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X-RAY DIFFRACTION
Materials and Methods page
4JL3
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8
    Temperature 277.0
    Details 10% PEG3000, 100mM imidazole, 200mM lithium sulfate, pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 100.95 α = 90
    b = 100.95 β = 90
    c = 99.86 γ = 120
     
    Space Group
    Space Group Name:    P 31
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2012-08-10
     
    Diffraction Radiation
    Monochromator double crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.9792
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.5
    Resolution(Low) 50
    Number Reflections(All) 39254
    Number Reflections(Observed) 39254
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.112
    Redundancy 6.3
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.54
    Percent Possible(All) 95.1
    R Merge I(Observed) 0.61
    Mean I Over Sigma(Observed) 2.37
    Redundancy 5.3
    Number Unique Reflections(All) 1887
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.5
    Resolution(Low) 35.497
    Cut-off Sigma(F) 1.96
    Number of Reflections(all) 39254
    Number of Reflections(Observed) 38813
    Number of Reflections(R-Free) 1948
    Percent Reflections(Observed) 98.57
    R-Factor(Observed) 0.2241
    R-Work 0.2241
    R-Free 0.2797
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -12.1068
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -12.1068
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 24.2137
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5
    Shell Resolution(Low) 2.5626
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2417
    R-Factor(R-Work) 0.3729
    R-Factor(R-Free) 0.4476
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5626
    Shell Resolution(Low) 2.6319
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2571
    R-Factor(R-Work) 0.3673
    R-Factor(R-Free) 0.445
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6319
    Shell Resolution(Low) 2.7093
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2662
    R-Factor(R-Work) 0.3602
    R-Factor(R-Free) 0.4557
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7093
    Shell Resolution(Low) 2.7967
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.3177
    R-Factor(R-Free) 0.3871
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7967
    Shell Resolution(Low) 2.8966
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.3163
    R-Factor(R-Free) 0.3616
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8966
    Shell Resolution(Low) 3.0125
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2639
    R-Factor(R-Work) 0.2956
    R-Factor(R-Free) 0.3902
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0125
    Shell Resolution(Low) 3.1496
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.2623
    R-Factor(R-Free) 0.3656
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1496
    Shell Resolution(Low) 3.3155
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2639
    R-Factor(R-Work) 0.2315
    R-Factor(R-Free) 0.2862
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3155
    Shell Resolution(Low) 3.5231
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2654
    R-Factor(R-Work) 0.2194
    R-Factor(R-Free) 0.2797
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5231
    Shell Resolution(Low) 3.7948
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2664
    R-Factor(R-Work) 0.2463
    R-Factor(R-Free) 0.3061
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7948
    Shell Resolution(Low) 4.1761
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.1937
    R-Factor(R-Free) 0.2498
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1761
    Shell Resolution(Low) 4.7792
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2655
    R-Factor(R-Work) 0.1712
    R-Factor(R-Free) 0.2228
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7792
    Shell Resolution(Low) 6.0165
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2637
    R-Factor(R-Work) 0.1962
    R-Factor(R-Free) 0.2675
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0165
    Shell Resolution(Low) 35.5005
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2660
    R-Factor(R-Work) 0.1766
    R-Factor(R-Free) 0.2066
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.083
    f_dihedral_angle_d 21.655
    f_angle_d 1.317
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5506
    Nucleic Acid Atoms 1271
    Heterogen Atoms 0
    Solvent Atoms 65
     
     
  •   Software and Computing Hide
    Computing
    Data Collection bluice
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SOLVE
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building SOLVE
    data collection bluice