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X-RAY DIFFRACTION
Materials and Methods page
4JUZ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.4
    Temperature 298.0
    Details 50 MM TRIS HCL, 15% PEG3350, 100MM CALCIUM DIACETATE, 2.5% GLYCEROL, pH 7.4, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 94.91 α = 90
    b = 104.36 β = 90
    c = 52.49 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 21-ID-F
    Wavelength 0.979
    Site APS
    Beamline 21-ID-F
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.65
    Resolution(Low) 50
    Number Reflections(Observed) 15480
    R Merge I(Observed) 0.073
     
    High Resolution Shell Details
    Resolution(High) 2.65
    Resolution(Low) 2.74
    R Merge I(Observed) 0.545
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.65
    Resolution(Low) 42.04
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 15480
    Number of Reflections(R-Free) 1547
    Percent Reflections(Observed) 98.6
    R-Factor(Observed) 0.21
    R-Work 0.204
    R-Free 0.269
     
    Temperature Factor Modeling
    Mean Isotropic B Value 57.4536
    Anisotropic B[1][1] 9.775
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.2969
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -9.4782
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6527
    Shell Resolution(Low) 2.7383
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 1113
    R-Factor(R-Work) 0.3453
    R-Factor(R-Free) 0.45
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7383
    Shell Resolution(Low) 2.8361
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1233
    R-Factor(R-Work) 0.3423
    R-Factor(R-Free) 0.4225
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8361
    Shell Resolution(Low) 2.9496
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1243
    R-Factor(R-Work) 0.3058
    R-Factor(R-Free) 0.396
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9496
    Shell Resolution(Low) 3.0839
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1282
    R-Factor(R-Work) 0.2644
    R-Factor(R-Free) 0.366
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0839
    Shell Resolution(Low) 3.2464
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1248
    R-Factor(R-Work) 0.2241
    R-Factor(R-Free) 0.3059
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2464
    Shell Resolution(Low) 3.4497
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1275
    R-Factor(R-Work) 0.2161
    R-Factor(R-Free) 0.2783
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4497
    Shell Resolution(Low) 3.7159
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1284
    R-Factor(R-Work) 0.2098
    R-Factor(R-Free) 0.2727
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7159
    Shell Resolution(Low) 4.0896
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1275
    R-Factor(R-Work) 0.1892
    R-Factor(R-Free) 0.2386
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0896
    Shell Resolution(Low) 4.6807
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1295
    R-Factor(R-Work) 0.1464
    R-Factor(R-Free) 0.2335
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6807
    Shell Resolution(Low) 5.8946
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1318
    R-Factor(R-Work) 0.175
    R-Factor(R-Free) 0.2205
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8946
    Shell Resolution(Low) 42.0455
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 1367
    R-Factor(R-Work) 0.1927
    R-Factor(R-Free) 0.2404
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_angle_d 1.3
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2744
    Nucleic Acid Atoms 594
    Heterogen Atoms 33
    Solvent Atoms 40
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution CNS
    Structure Refinement PHENIX (PHENIX.REFINE: 1.7.2_869)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix