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X-RAY DIFFRACTION
Materials and Methods page
4JUI
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 5.5
    Temperature 281.0
    Details 20% (w/v) PEG 3000, 0.1M tri-sodium citrate pH 5.5, VAPOR DIFFUSION, temperature 281K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 47.21 α = 70.66
    b = 62.94 β = 85.49
    c = 84.41 γ = 79.51
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type AUSTRALIAN SYNCHROTRON BEAMLINE MX2
    Site AUSTRALIAN SYNCHROTRON
    Beamline MX2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.7
    Resolution(Low) 65
    Number Reflections(All) 99532
    Number Reflections(Observed) 90575
    Percent Possible(Observed) 91.0
    R Merge I(Observed) 0.051
    Redundancy 6.5
     
    High Resolution Shell Details
    Resolution(High) 1.7
    Resolution(Low) 1.79
    Percent Possible(All) 83.2
    R Merge I(Observed) 0.305
    Mean I Over Sigma(Observed) 4.9
    Redundancy 5.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method FOURIER SYNTHESIS
    reflnsShellList 1.7
    Resolution(Low) 19.523
    Cut-off Sigma(F) 1.97
    Number of Reflections(all) 99532
    Number of Reflections(Observed) 90551
    Number of Reflections(R-Free) 1530
    Percent Reflections(Observed) 91.37
    R-Factor(All) 0.1533
    R-Factor(Observed) 0.1533
    R-Work 0.1528
    R-Free 0.1796
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 20.8356
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7
    Shell Resolution(Low) 1.7548
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 7338
    R-Factor(R-Work) 0.1904
    R-Factor(R-Free) 0.2529
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7548
    Shell Resolution(Low) 1.8175
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 7497
    R-Factor(R-Work) 0.1851
    R-Factor(R-Free) 0.2185
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8175
    Shell Resolution(Low) 1.8902
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 7609
    R-Factor(R-Work) 0.1754
    R-Factor(R-Free) 0.2479
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8902
    Shell Resolution(Low) 1.9762
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 7855
    R-Factor(R-Work) 0.1723
    R-Factor(R-Free) 0.2022
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9762
    Shell Resolution(Low) 2.0803
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 7958
    R-Factor(R-Work) 0.1583
    R-Factor(R-Free) 0.1976
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0803
    Shell Resolution(Low) 2.2104
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 8120
    R-Factor(R-Work) 0.152
    R-Factor(R-Free) 0.2092
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2104
    Shell Resolution(Low) 2.3808
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 8309
    R-Factor(R-Work) 0.1542
    R-Factor(R-Free) 0.1411
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3808
    Shell Resolution(Low) 2.6199
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 8443
    R-Factor(R-Work) 0.155
    R-Factor(R-Free) 0.1909
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6199
    Shell Resolution(Low) 2.9978
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 8525
    R-Factor(R-Work) 0.16
    R-Factor(R-Free) 0.2296
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9978
    Shell Resolution(Low) 3.7725
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 8665
    R-Factor(R-Work) 0.1426
    R-Factor(R-Free) 0.161
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7725
    Shell Resolution(Low) 19.5241
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 8702
    R-Factor(R-Work) 0.1346
    R-Factor(R-Free) 0.1341
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.071
    f_dihedral_angle_d 14.313
    f_angle_d 1.058
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7172
    Nucleic Acid Atoms 0
    Heterogen Atoms 117
    Solvent Atoms 1132
     
     
  •   Software and Computing Hide
    Computing
    Data Collection blueice
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHENIX
    data collection blueice