POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4JAQ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.6
    Temperature 289.0
    Details 0.2 M Ammonium tartrate dibasic, 20% w/v Polyethylene glycol 3350, pH 6.6, VAPOR DIFFUSION, SITTING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 72.01 α = 90
    b = 48.71 β = 97.89
    c = 194.29 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 120
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Details Mirrors
    Collection Date 2008-01-12
     
    Diffraction Radiation
    Monochromator Graphics
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-B
    Wavelength List 1
    Site APS
    Beamline 23-ID-B
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 12.64
    Observed Criterion Sigma(I) 1.65
    Resolution(High) 1.73
    Resolution(Low) 50
    Number Reflections(Observed) 140395
    Percent Possible(Observed) 89.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.73
    Resolution(Low) 48.11
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 125850
    Number of Reflections(R-Free) 6346
    Percent Reflections(Observed) 89.7
    R-Factor(Observed) 0.184
    R-Work 0.182
    R-Free 0.221
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.7326
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.4128
    Anisotropic B[2][2] 0.0812
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.8138
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.73
    Shell Resolution(Low) 1.7491
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 3267
    R-Factor(R-Work) 0.2947
    R-Factor(R-Free) 0.3182
    Percent Reflections(Observed) 74.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7491
    Shell Resolution(Low) 1.7697
    Number of Reflections(R-Free) 203
    Number of Reflections(R-Work) 3522
    R-Factor(R-Work) 0.28
    R-Factor(R-Free) 0.349
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7697
    Shell Resolution(Low) 1.7913
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 3614
    R-Factor(R-Work) 0.2557
    R-Factor(R-Free) 0.3108
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7913
    Shell Resolution(Low) 1.8139
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 3654
    R-Factor(R-Work) 0.2402
    R-Factor(R-Free) 0.2977
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8139
    Shell Resolution(Low) 1.8378
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 3698
    R-Factor(R-Work) 0.2238
    R-Factor(R-Free) 0.2595
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8378
    Shell Resolution(Low) 1.863
    Number of Reflections(R-Free) 199
    Number of Reflections(R-Work) 3628
    R-Factor(R-Work) 0.2171
    R-Factor(R-Free) 0.2592
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.863
    Shell Resolution(Low) 1.8896
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 3744
    R-Factor(R-Work) 0.2052
    R-Factor(R-Free) 0.248
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8896
    Shell Resolution(Low) 1.9178
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 3663
    R-Factor(R-Work) 0.1991
    R-Factor(R-Free) 0.2428
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9178
    Shell Resolution(Low) 1.9478
    Number of Reflections(R-Free) 219
    Number of Reflections(R-Work) 3719
    R-Factor(R-Work) 0.1933
    R-Factor(R-Free) 0.2502
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9478
    Shell Resolution(Low) 1.9797
    Number of Reflections(R-Free) 204
    Number of Reflections(R-Work) 3736
    R-Factor(R-Work) 0.1905
    R-Factor(R-Free) 0.2529
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9797
    Shell Resolution(Low) 2.0138
    Number of Reflections(R-Free) 214
    Number of Reflections(R-Work) 3726
    R-Factor(R-Work) 0.1836
    R-Factor(R-Free) 0.2291
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0138
    Shell Resolution(Low) 2.0505
    Number of Reflections(R-Free) 189
    Number of Reflections(R-Work) 3787
    R-Factor(R-Work) 0.1825
    R-Factor(R-Free) 0.2108
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0505
    Shell Resolution(Low) 2.0899
    Number of Reflections(R-Free) 209
    Number of Reflections(R-Work) 3768
    R-Factor(R-Work) 0.1744
    R-Factor(R-Free) 0.2234
