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X-RAY DIFFRACTION
Materials and Methods page
4K62
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 291.0
    Details 25% PEG 2000 MME, 0.1M HEPES, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 70.51 α = 90
    b = 70.51 β = 90
    c = 489.56 γ = 120
     
    Space Group
    Space Group Name:    P 3
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2012-10-03
     
    Diffraction Radiation
    Monochromator GRAPHITE
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 1.0000
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.5
    Resolution(Low) 50
    Number Reflections(All) 85842
    Number Reflections(Observed) 85842
    Percent Possible(Observed) 90.6
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.59
    Percent Possible(All) 81.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.502
    Resolution(Low) 48.887
    Cut-off Sigma(F) 1.96
    Number of Reflections(all) 85804
    Number of Reflections(Observed) 85804
    Number of Reflections(R-Free) 4284
    Percent Reflections(Observed) 91.21
    R-Factor(All) 0.2377
    R-Factor(Observed) 0.2377
    R-Work 0.2355
    R-Free 0.2793
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 34.2871
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.502
    Shell Resolution(Low) 2.5304
    Number of Reflections(R-Free) 105
    Number of Reflections(R-Work) 2339
    R-Factor(R-Work) 0.3067
    R-Factor(R-Free) 0.3616
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5304
    Shell Resolution(Low) 2.5602
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2745
    R-Factor(R-Work) 0.3001
    R-Factor(R-Free) 0.3285
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5602
    Shell Resolution(Low) 2.5914
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2878
    R-Factor(R-Work) 0.2984
    R-Factor(R-Free) 0.3782
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5914
    Shell Resolution(Low) 2.6242
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 2748
    R-Factor(R-Work) 0.2827
    R-Factor(R-Free) 0.3351
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6242
    Shell Resolution(Low) 2.6587
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2763
    R-Factor(R-Work) 0.289
    R-Factor(R-Free) 0.3646
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6587
    Shell Resolution(Low) 2.6951
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2849
    R-Factor(R-Work) 0.2686
    R-Factor(R-Free) 0.3231
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6951
    Shell Resolution(Low) 2.7336
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2815
    R-Factor(R-Work) 0.2705
    R-Factor(R-Free) 0.3401
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7336
    Shell Resolution(Low) 2.7744
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2790
    R-Factor(R-Work) 0.2759
    R-Factor(R-Free) 0.314
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7744
    Shell Resolution(Low) 2.8178
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 2835
    R-Factor(R-Work) 0.2819
    R-Factor(R-Free) 0.344
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8178
    Shell Resolution(Low) 2.864
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.2614
    R-Factor(R-Free) 0.3348
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.864
    Shell Resolution(Low) 2.9134
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2830
    R-Factor(R-Work) 0.2658
    R-Factor(R-Free) 0.3159
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9134
    Shell Resolution(Low) 2.9663
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2797
    R-Factor(R-Work) 0.2564
    R-Factor(R-Free) 0.314
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9663
    Shell Resolution(Low) 3.0234
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2744
    R-Factor(R-Work) 0.2668
    R-Factor(R-Free) 0.2843
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0234
    Shell Resolution(Low) 3.0851
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2802
    R-Factor(R-Work) 0.2562
    R-Factor(R-Free) 0.3378
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0851
    Shell Resolution(Low) 3.1521
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2736
    R-Factor(R-Work) 0.2543
    R-Factor(R-Free) 0.3159
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1521
    Shell Resolution(Low) 3.2255
    Number of Reflections(R-Free) 176
    Number of Reflections(R-Work) 2750
    R-Factor(R-Work) 0.2498
    R-Factor(R-Free) 0.312
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2255
    Shell Resolution(Low) 3.3061
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2723
    R-Factor(R-Work) 0.2519
    R-Factor(R-Free) 0.2867
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3061
    Shell Resolution(Low) 3.3955
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2772
    R-Factor(R-Work) 0.2438
    R-Factor(R-Free) 0.3087
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3955
    Shell Resolution(Low) 3.4954
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.2472
    R-Factor(R-Free) 0.2483
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4954
    Shell Resolution(Low) 3.6081
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2658
    R-Factor(R-Work) 0.2186
    R-Factor(R-Free) 0.2754
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6081
    Shell Resolution(Low) 3.7371
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2753
    R-Factor(R-Work) 0.222
    R-Factor(R-Free) 0.2674
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7371
    Shell Resolution(Low) 3.8866
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2649
    R-Factor(R-Work) 0.216
    R-Factor(R-Free) 0.2807
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8866
    Shell Resolution(Low) 4.0634
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2695
    R-Factor(R-Work) 0.2012
    R-Factor(R-Free) 0.2487
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0634
    Shell Resolution(Low) 4.2776
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2629
    R-Factor(R-Work) 0.1985
    R-Factor(R-Free) 0.2471
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2776
    Shell Resolution(Low) 4.5454
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.2009
    R-Factor(R-Free) 0.2197
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5454
    Shell Resolution(Low) 4.896
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2635
    R-Factor(R-Work) 0.195
    R-Factor(R-Free) 0.2522
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.896
    Shell Resolution(Low) 5.3882
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2639
    R-Factor(R-Work) 0.2143
    R-Factor(R-Free) 0.2609
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3882
    Shell Resolution(Low) 6.1665
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.2216
    R-Factor(R-Free) 0.2342
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.1665
    Shell Resolution(Low) 7.7642
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2689
    R-Factor(R-Work) 0.2324
    R-Factor(R-Free) 0.2435
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.7642
    Shell Resolution(Low) 48.8967
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2552
    R-Factor(R-Work) 0.2313
    R-Factor(R-Free) 0.2537
    Percent Reflections(Observed) 86.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.078
    f_dihedral_angle_d 16.858
    f_angle_d 1.137
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 15476
    Nucleic Acid Atoms 0
    Heterogen Atoms 28
    Solvent Atoms 373
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASER
    data collection ADSC version: Quantum