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X-RAY DIFFRACTION
Materials and Methods page
4JWN
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 291.0
    Details 50 mM Imidazole, 350 mM Sodium Acetate, 18 % PEG3350, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 50.43 α = 90
    b = 79.52 β = 107.23
    c = 55.34 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 200
     
    Diffraction Detector
    Detector CCD
    Type RIGAKU SATURN 92
    Details Viramax
    Collection Date 2007-05-22
     
    Diffraction Radiation
    Monochromator Viramax
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.39
    Resolution(Low) 50
    Number Reflections(Observed) 15235
    Percent Possible(Observed) 99.0
    Redundancy 3.3
     
    High Resolution Shell Details
    Resolution(High) 2.39
    Resolution(Low) 2.49
    Percent Possible(All) 91.3
    R Merge I(Observed) 0.44
    Mean I Over Sigma(Observed) 2.07
    Redundancy 2.7
    Number Unique Reflections(All) 1509
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.39
    Resolution(Low) 29.003
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 16387
    Number of Reflections(Observed) 15133
    Number of Reflections(R-Free) 1512
    Percent Reflections(Observed) 91.71
    R-Factor(Observed) 0.1838
    R-Work 0.1765
    R-Free 0.2508
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Isotropic Thermal Model Restarained
    Anisotropic B[1][1] 6.7093
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 3.8214
    Anisotropic B[2][2] -3.4967
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -3.2126
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.39
    Shell Resolution(Low) 2.4674
    Number of Reflections(R-Free) 105
    Number of Reflections(R-Work) 936
    R-Factor(R-Work) 0.2617
    R-Factor(R-Free) 0.3387
    Percent Reflections(Observed) 70.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4674
    Shell Resolution(Low) 2.5555
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 1154
    R-Factor(R-Work) 0.2436
    R-Factor(R-Free) 0.3038
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5555
    Shell Resolution(Low) 2.6578
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 1207
    R-Factor(R-Work) 0.2336
    R-Factor(R-Free) 0.3382
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6578
    Shell Resolution(Low) 2.7786
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 1190
    R-Factor(R-Work) 0.212
    R-Factor(R-Free) 0.2842
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7786
    Shell Resolution(Low) 2.925
    Number of Reflections(R-Free) 112
    Number of Reflections(R-Work) 1246
    R-Factor(R-Work) 0.2025
    R-Factor(R-Free) 0.3067
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.925
    Shell Resolution(Low) 3.1081
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1260
    R-Factor(R-Work) 0.192
    R-Factor(R-Free) 0.266
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1081
    Shell Resolution(Low) 3.3477
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1344
    R-Factor(R-Work) 0.1785
    R-Factor(R-Free) 0.2588
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3477
    Shell Resolution(Low) 3.684
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 1329
    R-Factor(R-Work) 0.1793
    R-Factor(R-Free) 0.2449
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.684
    Shell Resolution(Low) 4.2157
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 1319
    R-Factor(R-Work) 0.1399
    R-Factor(R-Free) 0.2205
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2157
    Shell Resolution(Low) 5.306
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 1343
    R-Factor(R-Work) 0.1383
    R-Factor(R-Free) 0.2244
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.306
    Shell Resolution(Low) 29.0049
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1395
    R-Factor(R-Work) 0.1666
    R-Factor(R-Free) 0.2145
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.064
    f_dihedral_angle_d 20.236
    f_angle_d 1.532
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2609
    Nucleic Acid Atoms 631
    Heterogen Atoms 35
    Solvent Atoms 201
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution CNS
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building CNS
    data collection HKL-2000