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X-RAY DIFFRACTION
Materials and Methods page
4JET
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion
    pH 8.8
    Temperature 293.0
    Details 20% (w/v) PEG 3350, 50 mM Ches, 200 mM magnesium formate dihydrate, pH 8.8, vapor diffusion, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 139.37 α = 90
    b = 69.56 β = 100.12
    c = 232.32 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector pixel
    Type DECTRIS PILATUS 6M
    Collection Date 2011-10-16
     
    Diffraction Radiation
    Diffraction Protocol Single Wavelength
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 17-ID
    Wavelength List 1.0000
    Site APS
    Beamline 17-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.2
    Resolution(Low) 228.7
    Number Reflections(All) 109337
    Number Reflections(Observed) 109337
    Percent Possible(Observed) 98.2
    R Merge I(Observed) 0.087
    Redundancy 3.5
     
    High Resolution Shell Details
    Resolution(High) 2.2
    Resolution(Low) 2.24
    Percent Possible(All) 97.7
    R Merge I(Observed) 0.668
    Mean I Over Sigma(Observed) 2.0
    Redundancy 3.6
    Number Unique Reflections(All) 5397
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.2
    Resolution(Low) 38.624
    Cut-off Sigma(F) 1.84
    Number of Reflections(Observed) 109316
    Number of Reflections(R-Free) 5497
    Percent Reflections(Observed) 97.94
    R-Factor(Observed) 0.1686
    R-Work 0.1658
    R-Free 0.2231
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 31.7917
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2
    Shell Resolution(Low) 2.225
    Number of Reflections(R-Free) 190
    Number of Reflections(R-Work) 3471
    R-Factor(R-Work) 0.2385
    R-Factor(R-Free) 0.2988
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.225
    Shell Resolution(Low) 2.2512
    Number of Reflections(R-Free) 206
    Number of Reflections(R-Work) 3364
    R-Factor(R-Work) 0.2266
    R-Factor(R-Free) 0.3027
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2512
    Shell Resolution(Low) 2.2786
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3430
    R-Factor(R-Work) 0.2304
    R-Factor(R-Free) 0.2977
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2786
    Shell Resolution(Low) 2.3075
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 3421
    R-Factor(R-Work) 0.2263
    R-Factor(R-Free) 0.2864
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3075
    Shell Resolution(Low) 2.3378
    Number of Reflections(R-Free) 190
    Number of Reflections(R-Work) 3386
    R-Factor(R-Work) 0.2203
    R-Factor(R-Free) 0.2949
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3378
    Shell Resolution(Low) 2.3699
    Number of Reflections(R-Free) 197
    Number of Reflections(R-Work) 3440
    R-Factor(R-Work) 0.2036
    R-Factor(R-Free) 0.2493
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3699
    Shell Resolution(Low) 2.4037
    Number of Reflections(R-Free) 189
    Number of Reflections(R-Work) 3423
    R-Factor(R-Work) 0.2024
    R-Factor(R-Free) 0.2724
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4037
    Shell Resolution(Low) 2.4396
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 3439
    R-Factor(R-Work) 0.2011
    R-Factor(R-Free) 0.3277
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4396
    Shell Resolution(Low) 2.4777
    Number of Reflections(R-Free) 194
    Number of Reflections(R-Work) 3380
    R-Factor(R-Work) 0.2098
    R-Factor(R-Free) 0.2699
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4777
    Shell Resolution(Low) 2.5183
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 3492
    R-Factor(R-Work) 0.2021
    R-Factor(R-Free) 0.2889
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5183
    Shell Resolution(Low) 2.5617
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 3414
    R-Factor(R-Work) 0.1969
    R-Factor(R-Free) 0.2763
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5617
    Shell Resolution(Low) 2.6083
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3436
    R-Factor(R-Work) 0.1909
    R-Factor(R-Free) 0.242
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6083
    Shell Resolution(Low) 2.6585
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 3438
    R-Factor(R-Work) 0.1855
    R-Factor(R-Free) 0.262
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6585
    Shell Resolution(Low) 2.7127
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 3459
    R-Factor(R-Work) 0.1861
    R-Factor(R-Free) 0.2714
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7127
    Shell Resolution(Low) 2.7717
    Number of Reflections(R-Free) 200
    Number of Reflections(R-Work) 3480
    R-Factor(R-Work) 0.1917
    R-Factor(R-Free) 0.2779
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7717
    Shell Resolution(Low) 2.8361
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 3407
    R-Factor(R-Work) 0.1933
    R-Factor(R-Free) 0.2928
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8361
    Shell Resolution(Low) 2.907
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 3506
    R-Factor(R-Work) 0.1863
    R-Factor(R-Free) 0.2539
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.907
    Shell Resolution(Low) 2.9856
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 3474
    R-Factor(R-Work) 0.1766
    R-Factor(R-Free) 0.2256
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9856
    Shell Resolution(Low) 3.0734
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 3413
    R-Factor(R-Work) 0.1761
    R-Factor(R-Free) 0.2522
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0734
    Shell Resolution(Low) 3.1726
    Number of Reflections(R-Free) 189
    Number of Reflections(R-Work) 3483
    R-Factor(R-Work) 0.1684
    R-Factor(R-Free) 0.215
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1726
    Shell Resolution(Low) 3.2859
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 3467
    R-Factor(R-Work) 0.1696
    R-Factor(R-Free) 0.2178
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2859
    Shell Resolution(Low) 3.4174
    Number of Reflections(R-Free) 189
    Number of Reflections(R-Work) 3447
    R-Factor(R-Work) 0.1681
    R-Factor(R-Free) 0.2386
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4174
    Shell Resolution(Low) 3.5728
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3497
    R-Factor(R-Work) 0.1564
    R-Factor(R-Free) 0.2138
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5728
    Shell Resolution(Low) 3.761
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 3473
    R-Factor(R-Work) 0.1466
    R-Factor(R-Free) 0.211
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.761
    Shell Resolution(Low) 3.9965
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3489
    R-Factor(R-Work) 0.143
    R-Factor(R-Free) 0.1813
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9965
    Shell Resolution(Low) 4.3047
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 3525
    R-Factor(R-Work) 0.1399
    R-Factor(R-Free) 0.1798
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3047
    Shell Resolution(Low) 4.7372
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 3493
    R-Factor(R-Work) 0.1214
    R-Factor(R-Free) 0.1517
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7372
    Shell Resolution(Low) 5.421
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3542
    R-Factor(R-Work) 0.1263
    R-Factor(R-Free) 0.1773
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.421
    Shell Resolution(Low) 6.8238
    Number of Reflections(R-Free) 194
    Number of Reflections(R-Work) 3518
    R-Factor(R-Work) 0.1578
    R-Factor(R-Free) 0.1957
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.8238
    Shell Resolution(Low) 38.6304
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3612
    R-Factor(R-Work) 0.1526
    R-Factor(R-Free) 0.1809
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 15.869
    f_plane_restr 0.007
    f_chiral_restr 0.081
    f_angle_d 1.158
    f_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 13624
    Nucleic Acid Atoms 0
    Heterogen Atoms 440
    Solvent Atoms 720
     
     
  •   Software and Computing Hide
    Computing
    Data Collection JDIRECTOR
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: dev_1148)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    molecular replacement Phaser
    data reduction SCALA version: 0.1.27