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X-RAY DIFFRACTION
Materials and Methods page
4J87
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 37.43 α = 90
    b = 53.61 β = 90
    c = 157.96 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
     
    Diffraction Radiation
    Monochromator Cryogenically-cooled single crystal Si(220) side bounce
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 1.67
    Resolution(Low) 50.77
    Number Reflections(All) 37929
    Number Reflections(Observed) 35377
    Percent Possible(Observed) 98.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.67
    Resolution(Low) 50.769
    Cut-off Sigma(F) 0.03
    Number of Reflections(all) 37929
    Number of Reflections(Observed) 35375
    Number of Reflections(R-Free) 2000
    Percent Reflections(Observed) 93.27
    R-Factor(All) 0.196
    R-Factor(Observed) 0.1686
    R-Work 0.1672
    R-Free 0.1915
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.67
    Shell Resolution(Low) 1.7114
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2112
    R-Factor(R-Work) 0.2431
    R-Factor(R-Free) 0.2856
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7114
    Shell Resolution(Low) 1.7577
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2184
    R-Factor(R-Work) 0.2085
    R-Factor(R-Free) 0.2673
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7577
    Shell Resolution(Low) 1.8094
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2240
    R-Factor(R-Work) 0.1958
    R-Factor(R-Free) 0.2312
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8094
    Shell Resolution(Low) 1.8678
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2288
    R-Factor(R-Work) 0.175
    R-Factor(R-Free) 0.2104
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8678
    Shell Resolution(Low) 1.9346
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2320
    R-Factor(R-Work) 0.1628
    R-Factor(R-Free) 0.1939
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9346
    Shell Resolution(Low) 2.012
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2375
    R-Factor(R-Work) 0.1521
    R-Factor(R-Free) 0.1722
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.012
    Shell Resolution(Low) 2.1036
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2422
    R-Factor(R-Work) 0.166
    R-Factor(R-Free) 0.1953
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1036
    Shell Resolution(Low) 2.2145
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2419
    R-Factor(R-Work) 0.1622
    R-Factor(R-Free) 0.1944
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2145
    Shell Resolution(Low) 2.3532
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2463
    R-Factor(R-Work) 0.1714
    R-Factor(R-Free) 0.1929
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3532
    Shell Resolution(Low) 2.5349
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2433
    R-Factor(R-Work) 0.1779
    R-Factor(R-Free) 0.1904
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5349
    Shell Resolution(Low) 2.79
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2477
    R-Factor(R-Work) 0.1736
    R-Factor(R-Free) 0.196
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.79
    Shell Resolution(Low) 3.1937
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2491
    R-Factor(R-Work) 0.1625
    R-Factor(R-Free) 0.1883
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1937
    Shell Resolution(Low) 4.0234
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2532
    R-Factor(R-Work) 0.1466
    R-Factor(R-Free) 0.1664
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0234
    Shell Resolution(Low) 50.7928
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2619
    R-Factor(R-Work) 0.163
    R-Factor(R-Free) 0.1791
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.094
    f_dihedral_angle_d 12.884
    f_angle_d 1.257
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2548
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 189
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    data collection ADSC