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X-RAY DIFFRACTION
Materials and Methods page
4JNO
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 290.0
    Details 20% PEG 8000, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 290K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 64.95 α = 90
    b = 76.03 β = 96.93
    c = 81.43 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 93
     
    Diffraction Detector
    Detector CCD
    Type NOIR-1
    Collection Date 2011-07-05
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 4.2.2
    Wavelength List 0.979
    Site ALS
    Beamline 4.2.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 3
    Resolution(Low) 29.72
    Number Reflections(Observed) 15336
    Percent Possible(Observed) 96.2
     
    High Resolution Shell Details
    Resolution(High) 3.0
    Resolution(Low) 3.09
    Percent Possible(All) 97.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.0
    Resolution(Low) 20.0
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 15336
    Number of Reflections(R-Free) 769
    Percent Reflections(Observed) 96.27
    R-Factor(Observed) 0.2201
    R-Work 0.2182
    R-Free 0.2548
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0
    Shell Resolution(Low) 3.2314
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2952
    R-Factor(R-Work) 0.3124
    R-Factor(R-Free) 0.3702
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2314
    Shell Resolution(Low) 3.5561
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 2901
    R-Factor(R-Work) 0.2672
    R-Factor(R-Free) 0.2979
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5561
    Shell Resolution(Low) 4.0696
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2916
    R-Factor(R-Work) 0.2119
    R-Factor(R-Free) 0.2561
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0696
    Shell Resolution(Low) 5.123
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2911
    R-Factor(R-Work) 0.1919
    R-Factor(R-Free) 0.2342
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.123
    Shell Resolution(Low) 29.7255
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2887
    R-Factor(R-Work) 0.1962
    R-Factor(R-Free) 0.2214
    Percent Reflections(Observed) 94.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.001
    f_chiral_restr 0.03
    f_dihedral_angle_d 10.284
    f_angle_d 0.437
    f_bond_d 0.001
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4895
    Nucleic Acid Atoms 0
    Heterogen Atoms 42
    Solvent Atoms 22
     
     
  •   Software and Computing Hide
    Computing
    Data Collection BlueIce
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building Phaser
    data collection BlueIce