POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4JJT
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7
    Temperature 297.0
    Details 0.1M sodium citrate, 20% (w/v) PEG4000, 5% (v/v) 2-propanol, pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 297K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 130.32 α = 90
    b = 86.87 β = 126.02
    c = 80.96 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirror
    Collection Date 2013-02-04
     
    Diffraction Radiation
    Monochromator Si 111 crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97929
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.5
    Resolution(Low) 40.5
    Number Reflections(All) 24439
    Number Reflections(Observed) 24439
    Percent Possible(Observed) 96.0
    R Merge I(Observed) 0.118
    Redundancy 2.7
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.54
    Percent Possible(All) 99.4
    R Merge I(Observed) 0.563
    Mean I Over Sigma(Observed) 3.1
    Redundancy 2.7
    Number Unique Reflections(All) 1248
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.496
    Resolution(Low) 40.445
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 24425
    Number of Reflections(Observed) 24425
    Number of Reflections(R-Free) 1238
    Percent Reflections(Observed) 95.66
    R-Factor(Observed) 0.1823
    R-Work 0.1799
    R-Free 0.2267
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4957
    Shell Resolution(Low) 2.5956
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2595
    R-Factor(R-Work) 0.2288
    R-Factor(R-Free) 0.2698
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5956
    Shell Resolution(Low) 2.7137
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2661
    R-Factor(R-Work) 0.2241
    R-Factor(R-Free) 0.3115
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7137
    Shell Resolution(Low) 2.8567
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2632
    R-Factor(R-Work) 0.2226
    R-Factor(R-Free) 0.2715
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8567
    Shell Resolution(Low) 3.0356
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2660
    R-Factor(R-Work) 0.216
    R-Factor(R-Free) 0.3065
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0356
    Shell Resolution(Low) 3.2699
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2650
    R-Factor(R-Work) 0.1971
    R-Factor(R-Free) 0.2643
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2699
    Shell Resolution(Low) 3.5988
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2629
    R-Factor(R-Work) 0.1754
    R-Factor(R-Free) 0.2204
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5988
    Shell Resolution(Low) 4.1191
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2554
    R-Factor(R-Work) 0.1548
    R-Factor(R-Free) 0.2142
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1191
    Shell Resolution(Low) 5.1879
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2417
    R-Factor(R-Work) 0.1472
    R-Factor(R-Free) 0.1977
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1879
    Shell Resolution(Low) 40.4499
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2389
    R-Factor(R-Work) 0.1768
    R-Factor(R-Free) 0.176
    Percent Reflections(Observed) 87.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.044
    f_dihedral_angle_d 13.036
    f_angle_d 0.667
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5016
    Nucleic Acid Atoms 0
    Heterogen Atoms 22
    Solvent Atoms 188
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBC-Collect
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution MolRep
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building MolRep
    data collection SBC-Collect