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X-RAY DIFFRACTION
Materials and Methods page
4J8B
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 49.74 α = 90
    b = 81.96 β = 90
    c = 87.23 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
     
    Diffraction Radiation
    Monochromator Cryogenically-cooled single crystal Si(220) side bounce
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.4
    Resolution(High) 1.88
    Resolution(Low) 77.11
    Number Reflections(All) 33643
    Number Reflections(Observed) 29390
    Percent Possible(Observed) 98.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.878
    Resolution(Low) 59.729
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 33643
    Number of Reflections(Observed) 29390
    Number of Reflections(R-Free) 1992
    Percent Reflections(Observed) 98.5
    R-Factor(Observed) 0.1789
    R-Work 0.1762
    R-Free 0.2172
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.878
    Shell Resolution(Low) 1.9246
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1913
    R-Factor(R-Work) 0.2218
    R-Factor(R-Free) 0.2434
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9246
    Shell Resolution(Low) 1.9767
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1915
    R-Factor(R-Work) 0.208
    R-Factor(R-Free) 0.246
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9767
    Shell Resolution(Low) 2.0348
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1896
    R-Factor(R-Work) 0.1972
    R-Factor(R-Free) 0.2319
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0348
    Shell Resolution(Low) 2.1005
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1952
    R-Factor(R-Work) 0.1814
    R-Factor(R-Free) 0.2465
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1005
    Shell Resolution(Low) 2.1756
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1966
    R-Factor(R-Work) 0.1891
    R-Factor(R-Free) 0.2411
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1756
    Shell Resolution(Low) 2.2627
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 1933
    R-Factor(R-Work) 0.1791
    R-Factor(R-Free) 0.2112
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2627
    Shell Resolution(Low) 2.3657
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1955
    R-Factor(R-Work) 0.1743
    R-Factor(R-Free) 0.2341
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3657
    Shell Resolution(Low) 2.4904
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 1901
    R-Factor(R-Work) 0.1904
    R-Factor(R-Free) 0.2486
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4904
    Shell Resolution(Low) 2.6464
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1965
    R-Factor(R-Work) 0.1896
    R-Factor(R-Free) 0.2457
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6464
    Shell Resolution(Low) 2.8508
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1956
    R-Factor(R-Work) 0.1826
    R-Factor(R-Free) 0.2439
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8508
    Shell Resolution(Low) 3.1376
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1965
    R-Factor(R-Work) 0.1685
    R-Factor(R-Free) 0.2039
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1376
    Shell Resolution(Low) 3.5916
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1991
    R-Factor(R-Work) 0.1573
    R-Factor(R-Free) 0.2093
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5916
    Shell Resolution(Low) 4.5248
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1989
    R-Factor(R-Work) 0.1512
    R-Factor(R-Free) 0.1878
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5248
    Shell Resolution(Low) 59.7592
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2101
    R-Factor(R-Work) 0.1937
    R-Factor(R-Free) 0.2114
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.1
    f_dihedral_angle_d 14.159
    f_angle_d 1.356
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2457
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 163
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    data collection ADSC