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X-RAY DIFFRACTION
Materials and Methods page
4JGC
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 4.6
    Temperature 289.0
    Details 30% polyethylene glycol (PEG) 4000, 0.2 M ammonium acetate, 0.1 M sodium acetate, pH 4.6, VAPOR DIFFUSION, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 91.49 α = 90
    b = 53.56 β = 95.1
    c = 81.9 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Details ROSENBAUM-ROCK MONOCHROMATO HIGH-RESOLUTION DOUBLE-CRYSTAL SI(220) SAGITTAL FOCUSING, ROSENBAUM-ROCK VERTICAL FOCUSING MIRROR
    Collection Date 2011-11-30
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 1.0
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.58
    Resolution(Low) 45.56
    Number Reflections(Observed) 11604
    Percent Possible(Observed) 92.9
    R Merge I(Observed) 0.077
    Redundancy 4.0
     
    High Resolution Shell Details
    Resolution(High) 2.582
    Resolution(Low) 2.68
    Percent Possible(All) 73.4
    R Merge I(Observed) 0.365
    Mean I Over Sigma(Observed) 2.0
    Redundancy 2.8
    Number Unique Reflections(All) 922
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.582
    Resolution(Low) 45.56
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 11567
    Number of Reflections(R-Free) 578
    Percent Reflections(Observed) 91.79
    R-Factor(Observed) 0.2324
    R-Work 0.2298
    R-Free 0.2833
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 31.1096
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -3.7997
    Anisotropic B[2][2] -10.6579
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -20.4517
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5824
    Shell Resolution(Low) 2.8423
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2232
    R-Factor(R-Work) 0.3834
    R-Factor(R-Free) 0.3985
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8423
    Shell Resolution(Low) 3.2535
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2753
    R-Factor(R-Work) 0.2794
    R-Factor(R-Free) 0.3647
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2535
    Shell Resolution(Low) 4.0986
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2974
    R-Factor(R-Work) 0.2277
    R-Factor(R-Free) 0.2911
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0986
    Shell Resolution(Low) 45.5691
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 3030
    R-Factor(R-Work) 0.1939
    R-Factor(R-Free) 0.2354
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.05
    f_dihedral_angle_d 22.916
    f_angle_d 1.196
    f_bond_d 0.019
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1524
    Nucleic Acid Atoms 1133
    Heterogen Atoms 11
    Solvent Atoms 22
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHENIX
    data collection HKL-2000