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X-RAY DIFFRACTION
Materials and Methods page
4K4S
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    Temperature 289.0
    Details sitting drop, temperature 289K, VAPOR DIFFUSION, SITTING DROP
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 58.77 α = 77.88
    b = 58.86 β = 77.8
    c = 97.59 γ = 79.97
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type NOIR-1
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 4.2.2
    Wavelength List 1.00
    Site ALS
    Beamline 4.2.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 1.5
    Resolution(High) 2.4
    Resolution(Low) 39.93
    Number Reflections(Observed) 47355
    Percent Possible(Observed) 97.7
    R Merge I(Observed) 0.066
    Redundancy 1.91
     
    High Resolution Shell Details
    Resolution(High) 2.4
    Resolution(Low) 2.49
    Percent Possible(All) 97.5
    R Merge I(Observed) 0.521
    Mean I Over Sigma(Observed) 1.5
    Redundancy 1.92
    Number Unique Reflections(All) 4721
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.4
    Resolution(Low) 39.922
    Cut-off Sigma(F) 1.98
    Number of Reflections(Observed) 47337
    Number of Reflections(R-Free) 2407
    Percent Reflections(Observed) 97.7
    R-Factor(Observed) 0.2001
    R-Work 0.1976
    R-Free 0.2446
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 58.2933
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4
    Shell Resolution(Low) 2.449
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2717
    R-Factor(R-Work) 0.3236
    R-Factor(R-Free) 0.3693
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.449
    Shell Resolution(Low) 2.5022
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2591
    R-Factor(R-Work) 0.3216
    R-Factor(R-Free) 0.3953
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5022
    Shell Resolution(Low) 2.5604
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.2969
    R-Factor(R-Free) 0.3321
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5604
    Shell Resolution(Low) 2.6244
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2597
    R-Factor(R-Work) 0.2623
    R-Factor(R-Free) 0.3584
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6244
    Shell Resolution(Low) 2.6954
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2685
    R-Factor(R-Work) 0.2707
    R-Factor(R-Free) 0.3622
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6954
    Shell Resolution(Low) 2.7747
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.2551
    R-Factor(R-Free) 0.3349
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7747
    Shell Resolution(Low) 2.8642
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.2632
    R-Factor(R-Free) 0.3652
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8642
    Shell Resolution(Low) 2.9666
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2628
    R-Factor(R-Work) 0.2616
    R-Factor(R-Free) 0.291
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9666
    Shell Resolution(Low) 3.0853
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2694
    R-Factor(R-Work) 0.2431
    R-Factor(R-Free) 0.3337
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0853
    Shell Resolution(Low) 3.2256
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2607
    R-Factor(R-Work) 0.2312
    R-Factor(R-Free) 0.3265
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2256
    Shell Resolution(Low) 3.3956
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.2179
    R-Factor(R-Free) 0.2792
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3956
    Shell Resolution(Low) 3.6082
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.206
    R-Factor(R-Free) 0.2583
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6082
    Shell Resolution(Low) 3.8866
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2652
    R-Factor(R-Work) 0.1691
    R-Factor(R-Free) 0.2147
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8866
    Shell Resolution(Low) 4.2773
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2652
    R-Factor(R-Work) 0.1513
    R-Factor(R-Free) 0.2122
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2773
    Shell Resolution(Low) 4.8953
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2634
    R-Factor(R-Work) 0.1488
    R-Factor(R-Free) 0.185
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8953
    Shell Resolution(Low) 6.1639
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2607
    R-Factor(R-Work) 0.1699
    R-Factor(R-Free) 0.1738
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.1639
    Shell Resolution(Low) 39.9276
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.1892
    R-Factor(R-Free) 0.2153
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 16.042
    f_plane_restr 0.006
    f_chiral_restr 0.048
    f_angle_d 1.129
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7402
    Nucleic Acid Atoms 1431
    Heterogen Atoms 32
    Solvent Atoms 238
     
     
  •   Software and Computing Hide
    Computing
    Data Collection BLU-ICE
    Data Reduction (intensity integration) DTREK
    Data Reduction (data scaling) DTREK
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.8.2_1309)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction D*trek version: 9.9.9.1L
    data collection D*trek