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0899
    Shell Resolution(Low) 2.1326
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 3867
    R-Factor(R-Work) 0.1701
    R-Factor(R-Free) 0.2166
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1326
    Shell Resolution(Low) 2.1789
    Number of Reflections(R-Free) 203
    Number of Reflections(R-Work) 3882
    R-Factor(R-Work) 0.1797
    R-Factor(R-Free) 0.1985
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1789
    Shell Resolution(Low) 2.2296
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 3946
    R-Factor(R-Work) 0.1784
    R-Factor(R-Free) 0.2276
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2296
    Shell Resolution(Low) 2.2854
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 3934
    R-Factor(R-Work) 0.1836
    R-Factor(R-Free) 0.2397
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2854
    Shell Resolution(Low) 2.3472
    Number of Reflections(R-Free) 219
    Number of Reflections(R-Work) 4029
    R-Factor(R-Work) 0.1772
    R-Factor(R-Free) 0.233
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3472
    Shell Resolution(Low) 2.4162
    Number of Reflections(R-Free) 226
    Number of Reflections(R-Work) 4120
    R-Factor(R-Work) 0.1737
    R-Factor(R-Free) 0.227
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4162
    Shell Resolution(Low) 2.4942
    Number of Reflections(R-Free) 234
    Number of Reflections(R-Work) 4087
    R-Factor(R-Work) 0.1848
    R-Factor(R-Free) 0.2371
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4942
    Shell Resolution(Low) 2.5834
    Number of Reflections(R-Free) 218
    Number of Reflections(R-Work) 4241
    R-Factor(R-Work) 0.1844
    R-Factor(R-Free) 0.2303
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5834
    Shell Resolution(Low) 2.6868
    Number of Reflections(R-Free) 238
    Number of Reflections(R-Work) 4219
    R-Factor(R-Work) 0.1829
    R-Factor(R-Free) 0.2391
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6868
    Shell Resolution(Low) 2.8091
    Number of Reflections(R-Free) 250
    Number of Reflections(R-Work) 4285
    R-Factor(R-Work) 0.1885
    R-Factor(R-Free) 0.2164
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8091
    Shell Resolution(Low) 2.9571
    Number of Reflections(R-Free) 241
    Number of Reflections(R-Work) 4350
    R-Factor(R-Work) 0.1843
    R-Factor(R-Free) 0.2313
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9571
    Shell Resolution(Low) 3.1424
    Number of Reflections(R-Free) 237
    Number of Reflections(R-Work) 4382
    R-Factor(R-Work) 0.1839
    R-Factor(R-Free) 0.2214
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1424
    Shell Resolution(Low) 3.3849
    Number of Reflections(R-Free) 250
    Number of Reflections(R-Work) 4443
    R-Factor(R-Work) 0.1801
    R-Factor(R-Free) 0.1902
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3849
    Shell Resolution(Low) 3.7255
    Number of Reflections(R-Free) 213
    Number of Reflections(R-Work) 4485
    R-Factor(R-Work) 0.1725
    R-Factor(R-Free) 0.1917
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7255
    Shell Resolution(Low) 4.2643
    Number of Reflections(R-Free) 248
    Number of Reflections(R-Work) 4465
    R-Factor(R-Work) 0.1545
    R-Factor(R-Free) 0.1955
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2643
    Shell Resolution(Low) 5.3714
    Number of Reflections(R-Free) 226
    Number of Reflections(R-Work) 4564
    R-Factor(R-Work) 0.1555
    R-Factor(R-Free) 0.1878
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3714
    Shell Resolution(Low) 48.1329
    Number of Reflections(R-Free) 226
    Number of Reflections(R-Work) 4679
    R-Factor(R-Work) 0.188
    R-Factor(R-Free) 0.2156
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.083
    f_dihedral_angle_d 12.38
    f_angle_d 1.277
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 10568
    Nucleic Acid Atoms 0
    Heterogen Atoms 177
    Solvent Atoms 826
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALEPACK
    Structure Solution MLPHARE
    Structure Refinement PHENIX (PHENIX.REFINE: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building MLPHARE
    data collection HKL-2000