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X-RAY DIFFRACTION
Materials and Methods page
4J8G
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 64.88 α = 90
    b = 62.63 β = 93.64
    c = 77.26 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
     
    Diffraction Radiation
    Monochromator Cryogenically-cooled single crystal Si(220) side bounce
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.4
    Resolution(High) 1.89
    Resolution(Low) 50
    Number Reflections(All) 73818
    Number Reflections(Observed) 49039
    Percent Possible(Observed) 99.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.895
    Resolution(Low) 48.104
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 54368
    Number of Reflections(Observed) 48995
    Number of Reflections(R-Free) 2017
    Percent Reflections(Observed) 99.38
    R-Factor(Observed) 0.1687
    R-Work 0.167
    R-Free 0.2094
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.895
    Shell Resolution(Low) 1.9424
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 3081
    R-Factor(R-Work) 0.2513
    R-Factor(R-Free) 0.3053
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9424
    Shell Resolution(Low) 1.9949
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3363
    R-Factor(R-Work) 0.2074
    R-Factor(R-Free) 0.2589
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9949
    Shell Resolution(Low) 2.0536
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 3340
    R-Factor(R-Work) 0.1935
    R-Factor(R-Free) 0.2458
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0536
    Shell Resolution(Low) 2.1199
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 3376
    R-Factor(R-Work) 0.1802
    R-Factor(R-Free) 0.2289
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1199
    Shell Resolution(Low) 2.1956
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 3358
    R-Factor(R-Work) 0.1768
    R-Factor(R-Free) 0.2155
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1956
    Shell Resolution(Low) 2.2835
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3363
    R-Factor(R-Work) 0.213
    R-Factor(R-Free) 0.2929
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2835
    Shell Resolution(Low) 2.3875
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 3355
    R-Factor(R-Work) 0.1867
    R-Factor(R-Free) 0.2471
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3875
    Shell Resolution(Low) 2.5133
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3373
    R-Factor(R-Work) 0.1919
    R-Factor(R-Free) 0.2455
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5133
    Shell Resolution(Low) 2.6708
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3370
    R-Factor(R-Work) 0.1896
    R-Factor(R-Free) 0.2648
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6708
    Shell Resolution(Low) 2.877
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3386
    R-Factor(R-Work) 0.1821
    R-Factor(R-Free) 0.24
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.877
    Shell Resolution(Low) 3.1664
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3364
    R-Factor(R-Work) 0.1652
    R-Factor(R-Free) 0.2065
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1664
    Shell Resolution(Low) 3.6245
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3416
    R-Factor(R-Work) 0.1491
    R-Factor(R-Free) 0.1868
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6245
    Shell Resolution(Low) 4.5659
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 3398
    R-Factor(R-Work) 0.1294
    R-Factor(R-Free) 0.1488
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5659
    Shell Resolution(Low) 48.1195
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 3435
    R-Factor(R-Work) 0.1474
    R-Factor(R-Free) 0.176
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.109
    f_dihedral_angle_d 12.977
    f_angle_d 1.475
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4953
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 469
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    data collection ADSC