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X-RAY DIFFRACTION
Materials and Methods page
4JDU
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.6
    Temperature 297.0
    Details 0.1M Bis-Tris, 25% (w/v) PEG3350, pH 6.6, VAPOR DIFFUSION, SITTING DROP, temperature 297K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 39.28 α = 90
    b = 49.87 β = 90
    c = 85.45 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirror
    Collection Date 2012-12-18
     
    Diffraction Radiation
    Monochromator Si 111 crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97918
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.47
    Resolution(Low) 36
    Number Reflections(All) 29016
    Number Reflections(Observed) 29016
    Percent Possible(Observed) 98.9
    R Merge I(Observed) 0.088
    Redundancy 6.4
     
    High Resolution Shell Details
    Resolution(High) 1.47
    Resolution(Low) 1.5
    Percent Possible(All) 91.5
    R Merge I(Observed) 0.496
    Mean I Over Sigma(Observed) 2.1
    Redundancy 3.1
    Number Unique Reflections(All) 1299
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.47
    Resolution(Low) 35.688
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 28955
    Number of Reflections(Observed) 28955
    Number of Reflections(R-Free) 1472
    Percent Reflections(Observed) 98.89
    R-Factor(Observed) 0.1825
    R-Work 0.1816
    R-Free 0.1977
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4702
    Shell Resolution(Low) 1.5176
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2283
    R-Factor(R-Work) 0.2479
    R-Factor(R-Free) 0.286
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5176
    Shell Resolution(Low) 1.5719
    Number of Reflections(R-Free) 106
    Number of Reflections(R-Work) 2463
    R-Factor(R-Work) 0.2197
    R-Factor(R-Free) 0.2484
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5719
    Shell Resolution(Low) 1.6348
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2492
    R-Factor(R-Work) 0.1976
    R-Factor(R-Free) 0.2156
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6348
    Shell Resolution(Low) 1.7092
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2517
    R-Factor(R-Work) 0.1886
    R-Factor(R-Free) 0.2291
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7092
    Shell Resolution(Low) 1.7993
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2465
    R-Factor(R-Work) 0.1842
    R-Factor(R-Free) 0.2354
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7993
    Shell Resolution(Low) 1.9121
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2493
    R-Factor(R-Work) 0.1778
    R-Factor(R-Free) 0.2107
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9121
    Shell Resolution(Low) 2.0597
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2526
    R-Factor(R-Work) 0.1812
    R-Factor(R-Free) 0.1896
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0597
    Shell Resolution(Low) 2.2669
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2516
    R-Factor(R-Work) 0.1698
    R-Factor(R-Free) 0.1863
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2669
    Shell Resolution(Low) 2.5949
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2530
    R-Factor(R-Work) 0.1775
    R-Factor(R-Free) 0.1984
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5949
    Shell Resolution(Low) 3.2689
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2563
    R-Factor(R-Work) 0.1874
    R-Factor(R-Free) 0.244
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2689
    Shell Resolution(Low) 35.6981
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2635
    R-Factor(R-Work) 0.1743
    R-Factor(R-Free) 0.163
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.066
    f_dihedral_angle_d 13.092
    f_angle_d 1.03
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1460
    Nucleic Acid Atoms 0
    Heterogen Atoms 4
    Solvent Atoms 136
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBC-Collect
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution SHELXD/MLPHARE/DM/ARP/wARP/HKL3000
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building SHELXD/MLPHARE/DM/ARP/wARP/HKL3000
    data collection SBC-Collect