 0.205
    R-Factor(R-Free) 0.2499
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0226
    Shell Resolution(Low) 2.0464
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 3407
    R-Factor(R-Work) 0.2003
    R-Factor(R-Free) 0.2768
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0464
    Shell Resolution(Low) 2.0713
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 3526
    R-Factor(R-Work) 0.1945
    R-Factor(R-Free) 0.2629
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0713
    Shell Resolution(Low) 2.0976
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 3684
    R-Factor(R-Work) 0.1945
    R-Factor(R-Free) 0.2242
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0976
    Shell Resolution(Low) 2.1252
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 3732
    R-Factor(R-Work) 0.189
    R-Factor(R-Free) 0.2619
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1252
    Shell Resolution(Low) 2.1543
    Number of Reflections(R-Free) 210
    Number of Reflections(R-Work) 3769
    R-Factor(R-Work) 0.1833
    R-Factor(R-Free) 0.2426
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1543
    Shell Resolution(Low) 2.1851
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 3723
    R-Factor(R-Work) 0.1783
    R-Factor(R-Free) 0.1938
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1851
    Shell Resolution(Low) 2.2177
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 3797
    R-Factor(R-Work) 0.1791
    R-Factor(R-Free) 0.2234
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2177
    Shell Resolution(Low) 2.2523
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 3718
    R-Factor(R-Work) 0.1786
    R-Factor(R-Free) 0.2293
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2523
    Shell Resolution(Low) 2.2892
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3820
    R-Factor(R-Work) 0.1776
    R-Factor(R-Free) 0.227
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2892
    Shell Resolution(Low) 2.3287
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 3744
    R-Factor(R-Work) 0.1838
    R-Factor(R-Free) 0.2292
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3287
    Shell Resolution(Low) 2.3711
    Number of Reflections(R-Free) 218
    Number of Reflections(R-Work) 3745
    R-Factor(R-Work) 0.1813
    R-Factor(R-Free) 0.2234
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3711
    Shell Resolution(Low) 2.4167
    Number of Reflections(R-Free) 198
    Number of Reflections(R-Work) 3822
    R-Factor(R-Work) 0.176
    R-Factor(R-Free) 0.2304
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4167
    Shell Resolution(Low) 2.466
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 3805
    R-Factor(R-Work) 0.1854
    R-Factor(R-Free) 0.2189
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.466
    Shell Resolution(Low) 2.5196
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 3737
    R-Factor(R-Work) 0.1863
    R-Factor(R-Free) 0.24
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5196
    Shell Resolution(Low) 2.5782
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 3816
    R-Factor(R-Work) 0.1861
    R-Factor(R-Free) 0.2251
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5782
    Shell Resolution(Low) 2.6427
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 3806
    R-Factor(R-Work) 0.1893
    R-Factor(R-Free) 0.244
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6427
    Shell Resolution(Low) 2.7141
    Number of Reflections(R-Free) 197
    Number of Reflections(R-Work) 3812
    R-Factor(R-Work) 0.1832
    R-Factor(R-Free) 0.2147
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7141
    Shell Resolution(Low) 2.794
    Number of Reflections(R-Free) 209
    Number of Reflections(R-Work) 3813
    R-Factor(R-Work) 0.1845
    R-Factor(R-Free) 0.2017
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.794
    Shell Resolution(Low) 2.8841
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 3807
    R-Factor(R-Work) 0.1838
    R-Factor(R-Free) 0.2056
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8841
    Shell Resolution(Low) 2.9872
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 3779
    R-Factor(R-Work) 0.1834
    R-Factor(R-Free) 0.2322
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9872
    Shell Resolution(Low) 3.1068
    Number of Reflections(R-Free) 195
    Number of Reflections(R-Work) 3837
    R-Factor(R-Work) 0.1788
    R-Factor(R-Free) 0.2262
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1068
    Shell Resolution(Low) 3.2481
    Number of Reflections(R-Free) 199
    Number of Reflections(R-Work) 3815
    R-Factor(R-Work) 0.1845
    R-Factor(R-Free) 0.2284
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2481
    Shell Resolution(Low) 3.4193
    Number of Reflections(R-Free) 205
    Number of Reflections(R-Work) 3810
    R-Factor(R-Work) 0.1722
    R-Factor(R-Free) 0.2243
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4193
    Shell Resolution(Low) 3.6334
    Number of Reflections(R-Free) 214
    Number of Reflections(R-Work) 3828
    R-Factor(R-Work) 0.1666
    R-Factor(R-Free) 0.1858
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6334
    Shell Resolution(Low) 3.9138
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 3842
    R-Factor(R-Work) 0.1554
    R-Factor(R-Free) 0.1799
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9138
    Shell Resolution(Low) 4.3074
    Number of Reflections(R-Free) 234
    Number of Reflections(R-Work) 3850
    R-Factor(R-Work) 0.1542
    R-Factor(R-Free) 0.1649
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3074
    Shell Resolution(Low) 4.93
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3857
    R-Factor(R-Work) 0.1476
    R-Factor(R-Free) 0.1651
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.93
    Shell Resolution(Low) 6.2085
    Number of Reflections(R-Free) 205
    Number of Reflections(R-Work) 3900
    R-Factor(R-Work) 0.1799
    R-Factor(R-Free) 0.2036
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.2085
    Shell Resolution(Low) 44.077
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 3959
    R-Factor(R-Work) 0.1814
    R-Factor(R-Free) 0.186
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.085
    f_dihedral_angle_d 16.047
    f_angle_d 1.207
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 11957
    Nucleic Acid Atoms 0
    Heterogen Atoms 4
    Solvent Atoms 1357
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SOLVE
    Structure Refinement PHENIX (PHENIX.REFINE: 1.8.2_1309)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.2_1309)
    model building SOLVE
    data collection CBASS