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X-RAY DIFFRACTION
Materials and Methods page
4JV2
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.4
    Temperature 298.0
    Details 50 MM TRIS HCL, 15% PEG3350, 100MM CALCIUM DIACETATE, 2.5% GLYCEROL, pH 7.4, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 94.58 α = 90
    b = 103.31 β = 90
    c = 52.78 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2009-10-15
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 21-ID-F
    Wavelength 0.979
    Wavelength List 1.0
    Site APS
    Beamline 21-ID-F
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.74
    Resolution(Low) 50
    Number Reflections(Observed) 14000
    R Merge I(Observed) 0.088
     
    High Resolution Shell Details
    Resolution(High) 2.75
    Resolution(Low) 2.85
    R Merge I(Observed) 0.644
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.74
    Resolution(Low) 42.09
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 14000
    Number of Reflections(R-Free) 1401
    Percent Reflections(Observed) 99.0
    R-Factor(Observed) 0.209
    R-Work 0.203
    R-Free 0.265
     
    Temperature Factor Modeling
    Mean Isotropic B Value 56.1056
    Anisotropic B[1][1] 5.6627
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.1584
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -4.5043
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7424
    Shell Resolution(Low) 2.8404
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 1139
    R-Factor(R-Work) 0.4036
    R-Factor(R-Free) 0.4511
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8404
    Shell Resolution(Low) 2.9541
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1245
    R-Factor(R-Work) 0.3252
    R-Factor(R-Free) 0.4116
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9541
    Shell Resolution(Low) 3.0885
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1239
    R-Factor(R-Work) 0.2709
    R-Factor(R-Free) 0.3328
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0885
    Shell Resolution(Low) 3.2513
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1258
    R-Factor(R-Work) 0.2213
    R-Factor(R-Free) 0.2966
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2513
    Shell Resolution(Low) 3.4549
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1236
    R-Factor(R-Work) 0.2069
    R-Factor(R-Free) 0.2929
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4549
    Shell Resolution(Low) 3.7216
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1273
    R-Factor(R-Work) 0.1977
    R-Factor(R-Free) 0.248
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7216
    Shell Resolution(Low) 4.0958
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1265
    R-Factor(R-Work) 0.1926
    R-Factor(R-Free) 0.2587
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0958
    Shell Resolution(Low) 4.6878
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1276
    R-Factor(R-Work) 0.1488
    R-Factor(R-Free) 0.2097
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6878
    Shell Resolution(Low) 5.9035
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1304
    R-Factor(R-Work) 0.1836
    R-Factor(R-Free) 0.2541
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9035
    Shell Resolution(Low) 42.0951
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 1364
    R-Factor(R-Work) 0.1954
    R-Factor(R-Free) 0.2298
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_angle_d 1.3
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2744
    Nucleic Acid Atoms 576
    Heterogen Atoms 32
    Solvent Atoms 40
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution CNS
    Structure Refinement PHENIX (PHENIX.REFINE: 1.7.2_869)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix