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X-RAY DIFFRACTION
Materials and Methods page
4K27
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6
    Temperature 293.0
    Details 50 mM MES, pH 6.0, 100 mM ammonium acetate, 5 mM Mg sulfate, and 600 mM NaCl, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 75.08 α = 90
    b = 75.08 β = 90
    c = 59.9 γ = 90
     
    Space Group
    Space Group Name:    P 41 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2012-10-15
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL11-1
    Wavelength List 0.97856
    Site SSRL
    Beamline BL11-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.35
    Resolution(Low) 59.9
    Number Reflections(All) 7540
    Number Reflections(Observed) 7540
    Percent Possible(Observed) 100.0
     
    High Resolution Shell Details
    Resolution(High) 2.35
    Resolution(Low) 2.48
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.35
    Resolution(Low) 39.73
    Cut-off Sigma(F) 1.56
    Number of Reflections(Observed) 7497
    Number of Reflections(R-Free) 345
    Percent Reflections(Observed) 99.81
    R-Factor(Observed) 0.1961
    R-Work 0.194
    R-Free 0.2398
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3531
    Shell Resolution(Low) 2.9645
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3484
    R-Factor(R-Work) 0.275
    R-Factor(R-Free) 0.3117
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9645
    Shell Resolution(Low) 39.7357
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3668
    R-Factor(R-Work) 0.1693
    R-Factor(R-Free) 0.2128
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.045
    f_dihedral_angle_d 11.129
    f_angle_d 0.922
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 0
    Nucleic Acid Atoms 1164
    Heterogen Atoms 9
    Solvent Atoms 71
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Bluice
    Data Reduction (intensity integration) PROCESS
    Data Reduction (data scaling) SCALA
    Structure Solution PHASES
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHASES
    data collection Bluice