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X-RAY DIFFRACTION
Materials and Methods page
4JA0
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 298.0
    Details 50mM Tris, 2M Ammonium sulfate, 1% PEG400, pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 138.73 α = 90
    b = 219.73 β = 90
    c = 60.65 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X10SA
    Wavelength List 0.979
    Site SLS
    Beamline X10SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.8
    Resolution(Low) 50
    Number Reflections(All) 46866
    Number Reflections(Observed) 46715
    Percent Possible(Observed) 0.997
    R Merge I(Observed) 0.072
     
    High Resolution Shell Details
    Resolution(High) 2.8
    Resolution(Low) 2.9
    Percent Possible(All) 97.4
    Mean I Over Sigma(Observed) 2.6
    R-Sym I(Observed) 0.525
    Redundancy 3.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.8
    Resolution(Low) 46.711
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 46866
    Number of Reflections(Observed) 46715
    Number of Reflections(R-Free) 2338
    Percent Reflections(Observed) 99.71
    R-Factor(Observed) 0.2026
    R-Work 0.1994
    R-Free 0.2626
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7962
    Shell Resolution(Low) 2.8533
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2463
    R-Factor(R-Work) 0.2717
    R-Factor(R-Free) 0.3434
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8533
    Shell Resolution(Low) 2.9153
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2571
    R-Factor(R-Work) 0.2431
    R-Factor(R-Free) 0.333
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9153
    Shell Resolution(Low) 2.9831
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2555
    R-Factor(R-Work) 0.245
    R-Factor(R-Free) 0.3709
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9831
    Shell Resolution(Low) 3.0577
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2597
    R-Factor(R-Work) 0.232
    R-Factor(R-Free) 0.3137
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0577
    Shell Resolution(Low) 3.1403
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2583
    R-Factor(R-Work) 0.2256
    R-Factor(R-Free) 0.2967
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1403
    Shell Resolution(Low) 3.2327
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2595
    R-Factor(R-Work) 0.2388
    R-Factor(R-Free) 0.3412
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2327
    Shell Resolution(Low) 3.337
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2579
    R-Factor(R-Work) 0.2204
    R-Factor(R-Free) 0.3307
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.337
    Shell Resolution(Low) 3.4563
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2578
    R-Factor(R-Work) 0.2122
    R-Factor(R-Free) 0.2604
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4563
    Shell Resolution(Low) 3.5946
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.2004
    R-Factor(R-Free) 0.2979
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5946
    Shell Resolution(Low) 3.7581
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2610
    R-Factor(R-Work) 0.1919
    R-Factor(R-Free) 0.2485
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7581
    Shell Resolution(Low) 3.9562
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2577
    R-Factor(R-Work) 0.1729
    R-Factor(R-Free) 0.2496
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9562
    Shell Resolution(Low) 4.2039
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2634
    R-Factor(R-Work) 0.1687
    R-Factor(R-Free) 0.231
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2039
    Shell Resolution(Low) 4.5282
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2612
    R-Factor(R-Work) 0.1542
    R-Factor(R-Free) 0.1939
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5282
    Shell Resolution(Low) 4.9835
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2644
    R-Factor(R-Work) 0.1547
    R-Factor(R-Free) 0.2215
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9835
    Shell Resolution(Low) 5.7035
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2652
    R-Factor(R-Work) 0.1936
    R-Factor(R-Free) 0.2651
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7035
    Shell Resolution(Low) 7.1816
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2692
    R-Factor(R-Work) 0.2353
    R-Factor(R-Free) 0.2662
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.1816
    Shell Resolution(Low) 46.7174
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2836
    R-Factor(R-Work) 0.2118
    R-Factor(R-Free) 0.2446
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.069
    f_dihedral_angle_d 13.561
    f_angle_d 1.245
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 11870
    Nucleic Acid Atoms 0
    Heterogen Atoms 85
    Solvent Atoms 128
     
     
  •   Software and Computing Hide
    Computing
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)