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X-RAY DIFFRACTION
Materials and Methods page
4K4L
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 9.5
    Temperature 289.0
    Details 0.2 M lithium sulfate, 0.1 M CHES buffer, 1 M potassium/sodium tartrate, 0.02 M acetylcholine., pH 9.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 71.75 α = 90
    b = 134.5 β = 90
    c = 137.09 γ = 90
     
    Space Group
    Space Group Name:    I 2 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type SBC-3
    Collection Date 2008-10-16
     
    Diffraction Radiation
    Monochromator double crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-BM
    Wavelength List 0.9792
    Site APS
    Beamline 19-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.87
    Resolution(Low) 32.02
    Number Reflections(All) 53170
    Number Reflections(Observed) 53170
    Percent Possible(Observed) 98.1
    R Merge I(Observed) 0.073
    B(Isotropic) From Wilson Plot 43.6
    Redundancy 7.7
     
    High Resolution Shell Details
    Resolution(High) 1.87
    Resolution(Low) 1.9
    Percent Possible(All) 91.0
    R Merge I(Observed) 0.815
    Mean I Over Sigma(Observed) 2.01
    Redundancy 6.3
    Number Unique Reflections(All) 2433
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.877
    Resolution(Low) 32.02
    Cut-off Sigma(I) 0.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 53155
    Number of Reflections(Observed) 53155
    Number of Reflections(R-Free) 2693
    Percent Reflections(Observed) 97.46
    R-Factor(All) 0.1942
    R-Factor(Observed) 0.1942
    R-Work 0.1919
    R-Free 0.2373
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 43.23
    Anisotropic B[1][1] 5.63
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -4.71
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.92
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.877
    Shell Resolution(Low) 1.926
    Number of Reflections(Observed) 3395
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 3243
    R-Factor(R-Work) 0.292
    R-Factor(R-Free) 0.31
    Percent Reflections(Observed) 85.17
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_gen_planes_other 0.001
    r_gen_planes_refined 0.009
    r_chiral_restr 0.111
    r_dihedral_angle_4_deg 19.745
    r_dihedral_angle_3_deg 15.273
    r_dihedral_angle_2_deg 33.809
    r_dihedral_angle_1_deg 5.908
    r_angle_other_deg 0.872
    r_angle_refined_deg 1.836
    r_bond_other_d 0.001
    r_bond_refined_d 0.018
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4307
    Nucleic Acid Atoms 0
    Heterogen Atoms 63
    Solvent Atoms 283
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBC-collect
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution MOLREP, HKL-3000
    Structure Refinement REFMAC 5.7.0029
     
    Software
    data extraction pdb_extract version: 3.11
    refinement REFMAC5 version: 5.7.0029
    data reduction HKL