X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.6
Temperature 297.0
Details 0.1M Bis-Tris, 25% (w/v) PEG3350, pH 6.6, VAPOR DIFFUSION, SITTING DROP, temperature 297K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 39.28 α = 90
b = 49.87 β = 90
c = 85.45 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r mirror 2012-12-18
Diffraction Radiation
Monochromator Protocol
Si 111 crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97918 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.47 36 98.9 0.088 -- -- 6.4 29016 29016 0.0 -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.47 1.5 91.5 0.496 -- 2.1 3.1 1299

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.47 35.688 -- 1.34 28955 28955 1472 98.89 -- 0.1825 0.1816 0.1977 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.4702 1.5176 -- 115 2283 0.2479 0.286 -- 92.0
X Ray Diffraction 1.5176 1.5719 -- 106 2463 0.2197 0.2484 -- 98.0
X Ray Diffraction 1.5719 1.6348 -- 129 2492 0.1976 0.2156 -- 100.0
X Ray Diffraction 1.6348 1.7092 -- 118 2517 0.1886 0.2291 -- 100.0
X Ray Diffraction 1.7092 1.7993 -- 156 2465 0.1842 0.2354 -- 100.0
X Ray Diffraction 1.7993 1.9121 -- 134 2493 0.1778 0.2107 -- 100.0
X Ray Diffraction 1.9121 2.0597 -- 138 2526 0.1812 0.1896 -- 100.0
X Ray Diffraction 2.0597 2.2669 -- 140 2516 0.1698 0.1863 -- 100.0
X Ray Diffraction 2.2669 2.5949 -- 143 2530 0.1775 0.1984 -- 100.0
X Ray Diffraction 2.5949 3.2689 -- 142 2563 0.1874 0.244 -- 100.0
X Ray Diffraction 3.2689 35.6981 -- 151 2635 0.1743 0.163 -- 98.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.066
f_dihedral_angle_d 13.092
f_angle_d 1.03
f_bond_d 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1460
Nucleic Acid Atoms 0
Heterogen Atoms 4
Solvent Atoms 136

Software

Computing
Computing Package Purpose
SBC-Collect Data Collection
HKL-3000 Data Reduction (intensity integration)
HKL-3000 Data Reduction (data scaling)
SHELXD/MLPHARE/DM/ARP/wARP/HKL3000 Structure Solution
PHENIX (phenix.refine: 1.8.1_1168) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8.1_1168) refinement
SHELXD/MLPHARE/DM/ARP/wARP/HKL3000 model building
SBC-Collect data collection