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X-RAY DIFFRACTION
Materials and Methods page
4JLZ
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 80.56 α = 90
    b = 97.69 β = 90
    c = 106.96 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type PSI PILATUS 6M
    Collection Date 2012-09-18
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06SA
    Wavelength List 0.97934
    Site SLS
    Beamline X06SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.27
    Resolution(Low) 46.9
    Number Reflections(Observed) 72224
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.27
    Resolution(Low) 44.556
    Cut-off Sigma(F) 1.18
    Number of Reflections(Observed) 72224
    Number of Reflections(R-Free) 3594
    Percent Reflections(Observed) 95.87
    R-Factor(Observed) 0.1736
    R-Work 0.1719
    R-Free 0.2066
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.27
    Shell Resolution(Low) 2.2996
    Number of Reflections(R-Free) 112
    Number of Reflections(R-Work) 2194
    R-Factor(R-Work) 0.2935
    R-Factor(R-Free) 0.3061
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2996
    Shell Resolution(Low) 2.3311
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2666
    R-Factor(R-Work) 0.263
    R-Factor(R-Free) 0.3124
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3311
    Shell Resolution(Low) 2.3644
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2652
    R-Factor(R-Work) 0.2492
    R-Factor(R-Free) 0.3094
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3644
    Shell Resolution(Low) 2.3997
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.2388
    R-Factor(R-Free) 0.2851
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3997
    Shell Resolution(Low) 2.4372
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2756
    R-Factor(R-Work) 0.2334
    R-Factor(R-Free) 0.2857
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4372
    Shell Resolution(Low) 2.4771
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.23
    R-Factor(R-Free) 0.2884
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4771
    Shell Resolution(Low) 2.5198
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2670
    R-Factor(R-Work) 0.2283
    R-Factor(R-Free) 0.3134
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5198
    Shell Resolution(Low) 2.5656
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2694
    R-Factor(R-Work) 0.2138
    R-Factor(R-Free) 0.2804
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5656
    Shell Resolution(Low) 2.615
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.2088
    R-Factor(R-Free) 0.2306
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.615
    Shell Resolution(Low) 2.6684
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2641
    R-Factor(R-Work) 0.2046
    R-Factor(R-Free) 0.2486
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6684
    Shell Resolution(Low) 2.7264
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2652
    R-Factor(R-Work) 0.1922
    R-Factor(R-Free) 0.2205
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7264
    Shell Resolution(Low) 2.7898
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2666
    R-Factor(R-Work) 0.1951
    R-Factor(R-Free) 0.2674
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7898
    Shell Resolution(Low) 2.8595
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2676
    R-Factor(R-Work) 0.1806
    R-Factor(R-Free) 0.1936
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8595
    Shell Resolution(Low) 2.9368
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.1876
    R-Factor(R-Free) 0.2302
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9368
    Shell Resolution(Low) 3.0232
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2712
    R-Factor(R-Work) 0.1806
    R-Factor(R-Free) 0.2123
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0232
    Shell Resolution(Low) 3.1208
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.1767
    R-Factor(R-Free) 0.2236
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1208
    Shell Resolution(Low) 3.2323
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2696
    R-Factor(R-Work) 0.1721
    R-Factor(R-Free) 0.2082
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2323
    Shell Resolution(Low) 3.3617
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2661
    R-Factor(R-Work) 0.1613
    R-Factor(R-Free) 0.2292
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3617
    Shell Resolution(Low) 3.5146
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2631
    R-Factor(R-Work) 0.1663
    R-Factor(R-Free) 0.1907
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5146
    Shell Resolution(Low) 3.6998
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2507
    R-Factor(R-Work) 0.1615
    R-Factor(R-Free) 0.2046
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6998
    Shell Resolution(Low) 3.9315
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2597
    R-Factor(R-Work) 0.1456
    R-Factor(R-Free) 0.1592
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9315
    Shell Resolution(Low) 4.2349
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2615
    R-Factor(R-Work) 0.1437
    R-Factor(R-Free) 0.1974
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2349
    Shell Resolution(Low) 4.6606
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.1302
    R-Factor(R-Free) 0.1672
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6606
    Shell Resolution(Low) 5.3341
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2594
    R-Factor(R-Work) 0.1322
    R-Factor(R-Free) 0.1572
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3341
    Shell Resolution(Low) 6.7166
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2630
    R-Factor(R-Work) 0.1835
    R-Factor(R-Free) 0.1749
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.7166
    Shell Resolution(Low) 44.5641
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2628
    R-Factor(R-Work) 0.1678
    R-Factor(R-Free) 0.1967
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.079
    f_dihedral_angle_d 15.489
    f_angle_d 1.239
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5878
    Nucleic Acid Atoms 0
    Heterogen Atoms 62
    Solvent Atoms 275
     
     
  •   Software and Computing Hide
    Computing
    Structure Refinement PHENIX (phenix.refine: 1.8.2_1309)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)