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X-RAY DIFFRACTION
Materials and Methods page
4JWO
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 4.5
    Temperature 289.0
    Details 2.0M Ammonium Sulfate, 0.1M Sodium Acetate:HCl, pH 4.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 87.16 α = 90
    b = 87.16 β = 90
    c = 75.54 γ = 120
     
    Space Group
    Space Group Name:    P 61
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details Mirror
    Collection Date 2013-01-21
     
    Diffraction Radiation
    Monochromator Si 111 crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97899
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.6
    Resolution(Low) 28.6
    Number Reflections(All) 42889
    Number Reflections(Observed) 42889
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.07
    Redundancy 9.3
     
    High Resolution Shell Details
    Resolution(High) 1.6
    Resolution(Low) 1.63
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.633
    Mean I Over Sigma(Observed) 3.5
    Redundancy 9.3
    Number Unique Reflections(All) 2121
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.601
    Resolution(Low) 28.529
    Cut-off Sigma(F) 1.38
    Number of Reflections(all) 42851
    Number of Reflections(Observed) 42851
    Number of Reflections(R-Free) 2160
    Percent Reflections(Observed) 99.75
    R-Factor(All) 0.1727
    R-Factor(Observed) 0.1727
    R-Work 0.1716
    R-Free 0.1946
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6006
    Shell Resolution(Low) 1.6378
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2636
    R-Factor(R-Work) 0.2355
    R-Factor(R-Free) 0.2693
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6378
    Shell Resolution(Low) 1.6788
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2676
    R-Factor(R-Work) 0.2188
    R-Factor(R-Free) 0.2212
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6788
    Shell Resolution(Low) 1.7241
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2718
    R-Factor(R-Work) 0.2101
    R-Factor(R-Free) 0.2636
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7241
    Shell Resolution(Low) 1.7749
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2716
    R-Factor(R-Work) 0.2035
    R-Factor(R-Free) 0.1973
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7749
    Shell Resolution(Low) 1.8322
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2705
    R-Factor(R-Work) 0.1983
    R-Factor(R-Free) 0.2376
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8322
    Shell Resolution(Low) 1.8976
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 2716
    R-Factor(R-Work) 0.1923
    R-Factor(R-Free) 0.1892
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8976
    Shell Resolution(Low) 1.9736
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2679
    R-Factor(R-Work) 0.1878
    R-Factor(R-Free) 0.2202
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9736
    Shell Resolution(Low) 2.0634
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2740
    R-Factor(R-Work) 0.1853
    R-Factor(R-Free) 0.1982
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0634
    Shell Resolution(Low) 2.1721
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2729
    R-Factor(R-Work) 0.1741
    R-Factor(R-Free) 0.2454
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1721
    Shell Resolution(Low) 2.3082
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2746
    R-Factor(R-Work) 0.1752
    R-Factor(R-Free) 0.2067
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3082
    Shell Resolution(Low) 2.4863
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2715
    R-Factor(R-Work) 0.1746
    R-Factor(R-Free) 0.2112
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4863
    Shell Resolution(Low) 2.7363
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2705
    R-Factor(R-Work) 0.177
    R-Factor(R-Free) 0.1994
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7363
    Shell Resolution(Low) 3.1318
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2711
    R-Factor(R-Work) 0.1785
    R-Factor(R-Free) 0.1992
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1318
    Shell Resolution(Low) 3.9441
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2761
    R-Factor(R-Work) 0.1559
    R-Factor(R-Free) 0.1737
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9441
    Shell Resolution(Low) 28.5337
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2738
    R-Factor(R-Work) 0.1482
    R-Factor(R-Free) 0.1605
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.07
    f_dihedral_angle_d 13.235
    f_angle_d 1.07
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2162
    Nucleic Acid Atoms 0
    Heterogen Atoms 36
    Solvent Atoms 289
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBC-Collect
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution SHELXD/MLPHARE/DM/ARP/wARP/HKL3000
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building SHELXD/MLPHARE/DM/ARP/wARP/HKL3000
    data collection SBC-Collect