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X-RAY DIFFRACTION
Materials and Methods page
4JBJ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 289.0
    Details 0.05M ammonium sulfate, 0.05M Bis-Tris, 30%(v/v) pentaerythritol ethoxylate, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 117.95 α = 90
    b = 70.75 β = 92.47
    c = 76.82 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2012-01-12
     
    Diffraction Radiation
    Monochromator GRAPHITE
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.98
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.69
    Resolution(Low) 50
    Number Reflections(All) 17603
    Number Reflections(Observed) 17058
    Percent Possible(Observed) 96.9
     
    High Resolution Shell Details
    Resolution(High) 2.7
    Resolution(Low) 2.8
    Percent Possible(All) 96.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.692
    Resolution(Low) 35.374
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 17603
    Number of Reflections(Observed) 17058
    Number of Reflections(R-Free) 1689
    Percent Reflections(Observed) 96.45
    R-Factor(All) 0.231
    R-Factor(Observed) 0.2331
    R-Work 0.2288
    R-Free 0.2719
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 68.2579
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6921
    Shell Resolution(Low) 2.7713
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 1151
    R-Factor(R-Work) 0.2768
    R-Factor(R-Free) 0.3487
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7713
    Shell Resolution(Low) 2.8607
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1290
    R-Factor(R-Work) 0.2863
    R-Factor(R-Free) 0.3486
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8607
    Shell Resolution(Low) 2.9629
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1285
    R-Factor(R-Work) 0.2767
    R-Factor(R-Free) 0.3548
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9629
    Shell Resolution(Low) 3.0814
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1278
    R-Factor(R-Work) 0.2753
    R-Factor(R-Free) 0.4024
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0814
    Shell Resolution(Low) 3.2216
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1276
    R-Factor(R-Work) 0.2678
    R-Factor(R-Free) 0.2725
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2216
    Shell Resolution(Low) 3.3913
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1304
    R-Factor(R-Work) 0.2549
    R-Factor(R-Free) 0.2988
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3913
    Shell Resolution(Low) 3.6036
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1292
    R-Factor(R-Work) 0.2314
    R-Factor(R-Free) 0.2875
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6036
    Shell Resolution(Low) 3.8815
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 1286
    R-Factor(R-Work) 0.225
    R-Factor(R-Free) 0.2961
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8815
    Shell Resolution(Low) 4.2715
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1281
    R-Factor(R-Work) 0.2065
    R-Factor(R-Free) 0.2453
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2715
    Shell Resolution(Low) 4.8883
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1301
    R-Factor(R-Work) 0.1787
    R-Factor(R-Free) 0.2233
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8883
    Shell Resolution(Low) 6.1534
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1263
    R-Factor(R-Work) 0.2022
    R-Factor(R-Free) 0.2272
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.1534
    Shell Resolution(Low) 35.3775
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1362
    R-Factor(R-Work) 0.2234
    R-Factor(R-Free) 0.215
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 13.576
    f_plane_restr 0.004
    f_chiral_restr 0.066
    f_angle_d 0.975
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3163
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 34
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASES
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHASES
    data collection HKL-2000