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X-RAY DIFFRACTION
Materials and Methods page
4JAO
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.2
    Temperature 289.0
    Details 0.1 M sodium acetate trihydrate, 5.6% PEG 4000, 10% isopropanol, pH 5.2, VAPOR DIFFUSION, HANGING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 71.12 α = 90
    b = 48.43 β = 97.25
    c = 189.69 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 120
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2007-07-15
     
    Diffraction Radiation
    Monochromator Graphite
    Diffraction Protocol MAD
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-B
    Wavelength List 0.979, 0.97179
    Site APS
    Beamline 23-ID-B
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 11.66
    Observed Criterion Sigma(I) 6.39
    Resolution(High) 2.05
    Resolution(Low) 47.04
    Number Reflections(Observed) 63039
    Percent Possible(Observed) 92.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MAD
    reflnsShellList 2.05
    Resolution(Low) 47.04
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 63025
    Number of Reflections(R-Free) 3158
    Percent Reflections(Observed) 77.0
    R-Factor(Observed) 0.214
    R-Work 0.211
    R-Free 0.271
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 4.4375
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -5.7154
    Anisotropic B[2][2] -2.7344
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.7031
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.05
    Shell Resolution(Low) 2.0759
    Number of Reflections(R-Free) 22
    Number of Reflections(R-Work) 426
    R-Factor(R-Work) 0.2925
    R-Factor(R-Free) 0.2701
    Percent Reflections(Observed) 13.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0759
    Shell Resolution(Low) 2.1084
    Number of Reflections(R-Free) 53
    Number of Reflections(R-Work) 1128
    R-Factor(R-Work) 0.2918
    R-Factor(R-Free) 0.4115
    Percent Reflections(Observed) 33.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1084
    Shell Resolution(Low) 2.1429
    Number of Reflections(R-Free) 53
    Number of Reflections(R-Work) 1219
    R-Factor(R-Work) 0.3048
    R-Factor(R-Free) 0.3443
    Percent Reflections(Observed) 37.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1429
    Shell Resolution(Low) 2.1799
    Number of Reflections(R-Free) 65
    Number of Reflections(R-Work) 1346
    R-Factor(R-Work) 0.29
    R-Factor(R-Free) 0.3601
    Percent Reflections(Observed) 40.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1799
    Shell Resolution(Low) 2.2195
    Number of Reflections(R-Free) 87
    Number of Reflections(R-Work) 1521
    R-Factor(R-Work) 0.2877
    R-Factor(R-Free) 0.3441
    Percent Reflections(Observed) 45.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2195
    Shell Resolution(Low) 2.2622
    Number of Reflections(R-Free) 97
    Number of Reflections(R-Work) 1835
    R-Factor(R-Work) 0.2755
    R-Factor(R-Free) 0.3302
    Percent Reflections(Observed) 55.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2622
    Shell Resolution(Low) 2.3084
    Number of Reflections(R-Free) 91
    Number of Reflections(R-Work) 2044
    R-Factor(R-Work) 0.2598
    R-Factor(R-Free) 0.3561
    Percent Reflections(Observed) 60.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3084
    Shell Resolution(Low) 2.3586
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2140
    R-Factor(R-Work) 0.2837
    R-Factor(R-Free) 0.3345
    Percent Reflections(Observed) 65.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3586
    Shell Resolution(Low) 2.4134
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2455
    R-Factor(R-Work) 0.2683
    R-Factor(R-Free) 0.3249
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4134
    Shell Resolution(Low) 2.4738
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2660
    R-Factor(R-Work) 0.2717
    R-Factor(R-Free) 0.389
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4738
    Shell Resolution(Low) 2.5407
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2961
    R-Factor(R-Work) 0.2705
    R-Factor(R-Free) 0.3525
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5407
    Shell Resolution(Low) 2.6154
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 3115
    R-Factor(R-Work) 0.2665
    R-Factor(R-Free) 0.3226
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6154
    Shell Resolution(Low) 2.6998
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 3303
    R-Factor(R-Work) 0.2595
    R-Factor(R-Free) 0.2948
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6998
    Shell Resolution(Low) 2.7963
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 3292
    R-Factor(R-Work) 0.2558
    R-Factor(R-Free) 0.3213
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7963
    Shell Resolution(Low) 2.9083
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 3263
    R-Factor(R-Work) 0.2487
    R-Factor(R-Free) 0.3141
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9083
    Shell Resolution(Low) 3.0406
    Number of Reflections(R-Free) 198
    Number of Reflections(R-Work) 3299
    R-Factor(R-Work) 0.2431
    R-Factor(R-Free) 0.2989
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0406
    Shell Resolution(Low) 3.2009
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3343
    R-Factor(R-Work) 0.2277
    R-Factor(R-Free) 0.2951
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2009
    Shell Resolution(Low) 3.4014
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 3336
    R-Factor(R-Work) 0.2121
    R-Factor(R-Free) 0.3183
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4014
    Shell Resolution(Low) 3.6639
    Number of Reflections(R-Free) 184
    Number of Reflections(R-Work) 3382
    R-Factor(R-Work) 0.2002
    R-Factor(R-Free) 0.2611
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6639
    Shell Resolution(Low) 4.0324
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3412
    R-Factor(R-Work) 0.1766
    R-Factor(R-Free) 0.263
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0324
    Shell Resolution(Low) 4.6155
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 3399
    R-Factor(R-Work) 0.1528
    R-Factor(R-Free) 0.2159
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6155
    Shell Resolution(Low) 5.8133
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 3444
    R-Factor(R-Work) 0.1864
    R-Factor(R-Free) 0.2381
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8133
    Shell Resolution(Low) 47.04
    Number of Reflections(R-Free) 203
    Number of Reflections(R-Work) 3544
    R-Factor(R-Work) 0.1831
    R-Factor(R-Free) 0.2119
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.086
    f_dihedral_angle_d 18.831
    f_angle_d 1.327
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 10568
    Nucleic Acid Atoms 0
    Heterogen Atoms 74
    Solvent Atoms 385
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALEPACK
    Structure Solution SHARP
    Structure Refinement PHENIX (PHENIX.REFINE: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building SHARP
    data collection HKL-2000