X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8.5
Temperature 293.15
Details 15% PEG 400, 0.165M MAGNESIUM ACETATE, 0.05M TRIS CHLORIDE, PH 8.5, VAPOR DIFFUSION, SITTING DROP, TEMPERATURE 293.15K
Method Vapor Diffusion Sitting Drop
pH 8.5
Temperature 293.15
Details 20% PEG 400, 0.18M MAGNESIUM ACETATE, 0.05M TRIS CHLORIDE, PH 8.5, VAPOR DIFFUSION, SITTING DROP, TEMPERATURE 293.15K. 15% PEG 400, 0.165M MAGNESIUM ACETATE, 0.05M TRIS CHLORIDE, PH 8.5, VAPOR DIFFUSION, SITTING DROP, TEMPERATURE 293.15K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 45.74 α = 90
b = 45.74 β = 90
c = 45.74 γ = 90
Symmetry
Space Group P 21 3

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD MIRROR, BARTELS MONOCHROMATOR, DUAL CHANNEL CUT CRYSTALS, TOROIDAL MIRROR 2009-09-12
CCD MARMOSAIC 225 mm CCD MIRROR, BARTELS MONOCHROMATOR, DUAL CHANNEL CUT CRYSTALS, TOROIDAL MIRROR 2009-12-10
Diffraction Radiation
Monochromator Protocol
BARTELS MONOCHROMATOR MAD
BARTELS MONOCHROMATOR SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 0.9999 SLS X06DA
SYNCHROTRON SLS BEAMLINE X06DA 0.9999 SLS X06DA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.91 45.74 99.7 0.0204 -- -- 7.5 4826 4030 4.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.91 2.01 98.7 0.3847 0.3847 2.67 0.99 703

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 1.91 26.41 2.0 4.0 4814 4030 242 83.7 -- -- 0.224 0.2709 RANDOM
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 51.2
RMS Deviations
Key Refinement Restraint Deviation
SIMU 0.164
s_anti_bump_dis_restr 0.004
s_non_zero_chiral_vol 0.008
s_from_restr_planes 0.04
s_angle_d 0.027
s_bond_d 0.009
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 0
Nucleic Acid Atoms 125
Heterogen Atoms 62
Solvent Atoms 39

Software

Computing
Computing Package Purpose
RemDAq Data Collection
XDS Data Reduction (intensity integration)
XPREP Data Reduction (data scaling)
SHELXD Structure Solution
SHELXL-97 Structure Refinement
Software
Software Name Purpose
SHELXL-97 refinement
SHELXD model building
RemDAq data collection