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X-RAY DIFFRACTION
Materials and Methods page
4J84
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 42.55 α = 81.46
    b = 46.15 β = 81.96
    c = 84.3 γ = 69.47
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
     
    Diffraction Radiation
    Monochromator Cryogenically-cooled single crystal Si(220) side bounce
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.5
    Resolution(High) 1.47
    Resolution(Low) 50
    Number Reflections(All) 93131
    Number Reflections(Observed) 93130
    Percent Possible(Observed) 93.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.473
    Resolution(Low) 39.952
    Cut-off Sigma(F) 1.97
    Number of Reflections(all) 93131
    Number of Reflections(Observed) 93112
    Number of Reflections(R-Free) 1990
    Percent Reflections(Observed) 93.1
    R-Factor(Observed) 0.1884
    R-Work 0.188
    R-Free 0.2079
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 3.8693
    Anisotropic B[1][2] -1.5973
    Anisotropic B[1][3] 0.1095
    Anisotropic B[2][2] -1.9487
    Anisotropic B[2][3] 2.1658
    Anisotropic B[3][3] -1.9207
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.473
    Shell Resolution(Low) 1.5099
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 6092
    R-Factor(R-Work) 0.2689
    R-Factor(R-Free) 0.3055
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5099
    Shell Resolution(Low) 1.5507
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 6590
    R-Factor(R-Work) 0.2328
    R-Factor(R-Free) 0.2762
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5507
    Shell Resolution(Low) 1.5963
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 6636
    R-Factor(R-Work) 0.2156
    R-Factor(R-Free) 0.235
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5963
    Shell Resolution(Low) 1.6478
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 6653
    R-Factor(R-Work) 0.1969
    R-Factor(R-Free) 0.2661
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6478
    Shell Resolution(Low) 1.7067
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 6660
    R-Factor(R-Work) 0.1876
    R-Factor(R-Free) 0.2016
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7067
    Shell Resolution(Low) 1.7751
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 6696
    R-Factor(R-Work) 0.1807
    R-Factor(R-Free) 0.2
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7751
    Shell Resolution(Low) 1.8559
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 6670
    R-Factor(R-Work) 0.1748
    R-Factor(R-Free) 0.1816
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8559
    Shell Resolution(Low) 1.9537
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 6698
    R-Factor(R-Work) 0.1734
    R-Factor(R-Free) 0.2225
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9537
    Shell Resolution(Low) 2.0761
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 6674
    R-Factor(R-Work) 0.1792
    R-Factor(R-Free) 0.1981
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0761
    Shell Resolution(Low) 2.2364
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 6700
    R-Factor(R-Work) 0.1805
    R-Factor(R-Free) 0.2026
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2364
    Shell Resolution(Low) 2.4614
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 6735
    R-Factor(R-Work) 0.1813
    R-Factor(R-Free) 0.2132
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4614
    Shell Resolution(Low) 2.8175
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 6705
    R-Factor(R-Work) 0.1921
    R-Factor(R-Free) 0.2231
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8175
    Shell Resolution(Low) 3.5494
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 6291
    R-Factor(R-Work) 0.1824
    R-Factor(R-Free) 0.1606
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5494
    Shell Resolution(Low) 39.9667
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 5322
    R-Factor(R-Work) 0.185
    R-Factor(R-Free) 0.201
    Percent Reflections(Observed) 76.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.082
    f_dihedral_angle_d 12.045
    f_angle_d 1.171
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4843
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 786
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    data collection ADSC