X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7
Temperature 298.0
Details 0.2M Magnesium formate dihydrate, 20% w/v Polyethylene glycol 3350, pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 72.6 α = 90
b = 48.52 β = 98.41
c = 195.23 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 120
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 -- --
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-B -- APS 23-ID-B

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.97 50 -- 0.071 -- -- -- -- 66722 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.98 38.24 -- 0.03 -- 58551 3269 70.0 -- 0.27 0.268 0.314 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.98 2.0481 -- 37 1154 0.4435 0.4474 -- 13.0
X Ray Diffraction 2.0481 2.1301 -- 70 2061 0.4283 0.4402 -- 22.0
X Ray Diffraction 2.1301 2.227 -- 124 3515 0.4048 0.4344 -- 39.0
X Ray Diffraction 2.227 2.3444 -- 172 5092 0.3837 0.4164 -- 56.0
X Ray Diffraction 2.3444 2.4913 -- 249 6674 0.3573 0.4082 -- 74.0
X Ray Diffraction 2.4913 2.6836 -- 281 7850 0.3435 0.3964 -- 86.0
X Ray Diffraction 2.6836 2.9536 -- 295 8259 0.3217 0.3509 -- 91.0
X Ray Diffraction 2.9536 3.3807 -- 285 8077 0.2885 0.343 -- 88.0
X Ray Diffraction 3.3807 4.2585 -- 254 7018 0.2266 0.2642 -- 76.0
X Ray Diffraction 4.2585 38.24 -- 239 6845 0.214 0.2648 -- 72.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 5.2792
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -6.4786
Anisotropic B[2][2] 5.6849
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -10.9641
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.082
f_dihedral_angle_d 19.277
f_angle_d 1.298
f_bond_d 0.009
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 10576
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 0

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-3000 Data Reduction (intensity integration)
HKL-3000 Data Reduction (data scaling)
XFIT Structure Solution
PHENIX (PHENIX.REFINE: 1.6_289) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE: 1.6_289) refinement
XFIT model building
HKL-2000 data collection