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X-RAY DIFFRACTION
Materials and Methods page
4JAR
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7
    Temperature 298.0
    Details 0.2M Magnesium formate dihydrate, 20% w/v Polyethylene glycol 3350, pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 72.6 α = 90
    b = 48.52 β = 98.41
    c = 195.23 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 120
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 4
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-B
    Site APS
    Beamline 23-ID-B
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.97
    Resolution(Low) 50
    Number Reflections(Observed) 66722
    R Merge I(Observed) 0.071
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.98
    Resolution(Low) 38.24
    Cut-off Sigma(F) 0.03
    Number of Reflections(Observed) 58551
    Number of Reflections(R-Free) 3269
    Percent Reflections(Observed) 70.0
    R-Factor(Observed) 0.27
    R-Work 0.268
    R-Free 0.314
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 5.2792
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -6.4786
    Anisotropic B[2][2] 5.6849
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -10.9641
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.98
    Shell Resolution(Low) 2.0481
    Number of Reflections(R-Free) 37
    Number of Reflections(R-Work) 1154
    R-Factor(R-Work) 0.4435
    R-Factor(R-Free) 0.4474
    Percent Reflections(Observed) 13.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0481
    Shell Resolution(Low) 2.1301
    Number of Reflections(R-Free) 70
    Number of Reflections(R-Work) 2061
    R-Factor(R-Work) 0.4283
    R-Factor(R-Free) 0.4402
    Percent Reflections(Observed) 22.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1301
    Shell Resolution(Low) 2.227
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 3515
    R-Factor(R-Work) 0.4048
    R-Factor(R-Free) 0.4344
    Percent Reflections(Observed) 39.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.227
    Shell Resolution(Low) 2.3444
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 5092
    R-Factor(R-Work) 0.3837
    R-Factor(R-Free) 0.4164
    Percent Reflections(Observed) 56.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3444
    Shell Resolution(Low) 2.4913
    Number of Reflections(R-Free) 249
    Number of Reflections(R-Work) 6674
    R-Factor(R-Work) 0.3573
    R-Factor(R-Free) 0.4082
    Percent Reflections(Observed) 74.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4913
    Shell Resolution(Low) 2.6836
    Number of Reflections(R-Free) 281
    Number of Reflections(R-Work) 7850
    R-Factor(R-Work) 0.3435
    R-Factor(R-Free) 0.3964
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6836
    Shell Resolution(Low) 2.9536
    Number of Reflections(R-Free) 295
    Number of Reflections(R-Work) 8259
    R-Factor(R-Work) 0.3217
    R-Factor(R-Free) 0.3509
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9536
    Shell Resolution(Low) 3.3807
    Number of Reflections(R-Free) 285
    Number of Reflections(R-Work) 8077
    R-Factor(R-Work) 0.2885
    R-Factor(R-Free) 0.343
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3807
    Shell Resolution(Low) 4.2585
    Number of Reflections(R-Free) 254
    Number of Reflections(R-Work) 7018
    R-Factor(R-Work) 0.2266
    R-Factor(R-Free) 0.2642
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2585
    Shell Resolution(Low) 38.24
    Number of Reflections(R-Free) 239
    Number of Reflections(R-Work) 6845
    R-Factor(R-Work) 0.214
    R-Factor(R-Free) 0.2648
    Percent Reflections(Observed) 72.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.082
    f_dihedral_angle_d 19.277
    f_angle_d 1.298
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 10576
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution XFIT
    Structure Refinement PHENIX (PHENIX.REFINE: 1.6_289)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.6_289)
    model building XFIT
    data collection HKL-2000