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X-RAY DIFFRACTION
Materials and Methods page
4K29
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8.5
    Temperature 293.0
    Details 0.8M Potassium Sodium Tartrate, 0.1M TRIS, 0.5% PEGMME 5000, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 115.05 α = 90
    b = 144.58 β = 90
    c = 129.57 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Details mirrors
    Collection Date 2013-04-03
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 0.9793
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.66
    Resolution(Low) 50
    Number Reflections(All) 126795
    Number Reflections(Observed) 126795
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.115
    B(Isotropic) From Wilson Plot 13.8
    Redundancy 13.9
     
    High Resolution Shell Details
    Resolution(High) 1.66
    Resolution(Low) 1.69
    Percent Possible(All) 98.0
    R Merge I(Observed) 0.26
    Redundancy 12.3
    Number Unique Reflections(All) 6165
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.66
    Resolution(Low) 44.49
    Number of Reflections(all) 126555
    Number of Reflections(Observed) 120222
    Number of Reflections(R-Free) 6351
    Percent Reflections(Observed) 99.63
    R-Factor(Observed) 0.18207
    R-Work 0.18122
    R-Free 0.19799
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 11.405
    Anisotropic B[1][1] 0.0
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.07
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.07
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.66
    Shell Resolution(Low) 1.703
    Number of Reflections(Observed) 9120
    Number of Reflections(R-Free) 424
    Number of Reflections(R-Work) 8696
    R-Factor(R-Work) 0.193
    R-Factor(R-Free) 0.211
    Percent Reflections(Observed) 98.04
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_gen_planes_other 0.001
    r_gen_planes_refined 0.004
    r_chiral_restr 0.061
    r_dihedral_angle_4_deg 16.6
    r_dihedral_angle_3_deg 11.927
    r_dihedral_angle_2_deg 27.091
    r_dihedral_angle_1_deg 5.198
    r_angle_other_deg 0.701
    r_angle_refined_deg 1.069
    r_bond_other_d 0.001
    r_bond_refined_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6097
    Nucleic Acid Atoms 0
    Heterogen Atoms 42
    Solvent Atoms 564
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SHELXS
    Structure Refinement REFMAC 5.7.0032
     
    Software
    refinement REFMAC version: 5.7.0032
    model building SHELXS
    data collection CBASS