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X-RAY DIFFRACTION
Materials and Methods page
4JLX
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 47.4 α = 90
    b = 118.01 β = 90
    c = 142.6 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type PSI PILATUS 6M
    Collection Date 2012-03-27
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06SA
    Wavelength List 1.00665
    Site SLS
    Beamline X06SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2
    Resolution(Low) 47.5
    Number Reflections(Observed) 51611
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.004
    Resolution(Low) 45.458
    Cut-off Sigma(F) 0.9
    Number of Reflections(Observed) 51611
    Number of Reflections(R-Free) 2578
    Percent Reflections(Observed) 99.36
    R-Factor(Observed) 0.1894
    R-Work 0.188
    R-Free 0.2147
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.004
    Shell Resolution(Low) 2.0422
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2576
    R-Factor(R-Work) 0.2831
    R-Factor(R-Free) 0.2916
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0422
    Shell Resolution(Low) 2.0838
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2692
    R-Factor(R-Work) 0.2568
    R-Factor(R-Free) 0.2787
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0838
    Shell Resolution(Low) 2.1292
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2743
    R-Factor(R-Work) 0.2507
    R-Factor(R-Free) 0.2888
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1292
    Shell Resolution(Low) 2.1787
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2726
    R-Factor(R-Work) 0.2234
    R-Factor(R-Free) 0.2646
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1787
    Shell Resolution(Low) 2.2332
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2747
    R-Factor(R-Work) 0.2221
    R-Factor(R-Free) 0.2721
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2332
    Shell Resolution(Low) 2.2935
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2725
    R-Factor(R-Work) 0.2199
    R-Factor(R-Free) 0.2725
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2935
    Shell Resolution(Low) 2.361
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2770
    R-Factor(R-Work) 0.2124
    R-Factor(R-Free) 0.2785
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.361
    Shell Resolution(Low) 2.4372
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2721
    R-Factor(R-Work) 0.2125
    R-Factor(R-Free) 0.2238
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4372
    Shell Resolution(Low) 2.5243
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2708
    R-Factor(R-Work) 0.2046
    R-Factor(R-Free) 0.2761
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5243
    Shell Resolution(Low) 2.6254
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2762
    R-Factor(R-Work) 0.2058
    R-Factor(R-Free) 0.2737
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6254
    Shell Resolution(Low) 2.7449
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2712
    R-Factor(R-Work) 0.2047
    R-Factor(R-Free) 0.22
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7449
    Shell Resolution(Low) 2.8896
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2768
    R-Factor(R-Work) 0.1922
    R-Factor(R-Free) 0.1816
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8896
    Shell Resolution(Low) 3.0706
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2696
    R-Factor(R-Work) 0.1852
    R-Factor(R-Free) 0.229
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0706
    Shell Resolution(Low) 3.3076
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2759
    R-Factor(R-Work) 0.18
    R-Factor(R-Free) 0.2113
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3076
    Shell Resolution(Low) 3.6403
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2732
    R-Factor(R-Work) 0.1721
    R-Factor(R-Free) 0.1799
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6403
    Shell Resolution(Low) 4.1668
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2717
    R-Factor(R-Work) 0.1643
    R-Factor(R-Free) 0.1778
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1668
    Shell Resolution(Low) 5.2484
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2746
    R-Factor(R-Work) 0.1622
    R-Factor(R-Free) 0.1935
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2484
    Shell Resolution(Low) 45.4702
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2733
    R-Factor(R-Work) 0.1865
    R-Factor(R-Free) 0.2098
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.076
    f_dihedral_angle_d 16.8
    f_angle_d 1.066
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2859
    Nucleic Acid Atoms 0
    Heterogen Atoms 54
    Solvent Atoms 126
     
     
  •   Software and Computing Hide
    Computing
    Structure Refinement PHENIX (phenix.refine: 1.8.2_1309)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)