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X-RAY DIFFRACTION
Materials and Methods page
4K3W
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 293.0
    Details Lithium Sulfate, Bis-Tris, PEG3350, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 232.35 α = 90
    b = 135.14 β = 99.09
    c = 43.04 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Details mirrors
    Collection Date 2013-04-03
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 0.9793
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.3
    Resolution(Low) 50
    Number Reflections(All) 57676
    Number Reflections(Observed) 57676
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.116
    B(Isotropic) From Wilson Plot 36.4
    Redundancy 7.5
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Resolution(Low) 2.38
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.793
    Redundancy 7.4
    Number Unique Reflections(All) 5805
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.31
    Resolution(Low) 44.24
    Number of Reflections(all) 57672
    Number of Reflections(Observed) 54747
    Number of Reflections(R-Free) 2925
    Percent Reflections(Observed) 99.75
    R-Factor(Observed) 0.19683
    R-Work 0.19517
    R-Free 0.22747
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 49.529
    Anisotropic B[1][1] -1.58
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.91
    Anisotropic B[2][2] -1.21
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 2.79
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.305
    Shell Resolution(Low) 2.365
    Number of Reflections(Observed) 4186
    Number of Reflections(R-Free) 199
    Number of Reflections(R-Work) 3987
    R-Factor(R-Work) 0.263
    R-Factor(R-Free) 0.321
    Percent Reflections(Observed) 97.24
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_gen_planes_other 0.001
    r_gen_planes_refined 0.005
    r_chiral_restr 0.083
    r_dihedral_angle_4_deg 17.635
    r_dihedral_angle_3_deg 16.281
    r_dihedral_angle_2_deg 37.261
    r_dihedral_angle_1_deg 5.834
    r_angle_other_deg 0.782
    r_angle_refined_deg 1.48
    r_bond_other_d 0.001
    r_bond_refined_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5905
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 82
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SHELXS
    Structure Refinement REFMAC 5.7.0032
     
    Software
    refinement REFMAC version: 5.7.0032
    model building SHELXS
    data collection CBASS