X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8
Temperature 293.0
Details 2005mM LiSO4 , pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 52.81 α = 90
b = 52.81 β = 90
c = 182.47 γ = 120
Symmetry
Space Group P 65

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 110
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 6M -- 2012-02-28
Diffraction Radiation
Monochromator Protocol
LN2 cooled Fixed-exit Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 1.00000 SLS X06SA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.76 50 94.7 0.103 -- -- 5.0 28387 26939 0.0 -3.0 23.89
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.76 1.86 69.5 0.266 -- 1.6 1.7 4095

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.76 44.36 -- 0.0 28367 26863 1371 94.61 -- 0.1834 0.1823 0.2042 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.76 1.83 -- 84 2063 0.2022 0.2271 -- 94.61
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 35.55
Anisotropic B[1][1] -1.4926
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -1.4926
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 2.9851
RMS Deviations
Key Refinement Restraint Deviation
t_bond_d 0.01
t_angle_deg 1.14
t_omega_torsion 3.89
t_other_torsion 18.02
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.215
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1945
Nucleic Acid Atoms 0
Heterogen Atoms 50
Solvent Atoms 132

Software

Computing
Computing Package Purpose
XDS Data Collection
XDS Data Reduction (intensity integration)
SCALA Data Reduction (data scaling)
PHASER Structure Solution
BUSTER 2.9.2 Structure Refinement
Software
Software Name Purpose
BUSTER version: 2.9.2 refinement
PHASER model building
XDS data collection