X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 4.5
Temperature 289.0
Details 2.0M Ammonium Sulfate, 0.1M Sodium Acetate:HCl, pH 4.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 87.16 α = 90
b = 87.16 β = 90
c = 75.54 γ = 120
Symmetry
Space Group P 61

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r Mirror 2013-01-21
Diffraction Radiation
Monochromator Protocol
Si 111 crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97899 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 28.6 99.9 0.07 -- -- 9.3 42889 42889 0.0 -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.6 1.63 100.0 0.633 -- 3.5 9.3 2121

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.601 28.529 -- 1.38 42851 42851 2160 99.75 0.1727 0.1727 0.1716 0.1946 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.6006 1.6378 -- 148 2636 0.2355 0.2693 -- 98.0
X Ray Diffraction 1.6378 1.6788 -- 156 2676 0.2188 0.2212 -- 100.0
X Ray Diffraction 1.6788 1.7241 -- 142 2718 0.2101 0.2636 -- 100.0
X Ray Diffraction 1.7241 1.7749 -- 149 2716 0.2035 0.1973 -- 100.0
X Ray Diffraction 1.7749 1.8322 -- 127 2705 0.1983 0.2376 -- 100.0
X Ray Diffraction 1.8322 1.8976 -- 167 2716 0.1923 0.1892 -- 100.0
X Ray Diffraction 1.8976 1.9736 -- 149 2679 0.1878 0.2202 -- 100.0
X Ray Diffraction 1.9736 2.0634 -- 126 2740 0.1853 0.1982 -- 100.0
X Ray Diffraction 2.0634 2.1721 -- 129 2729 0.1741 0.2454 -- 100.0
X Ray Diffraction 2.1721 2.3082 -- 129 2746 0.1752 0.2067 -- 100.0
X Ray Diffraction 2.3082 2.4863 -- 138 2715 0.1746 0.2112 -- 100.0
X Ray Diffraction 2.4863 2.7363 -- 156 2705 0.177 0.1994 -- 100.0
X Ray Diffraction 2.7363 3.1318 -- 165 2711 0.1785 0.1992 -- 100.0
X Ray Diffraction 3.1318 3.9441 -- 133 2761 0.1559 0.1737 -- 100.0
X Ray Diffraction 3.9441 28.5337 -- 146 2738 0.1482 0.1605 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.07
f_dihedral_angle_d 13.235
f_angle_d 1.07
f_bond_d 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2162
Nucleic Acid Atoms 0
Heterogen Atoms 36
Solvent Atoms 289

Software

Computing
Computing Package Purpose
SBC-Collect Data Collection
HKL-3000 Data Reduction (intensity integration)
HKL-3000 Data Reduction (data scaling)
SHELXD/MLPHARE/DM/ARP/wARP/HKL3000 Structure Solution
PHENIX (phenix.refine: 1.8.1_1168) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8.1_1168) refinement
SHELXD/MLPHARE/DM/ARP/wARP/HKL3000 model building
SBC-Collect data collection