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X-RAY DIFFRACTION
Materials and Methods page
4JSY
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.6
    Temperature 298.0
    Details 100mM sodium citrate, 5mM DTT, 100mM MgCl2, 16-18% PEG 3350, 2mM GTP, pH 5.6, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 45.31 α = 90
    b = 66.78 β = 90
    c = 119.55 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 130
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2012-09-26
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength List 1.1
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -999.0
    Observed Criterion Sigma(I) -999.0
    Resolution(High) 2.14
    Resolution(Low) 39.6
    Number Reflections(All) 20889
    Number Reflections(Observed) 20889
    Percent Possible(Observed) 100.0
     
    High Resolution Shell Details
    Resolution(High) 2.14
    Resolution(Low) 2.26
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method Direct refinement
    reflnsShellList 2.14
    Resolution(Low) 37.492
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 20871
    Number of Reflections(Observed) 20830
    Number of Reflections(R-Free) 1642
    Percent Reflections(Observed) 98.32
    R-Factor(Observed) 0.1705
    R-Work 0.1675
    R-Free 0.2046
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.14
    Shell Resolution(Low) 2.1855
    Number of Reflections(R-Free) 104
    Number of Reflections(R-Work) 1270
    R-Factor(R-Work) 0.1648
    R-Factor(R-Free) 0.1976
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1855
    Shell Resolution(Low) 2.256
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1608
    R-Factor(R-Work) 0.1609
    R-Factor(R-Free) 0.2229
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.256
    Shell Resolution(Low) 2.3367
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1574
    R-Factor(R-Work) 0.1636
    R-Factor(R-Free) 0.2234
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3367
    Shell Resolution(Low) 2.4302
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1594
    R-Factor(R-Work) 0.1755
    R-Factor(R-Free) 0.25
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4302
    Shell Resolution(Low) 2.5408
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1615
    R-Factor(R-Work) 0.172
    R-Factor(R-Free) 0.2273
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5408
    Shell Resolution(Low) 2.6747
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1624
    R-Factor(R-Work) 0.1853
    R-Factor(R-Free) 0.2263
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6747
    Shell Resolution(Low) 2.8422
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1601
    R-Factor(R-Work) 0.1761
    R-Factor(R-Free) 0.2253
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8422
    Shell Resolution(Low) 3.0616
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1615
    R-Factor(R-Work) 0.1885
    R-Factor(R-Free) 0.2082
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0616
    Shell Resolution(Low) 3.3695
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1624
    R-Factor(R-Work) 0.1798
    R-Factor(R-Free) 0.2263
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3695
    Shell Resolution(Low) 3.8567
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1649
    R-Factor(R-Work) 0.1656
    R-Factor(R-Free) 0.1843
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8567
    Shell Resolution(Low) 4.8573
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1652
    R-Factor(R-Work) 0.143
    R-Factor(R-Free) 0.1712
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8573
    Shell Resolution(Low) 37.498
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 1762
    R-Factor(R-Work) 0.165
    R-Factor(R-Free) 0.1921
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.059
    f_dihedral_angle_d 15.563
    f_angle_d 0.996
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2734
    Nucleic Acid Atoms 0
    Heterogen Atoms 66
    Solvent Atoms 180
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHENIX
    data collection CBASS