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X-RAY DIFFRACTION
Materials and Methods page
4JVP
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8
    Temperature 293.0
    Details 2005mM LiSO4 , pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 52.81 α = 90
    b = 52.81 β = 90
    c = 182.47 γ = 120
     
    Space Group
    Space Group Name:    P 65
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 110
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2012-02-28
     
    Diffraction Radiation
    Monochromator LN2 cooled Fixed-exit Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06SA
    Wavelength List 1.00000
    Site SLS
    Beamline X06SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.76
    Resolution(Low) 50
    Number Reflections(All) 28387
    Number Reflections(Observed) 26939
    Percent Possible(Observed) 94.7
    R Merge I(Observed) 0.103
    B(Isotropic) From Wilson Plot 23.89
    Redundancy 5.0
     
    High Resolution Shell Details
    Resolution(High) 1.76
    Resolution(Low) 1.86
    Percent Possible(All) 69.5
    R Merge I(Observed) 0.266
    Mean I Over Sigma(Observed) 1.6
    Redundancy 1.7
    Number Unique Reflections(All) 4095
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.76
    Resolution(Low) 44.36
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 28367
    Number of Reflections(Observed) 26863
    Number of Reflections(R-Free) 1371
    Percent Reflections(Observed) 94.61
    R-Factor(Observed) 0.1834
    R-Work 0.1823
    R-Free 0.2042
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 35.55
    Anisotropic B[1][1] -1.4926
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.4926
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 2.9851
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.76
    Shell Resolution(Low) 1.83
    Number of Reflections(R-Free) 84
    Number of Reflections(R-Work) 2063
    R-Factor(R-Work) 0.2022
    R-Factor(R-Free) 0.2271
    Percent Reflections(Observed) 94.61
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    t_bond_d 0.01
    t_angle_deg 1.14
    t_omega_torsion 3.89
    t_other_torsion 18.02
     
    Coordinate Error
    Luzzati ESD(Observed) 0.215
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1945
    Nucleic Acid Atoms 0
    Heterogen Atoms 50
    Solvent Atoms 132
     
     
  •   Software and Computing Hide
    Computing
    Data Collection XDS
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement BUSTER 2.9.2
     
    Software
    refinement BUSTER version: 2.9.2
    model building PHASER
    data collection XDS